research-article

Meta-Cure: a reliability enhancement strategy for metadata in NAND flash memory storage systems

Authors:

Luis Angel D. Bathen,

Zili ShaoAuthors Info & Claims

DAC '12: Proceedings of the 49th Annual Design Automation Conference

Pages 214 - 219

https://doi.org/10.1145/2228360.2228401

Published: 03 June 2012 Publication History

Abstract

The increasing density of NAND flash memory leads to a dramatic increase in the bit error rate of flash, which greatly reduces the ability of error correcting codes (ECC) to handle multi-bit errors. To ensure the functionality and reliability of flash memory, the pages containing address mapping information and other metadata should be carefully stored in flash memory. This paper presents Meta-Cure, a novel hardware and file system interface that transparently protects metadata in the presence of multi-bit faults. Meta-Cure exploits built-in ECC and replication in order to protect pages containing critical data. Redundant pairs are formed at run time and distributed to different physical pages to protect against failures. Meta-Cure requires no changes to the file system, on-chip hierarchy, or hardware implementation of flash memory chip. Experimental results show that the proposed technique can reduce uncorrectable page errors by 92% with less than 1% space overhead in comparison with conventional error correction techniques.

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Cited By

Liu YZhang ZXu JXie GLi R(2022)Coded worn block mechanism to reduce garbage collection in SSDJournal of Systems Architecture: the EUROMICRO Journal10.1016/j.sysarc.2022.102487126:COnline publication date: 1-May-2022
https://dl.acm.org/doi/10.1016/j.sysarc.2022.102487
Zhuang WChien CLin CKing Y(2020)Self-Clamping Programming in Narrow-Bridge Floating Gate Cells for Multi-Level Logic Non-Volatile Memory ApplicationsIEEE Journal of the Electron Devices Society10.1109/JEDS.2020.30059048(681-685)Online publication date: 2020
https://doi.org/10.1109/JEDS.2020.3005904
Chen RZhang CWang YShen ZLiu DShao ZGuan Y(2019)DCR: Deterministic Crash Recovery for NAND Flash Storage SystemsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.287817938:12(2201-2214)Online publication date: Dec-2019
https://doi.org/10.1109/TCAD.2018.2878179
Show More Cited By

Index Terms

Meta-Cure: a reliability enhancement strategy for metadata in NAND flash memory storage systems
1. Software and its engineering
  1. Software organization and properties
    1. Contextual software domains
      1. Operating systems
        Memory management
        Secondary storage

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Published In

cover image ACM Conferences

DAC '12: Proceedings of the 49th Annual Design Automation Conference

June 2012

1357 pages

ISBN:9781450311991

DOI:10.1145/2228360

General Chair:
Patrick Groeneveld
Magma Design Automation, Inc., San Jose, CA
,
Program Chairs:
Donatella Sciuto
Politecnico di Milano, Milano, Italy
,
Soha Hassoun
Tufts Univ., Medford, MA

Copyright © 2012 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

Sponsors

EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

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SIGBED: ACM Special Interest Group on Embedded Systems

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 03 June 2012

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DAC '12

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EDAC
SIGDA

DAC '12: The 49th Annual Design Automation Conference 2012

June 3 - 7, 2012

California, San Francisco

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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DAC '25

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62nd ACM/IEEE Design Automation Conference

June 22 - 26, 2025

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Cited By

Liu YZhang ZXu JXie GLi R(2022)Coded worn block mechanism to reduce garbage collection in SSDJournal of Systems Architecture: the EUROMICRO Journal10.1016/j.sysarc.2022.102487126:COnline publication date: 1-May-2022
https://dl.acm.org/doi/10.1016/j.sysarc.2022.102487
Zhuang WChien CLin CKing Y(2020)Self-Clamping Programming in Narrow-Bridge Floating Gate Cells for Multi-Level Logic Non-Volatile Memory ApplicationsIEEE Journal of the Electron Devices Society10.1109/JEDS.2020.30059048(681-685)Online publication date: 2020
https://doi.org/10.1109/JEDS.2020.3005904
Chen RZhang CWang YShen ZLiu DShao ZGuan Y(2019)DCR: Deterministic Crash Recovery for NAND Flash Storage SystemsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.287817938:12(2201-2214)Online publication date: Dec-2019
https://doi.org/10.1109/TCAD.2018.2878179
Huang MXu BLiu ZXu YWu D(2017)Implicit Programming: A Fast Programming Strategy for nand Flash Memory Storage Systems Adopting Redundancy MethodsIEEE Embedded Systems Letters10.1109/LES.2017.26701409:2(37-40)Online publication date: Jun-2017
https://doi.org/10.1109/LES.2017.2670140
Wei DQiao LWang SPeng X(2016)Fixation Ratio of Error Location-Aware Strategy for Increased Reliable Retention Time of Flash MemoryIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2016.253784624:10(3145-3155)Online publication date: 1-Oct-2016
https://dl.acm.org/doi/10.1109/TVLSI.2016.2537846
Mittal SVetter J(2016)A Survey of Software Techniques for Using Non-Volatile Memories for Storage and Main Memory SystemsIEEE Transactions on Parallel and Distributed Systems10.1109/TPDS.2015.244298027:5(1537-1550)Online publication date: 1-May-2016
https://dl.acm.org/doi/10.1109/TPDS.2015.2442980
Huang MLiu ZQiao LWang YShao Z(2016)An Endurance-Aware Metadata Allocation Strategy for MLC NAND Flash Memory Storage SystemsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.247439435:4(691-694)Online publication date: Apr-2016
https://doi.org/10.1109/TCAD.2015.2474394
Shi LWu KZhao MXue CLiu DSha E(2016)Retention Trimming for Lifetime Improvement of Flash Memory Storage SystemsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.245336935:1(58-71)Online publication date: Jan-2016
https://doi.org/10.1109/TCAD.2015.2453369
Kim JLee EChoi JLee DNoh S(2016)Chip-Level RAID with Flexible Stripe Size and Parity Placement for Enhanced SSD ReliabilityIEEE Transactions on Computers10.1109/TC.2014.237517965:4(1116-1130)Online publication date: 1-Apr-2016
https://dl.acm.org/doi/10.1109/TC.2014.2375179
Liu RChuang MYang CLi CHo KLi H(2016)Improving Read Performance of NAND Flash SSDs by Exploiting Error LocalityIEEE Transactions on Computers10.1109/TC.2014.234538765:4(1090-1102)Online publication date: 1-Apr-2016
https://dl.acm.org/doi/10.1109/TC.2014.2345387
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