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Impact of interconnect variations on the clock skew of a gigahertz microprocessor

Published: 01 June 2000 Publication History
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  • Abstract

    Due to the large die sizes and tight relative clock skew margins, the impact of interconnect manufacturing variations on the clock skew in today's gigahertz microprocessors can no longer be ignored. Unlike manufacturing variations in the devices, the impact of the interconnect manufacturing variations on IC timing performance cannot be captured by worst/best case corner point methods. Thus it is difficult to estimate the clock skew variability due to interconnect variations. In this paper we analyze the timing impact of several key statistically independent interconnect variations in a context-dependent manner by applying a previously reported interconnect variational order-reduction technique. The results show that the interconnect variations can cause up to 25% clock skew variability in a modern microprocessor design.

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    Cited By

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    • (2016)Clock Design and SynthesisElectronic Design Automation for IC Implementation, Circuit Design, and Process Technology10.1201/b19714-13(261-282)Online publication date: 14-Apr-2016
    • (2015)A Contact Mechanics Formulation for Predicting Dishing and Erosion CMP Defects in Integrated CircuitsTribology Letters10.1007/s11249-015-0550-159:2Online publication date: 11-Jul-2015
    • (2014)Integrated Resource Allocation and Binding in Clock Mesh SynthesisACM Transactions on Design Automation of Electronic Systems10.1145/261176219:3(1-28)Online publication date: 23-Jun-2014
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    cover image ACM Conferences
    DAC '00: Proceedings of the 37th Annual Design Automation Conference
    June 2000
    819 pages
    ISBN:1581131879
    DOI:10.1145/337292
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 01 June 2000

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    DAC00: ACM/IEEE-CAS/EDAC Design Automation Conference
    June 5 - 9, 2000
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    Cited By

    View all
    • (2016)Clock Design and SynthesisElectronic Design Automation for IC Implementation, Circuit Design, and Process Technology10.1201/b19714-13(261-282)Online publication date: 14-Apr-2016
    • (2015)A Contact Mechanics Formulation for Predicting Dishing and Erosion CMP Defects in Integrated CircuitsTribology Letters10.1007/s11249-015-0550-159:2Online publication date: 11-Jul-2015
    • (2014)Integrated Resource Allocation and Binding in Clock Mesh SynthesisACM Transactions on Design Automation of Electronic Systems10.1145/261176219:3(1-28)Online publication date: 23-Jun-2014
    • (2014)Statistical Capacitance Extraction Based on Continuous-Surface Geometric ModelAdvanced Field-Solver Techniques for RC Extraction of Integrated Circuits10.1007/978-3-642-54298-5_9(153-178)Online publication date: 12-Mar-2014
    • (2014)Process Variation-Aware Capacitance ExtractionAdvanced Field-Solver Techniques for RC Extraction of Integrated Circuits10.1007/978-3-642-54298-5_8(121-152)Online publication date: 12-Mar-2014
    • (2014)Extracting Frequency-Dependent Substrate ParasiticsAdvanced Field-Solver Techniques for RC Extraction of Integrated Circuits10.1007/978-3-642-54298-5_7(107-119)Online publication date: 12-Mar-2014
    • (2014)Substrate Resistance Extraction with Boundary Element MethodAdvanced Field-Solver Techniques for RC Extraction of Integrated Circuits10.1007/978-3-642-54298-5_6(91-106)Online publication date: 12-Mar-2014
    • (2014)Resistance Extraction of Complex 3-D InterconnectsAdvanced Field-Solver Techniques for RC Extraction of Integrated Circuits10.1007/978-3-642-54298-5_5(71-89)Online publication date: 12-Mar-2014
    • (2014)Fast Boundary Element Methods for Capacitance Extraction (II)Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits10.1007/978-3-642-54298-5_4(39-70)Online publication date: 12-Mar-2014
    • (2014)Fast Boundary Element Methods for Capacitance Extraction (I)Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits10.1007/978-3-642-54298-5_3(19-37)Online publication date: 12-Mar-2014
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