research-article

IPAS: intelligent protection against silent output corruption in scientific applications

Authors:

Ignacio Laguna,

David F. Richards,

Luke OlsonAuthors Info & Claims

CGO '16: Proceedings of the 2016 International Symposium on Code Generation and Optimization

Pages 227 - 238

https://doi.org/10.1145/2854038.2854059

Published: 29 February 2016 Publication History

Abstract

This paper presents IPAS, an instruction duplication technique that protects scientific applications from silent data corruption (SDC) in their output. The motivation for IPAS is that, due to natural error masking, only a subset of SDC errors actually affects the output of scientific codes—we call these errors silent output corruption (SOC) errors. Thus applications require duplication only on code that, when affected by a fault, yields SOC. We use machine learning to learn code instructions that must be protected to avoid SOC, and, using a compiler, we protect only those vulnerable instructions by duplication, thus significantly reducing the overhead that is introduced by instruction duplication. In our experiments with five workloads, IPAS reduces the percentage of SOC by up to 90% with a slowdown that ranges between 1.04x and 1.35x, which corresponds to as much as 47% less slowdown than state-of-the-art instruction duplication techniques.

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Cited By

Zeng JHuang SLiu JJung C(2024)Soft Error Resilience at Near-Zero CostProceedings of the 38th ACM International Conference on Supercomputing10.1145/3650200.3656605(176-187)Online publication date: 30-May-2024
https://dl.acm.org/doi/10.1145/3650200.3656605
Althiban AAlharbi HAl Khuzayem LEassa F(2023)Predicting Software Defects in Hybrid MPI and OpenMP Parallel Programs Using Machine LearningElectronics10.3390/electronics1301018213:1(182)Online publication date: 30-Dec-2023
https://doi.org/10.3390/electronics13010182
Ranjbar BKlemme FGenssler PAmrouch HJung JDave SSo HLee KShrivastava ALin JWeckx PMishra SCatthoor FBiswas DKumar A(2023)Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE56975.2023.10137182(1-10)Online publication date: Apr-2023
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Index Terms

IPAS: intelligent protection against silent output corruption in scientific applications
1. Hardware
  1. Hardware test
  2. Robustness
2. Software and its engineering
  1. Software notations and tools
    1. Compilers

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cover image ACM Conferences

CGO '16: Proceedings of the 2016 International Symposium on Code Generation and Optimization

February 2016

283 pages

ISBN:9781450337786

DOI:10.1145/2854038

General Chair:
Bjoern Franke
University of Edinburgh, UK
,
Program Chairs:
Youfeng Wu
Intel, USA
,
Fabrice Rastello
Inria, France

Copyright © 2016 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 29 February 2016

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CGO '16: 14th Annual IEEE/ACM International Symposium on Code Generation and Optimization

March 12 - 18, 2016

Barcelona, Spain

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CGO '16 Paper Acceptance Rate 25 of 108 submissions, 23%;

Overall Acceptance Rate 312 of 1,061 submissions, 29%

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Zeng JHuang SLiu JJung C(2024)Soft Error Resilience at Near-Zero CostProceedings of the 38th ACM International Conference on Supercomputing10.1145/3650200.3656605(176-187)Online publication date: 30-May-2024
https://dl.acm.org/doi/10.1145/3650200.3656605
Althiban AAlharbi HAl Khuzayem LEassa F(2023)Predicting Software Defects in Hybrid MPI and OpenMP Parallel Programs Using Machine LearningElectronics10.3390/electronics1301018213:1(182)Online publication date: 30-Dec-2023
https://doi.org/10.3390/electronics13010182
Ranjbar BKlemme FGenssler PAmrouch HJung JDave SSo HLee KShrivastava ALin JWeckx PMishra SCatthoor FBiswas DKumar A(2023)Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE56975.2023.10137182(1-10)Online publication date: Apr-2023
https://doi.org/10.23919/DATE56975.2023.10137182
Schlueter BCalhoun JPoulos A(2023)Evaluating the Resiliency of Posits for Scientific ComputingProceedings of the SC '23 Workshops of The International Conference on High Performance Computing, Network, Storage, and Analysis10.1145/3624062.3624116(477-487)Online publication date: 12-Nov-2023
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He ZHuang YXu HTao DLi GMohror KArnold DBadia R(2023)Demystifying and Mitigating Cross-Layer Deficiencies of Soft Error Protection in Instruction DuplicationProceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis10.1145/3581784.3607078(1-13)Online publication date: 12-Nov-2023
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