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- Alves NNepal KDworak JBahar R(2009)Detecting errors using multi-cycle invariance information2009 Design, Automation & Test in Europe Conference & Exhibition10.1109/DATE.2009.5090771(791-796)Online publication date: Apr-2009
- Son YNa J(2004)A New Logic Transformation Method for Both Low Power and High TestabilityIntegrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation10.1007/978-3-540-30205-6_79(770-779)Online publication date: 2004
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