research-article

On the exploitation of the inherent error resilience of wireless systems under unreliable silicon

Authors:

Georgios Karakonstantis,

Christoph Roth,

Christian Benkeser,

Andreas BurgAuthors Info & Claims

DAC '12: Proceedings of the 49th Annual Design Automation Conference

Pages 510 - 515

https://doi.org/10.1145/2228360.2228451

Published: 03 June 2012 Publication History

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Abstract

In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation.

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Meinerzhagen PTeman AGiterman REdri NBurg AFish AMeinerzhagen PTeman AGiterman REdri NBurg AFish A(2017)Retention Time Modeling: The Key to Low-Power GC-eDRAMsGain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip10.1007/978-3-319-60402-2_3(27-48)Online publication date: 7-Jul-2017
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Meinerzhagen PTeman AGiterman REdri NBurg AFish AMeinerzhagen PTeman AGiterman REdri NBurg AFish A(2017)Gain-Cell eDRAMs (GC-eDRAMs): Review of Basics and Prior ArtGain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip10.1007/978-3-319-60402-2_2(13-26)Online publication date: 7-Jul-2017
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Index Terms

On the exploitation of the inherent error resilience of wireless systems under unreliable silicon
1. Hardware
  1. Hardware validation

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Published In

DAC '12: Proceedings of the 49th Annual Design Automation Conference

June 2012

1357 pages

ISBN:9781450311991

DOI:10.1145/2228360

General Chair:
Patrick Groeneveld
Magma Design Automation, Inc., San Jose, CA
,
Program Chairs:
Donatella Sciuto
Politecnico di Milano, Milano, Italy
,
Soha Hassoun
Tufts Univ., Medford, MA

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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SIGBED: ACM Special Interest Group on Embedded Systems

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Association for Computing Machinery

New York, NY, United States

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Published: 03 June 2012

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Swiss National Science Foundation

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DAC '12

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EDAC
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DAC '12: The 49th Annual Design Automation Conference 2012

June 3 - 7, 2012

California, San Francisco

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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62nd ACM/IEEE Design Automation Conference

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Catthoor FGroeseneken G(2017)Will Chips of the Future Learn How to Feel Pain and Cure Themselves?IEEE Design & Test10.1109/MDAT.2017.273084134:5(80-87)Online publication date: Oct-2017
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Meinerzhagen PTeman AGiterman REdri NBurg AFish AMeinerzhagen PTeman AGiterman REdri NBurg AFish A(2017)Retention Time Modeling: The Key to Low-Power GC-eDRAMsGain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip10.1007/978-3-319-60402-2_3(27-48)Online publication date: 7-Jul-2017
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Design of energy efficient and dependable health monitoring systems under unreliable nanometer technologies

TSV redundancy: architecture and design issues in 3-D IC

The Impact of Junction Doping Distribution on Device Performance Variability and Reliability for Fully Depleted Silicon on Insulator With Thin Box Layer MOSFETs

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