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Realizing erase-free SLC flash memory with rewritable programming design

Published: 01 October 2016 Publication History

Abstract

Over the past years, the adaptation of flash memory has seen a tremendous growth in a wide range of fields, with high-end applications demanding ever higher reliability and performance for storage devices. Even though a single-level-cell (SLC) flash memory can have a higher endurance and a lower access latency to better meet that requirement in comparison with a multi-level-cell (MLC) one, the rapid deterioration of reliability due to advanced shrinking technology means that a flash block can only survive over a smaller and smaller number of erase cycles. This work proposes an erase-free scheme, which comprises the design of rewritable programming and software management, to enable a rewritable usage model that can reuse flash blocks several times without using erase operations in an SLC flash memory based storage system. The evaluation results show that the proposed scheme achieves 6--time rewritable capability such that 83% erase operations can be removed; in the best settings, the write latency can be reduced by 3.67x on average under various workloads.

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Cited By

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  • (2023)ADAR: Application-Specific Data Allocation and Reprogramming Optimization for 3-D TLC Flash MemoryIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.321039042:6(1824-1837)Online publication date: Jun-2023
  • (2022)Reprogramming 3D TLC Flash Memory based Solid State DrivesACM Transactions on Storage10.1145/348706418:1(1-33)Online publication date: 29-Jan-2022
  • (2021)Enabling the Duo-phase Data Management to Realize Longevity Bit-alterable Flash MemoryIEEE Transactions on Computers10.1109/TC.2021.3116862(1-1)Online publication date: 2021
  • Show More Cited By

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cover image ACM Other conferences
CODES '16: Proceedings of the Eleventh IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis
October 2016
294 pages
ISBN:9781450344838
DOI:10.1145/2968456
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 01 October 2016

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ESWEEK'16
ESWEEK'16: TWELFTH EMBEDDED SYSTEM WEEK
October 1 - 7, 2016
Pennsylvania, Pittsburgh

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Cited By

View all
  • (2023)ADAR: Application-Specific Data Allocation and Reprogramming Optimization for 3-D TLC Flash MemoryIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.321039042:6(1824-1837)Online publication date: Jun-2023
  • (2022)Reprogramming 3D TLC Flash Memory based Solid State DrivesACM Transactions on Storage10.1145/348706418:1(1-33)Online publication date: 29-Jan-2022
  • (2021)Enabling the Duo-phase Data Management to Realize Longevity Bit-alterable Flash MemoryIEEE Transactions on Computers10.1109/TC.2021.3116862(1-1)Online publication date: 2021
  • (2020)Challenges and Designs for Secure Deletion in Storage Systems2020 Indo – Taiwan 2nd International Conference on Computing, Analytics and Networks (Indo-Taiwan ICAN)10.1109/Indo-TaiwanICAN48429.2020.9181335(181-189)Online publication date: Feb-2020
  • (2019)Toward Instantaneous Sanitization through Disturbance-induced Errors and Recycling Programming over 3D Flash Memory2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)10.1109/ICCAD45719.2019.8942084(1-8)Online publication date: Nov-2019
  • (2018)A Stride-Away Programming Scheme to Resolve Crash Recoverability and Data Readability Issues of Multi-Level-Cell Flash Memory2018 IEEE 7th Non-Volatile Memory Systems and Applications Symposium (NVMSA)10.1109/NVMSA.2018.00019(67-72)Online publication date: Aug-2018
  • (2017)VirtualGCProceedings of the 54th Annual Design Automation Conference 201710.1145/3061639.3062339(1-6)Online publication date: 18-Jun-2017

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