Cited By
View all- Vasudevamurthy RDas PAmrutur B(2018)Time-Based All-Digital Technique for Analog Built-in Self-TestIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2013.224290922:2(334-342)Online publication date: 29-Dec-2018
- Mehta NAmrutur B(2018)Dynamic supply and threshold voltage scaling for CMOS digital circuits using in-situ power monitorIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2011.213276520:5(892-901)Online publication date: 29-Dec-2018
- Bhagavatula SByunghoo Jung Yung-Hsiang Lu (2014)Real-Time Power Sensors for Intelligent Power Management and BeyondIEEE Design & Test10.1109/MDAT.2014.232553431:4(27-35)Online publication date: Aug-2014
- Show More Cited By