research-article

A holistic approach for statistical SRAM analysis

Authors:

Petr Dobrovolny,

Miguel MirandaAuthors Info & Claims

DAC '10: Proceedings of the 47th Design Automation Conference

Pages 717 - 722

https://doi.org/10.1145/1837274.1837455

Published: 13 June 2010 Publication History

Abstract

We present a new method and its implementation that enables design-phase assessment of statistical performance metrics of semiconductor memories under random local and global process variations. Engineers use the tool to reduce design margins and to maximize parametric yield. Results on industry grade 45nm SRAM designs show that this holistic approach is significantly more accurate than the alternatives based on global corners or critical path netlist, which can lead to unexpected yield loss.

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Cited By

Jeon IPark HYoon TJeong H(2023)High Efficiency Variation-Aware SRAM Timing Characterization via Machine Learning-Assisted Netlist ExtractionIEEE Transactions on Circuits and Systems II: Express Briefs10.1109/TCSII.2023.3318577(1-1)Online publication date: 2023
https://doi.org/10.1109/TCSII.2023.3318577
Qazi MTikekar MDolecek LShah DChandrakasan A(2013)Technique for Efficient Evaluation of SRAM Timing FailureIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2012.221225421:8(1558-1562)Online publication date: 1-Aug-2013
https://dl.acm.org/doi/10.1109/TVLSI.2012.2212254
Poliakov PBlomme PPret ACorbalan MGronheid RVerkest DVan Houdt JDehaene W(2012)Induced Variability of Cell-to-Cell Interference by Line Edge Roughness in nand Flash ArraysIEEE Electron Device Letters10.1109/LED.2011.217609933:2(164-166)Online publication date: Feb-2012
https://doi.org/10.1109/LED.2011.2176099
Show More Cited By

Index Terms

A holistic approach for statistical SRAM analysis
1. Computing methodologies
  1. Modeling and simulation
    1. Simulation types and techniques
2. Mathematics of computing
  1. Probability and statistics
    1. Probabilistic reasoning algorithms
      1. Markov-chain Monte Carlo methods
      2. Sequential Monte Carlo methods

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Published In

cover image ACM Conferences

DAC '10: Proceedings of the 47th Design Automation Conference

June 2010

1036 pages

ISBN:9781450300025

DOI:10.1145/1837274

General Chair:
Sachin Sapatnekar
Univ. of Minnesota, Minneapolis, MN

Copyright © 2010 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
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Association for Computing Machinery

New York, NY, United States

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Published: 13 June 2010

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DAC '10: The 47th Annual Design Automation Conference 2010

June 13 - 18, 2010

California, Anaheim

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Jeon IPark HYoon TJeong H(2023)High Efficiency Variation-Aware SRAM Timing Characterization via Machine Learning-Assisted Netlist ExtractionIEEE Transactions on Circuits and Systems II: Express Briefs10.1109/TCSII.2023.3318577(1-1)Online publication date: 2023
https://doi.org/10.1109/TCSII.2023.3318577
Qazi MTikekar MDolecek LShah DChandrakasan A(2013)Technique for Efficient Evaluation of SRAM Timing FailureIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2012.221225421:8(1558-1562)Online publication date: 1-Aug-2013
https://dl.acm.org/doi/10.1109/TVLSI.2012.2212254
Poliakov PBlomme PPret ACorbalan MGronheid RVerkest DVan Houdt JDehaene W(2012)Induced Variability of Cell-to-Cell Interference by Line Edge Roughness in nand Flash ArraysIEEE Electron Device Letters10.1109/LED.2011.217609933:2(164-166)Online publication date: Feb-2012
https://doi.org/10.1109/LED.2011.2176099
McConaghy TBreen KDyck JGupta AMcConaghy TBreen KDyck JGupta A(2012)High-Sigma Verification and DesignVariation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide10.1007/978-1-4614-2269-3_5(115-167)Online publication date: 26-Sep-2012
https://doi.org/10.1007/978-1-4614-2269-3_5
Miranda MZuber PDobrovolny PRoussel P(2011)Variability aware modeling for yield enhancement of SRAM and logic2011 Design, Automation & Test in Europe10.1109/DATE.2011.5763193(1-6)Online publication date: Mar-2011
https://doi.org/10.1109/DATE.2011.5763193

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