research-article

Multiple defect diagnosis using no assumptions on failing pattern characteristics

Authors:

R. D. Shawn BlantonAuthors Info & Claims

DAC '08: Proceedings of the 45th annual Design Automation Conference

Pages 361 - 366

https://doi.org/10.1145/1391469.1391567

Published: 08 June 2008 Publication History

Abstract

We propose an effective multiple defect diagnosis methodology that does not depend on failing pattern characteristics. The methodology consists of a conservative defect site identification and elimination algorithm, and an innovative path-based defect site elimination technique. The search space of the diagnosis method does not grow exponentially with the number of defects in the circuit under diagnosis. Simulation experiments show that this method can effectively diagnose circuits that are affected by 10 or more faults that include multiple stuck-at, bridge and transistor stuck-open faults.

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Cited By

Pomeranz I(2020)New Targets for Diagnostic Test GenerationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2019.292897139:10(3035-3043)Online publication date: Oct-2020
https://doi.org/10.1109/TCAD.2019.2928971
Pomeranz I(2019)Test Scores for Improving the Accuracy of Logic Diagnosis for Multiple DefectsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2019.290083627:7(1720-1724)Online publication date: Jul-2019
https://doi.org/10.1109/TVLSI.2019.2900836
Blanton RWang FXue CNag PXue YLi X(2017)DFM Evaluation Using IC Diagnosis DataIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2016.258728336:3(463-474)Online publication date: 1-Mar-2017
https://dl.acm.org/doi/10.1109/TCAD.2016.2587283
Show More Cited By

Index Terms

Multiple defect diagnosis using no assumptions on failing pattern characteristics
1. Hardware
  1. Hardware test
  2. Robustness

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cover image ACM Conferences

DAC '08: Proceedings of the 45th annual Design Automation Conference

June 2008

993 pages

ISBN:9781605581156

DOI:10.1145/1391469

General Chair:
Limor Fix
Intel Research Pittsburgh, Pittsburgh, PA

Copyright © 2008 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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The EDA Consortium
IEEE/CASS/CANDE/CEDA
SIGDA: ACM Special Interest Group on Design Automation

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 08 June 2008

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Division of Computing and Communication Foundations

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DAC '08

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SIGDA

DAC '08: The 45th Annual Design Automation Conference 2008

June 8 - 13, 2008

California, Anaheim

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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June 22 - 26, 2025

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Cited By

Pomeranz I(2020)New Targets for Diagnostic Test GenerationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2019.292897139:10(3035-3043)Online publication date: Oct-2020
https://doi.org/10.1109/TCAD.2019.2928971
Pomeranz I(2019)Test Scores for Improving the Accuracy of Logic Diagnosis for Multiple DefectsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2019.290083627:7(1720-1724)Online publication date: Jul-2019
https://doi.org/10.1109/TVLSI.2019.2900836
Blanton RWang FXue CNag PXue YLi X(2017)DFM Evaluation Using IC Diagnosis DataIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2016.258728336:3(463-474)Online publication date: 1-Mar-2017
https://dl.acm.org/doi/10.1109/TCAD.2016.2587283
Pomeranz I(2016)Improving the Accuracy of Defect Diagnosis with Multiple Sets of Candidate FaultsIEEE Transactions on Computers10.1109/TC.2015.246823465:7(2332-2338)Online publication date: 1-Jul-2016
https://doi.org/10.1109/TC.2015.2468234
Gokkul Nath TMidhila ESwaminathan ALekshmi BAnita J(2016)Diagnosis of Multiple Stuck-at Faults Using Fault Element Graph with Reduced PowerSecurity in Computing and Communications10.1007/978-981-10-2738-3_36(414-426)Online publication date: 17-Sep-2016
https://doi.org/10.1007/978-981-10-2738-3_36
Ye JHu YLi XCheng WHuang YTang H(2014)Diagnose Failures Caused by Multiple Locations at a TimeIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2013.225643722:4(824-837)Online publication date: 1-Apr-2014
https://dl.acm.org/doi/10.1109/TVLSI.2013.2256437
Wing Chiu Tam Blanton S(2014)Design-for-Manufacturability Assessment for Integrated Circuits Using RADARIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2014.233621633:10(1559-1572)Online publication date: Oct-2014
https://doi.org/10.1109/TCAD.2014.2336216
Pomeranz I(2014)OBOProceedings of the 2014 IEEE Computer Society Annual Symposium on VLSI10.1109/ISVLSI.2014.22(314-319)Online publication date: 9-Jul-2014
https://dl.acm.org/doi/10.1109/ISVLSI.2014.22
Pomeranz IMacii E(2013)On candidate fault sets for fault diagnosis and dominance graphs of equivalence classesProceedings of the Conference on Design, Automation and Test in Europe10.5555/2485288.2485551(1083-1088)Online publication date: 18-Mar-2013
https://dl.acm.org/doi/10.5555/2485288.2485551
Pomeranz I(2013)Classes of difficult-to-diagnose transition fault clusters2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)10.1109/DFT.2013.6653574(1-6)Online publication date: Oct-2013
https://doi.org/10.1109/DFT.2013.6653574
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