research-article

Public Access

A New Aging Sensor for the Detection of Recycled ICs

Authors:

Gang QuAuthors Info & Claims

GLSVLSI '20: Proceedings of the 2020 on Great Lakes Symposium on VLSI

Pages 223 - 228

https://doi.org/10.1145/3386263.3407656

Published: 07 September 2020 Publication History

Abstract

The electronics industry has become the main target of counterfeiting. Integrated circuits (ICs) are highly vulnerable to various types of counterfeiting such as recycling. The recycled ICs do not have the performance and service lifetime of the genuine ones, which poses a threat to reliability of electronic systems. In this paper, we propose a novel recycled IC detection method. An authentication mechanism and a parallel circuit unit structures, as an aging sensor, are used to distinguish recycled ICs from fresh ICs. Due to degradation in the field, the path delay of used circuit unit (scan-flip flop for example) will become larger than that in fresh circuit unit, which inspire us to use an authentication procedure to "freeze" the circuit unit-ref, and utilize SR-latch to compare the transmission speed of two circuit channels. Both HSPICE simulation and FPGA silicon implementation results show that this is a cost-effective method with high detection accuracy and secure again standard attacks.

Supplementary Material

MP4 File (3386263.3407656.mp4)

Presentation video

Download
2920.38 MB

References

[1]

R. Moudgil, D. Ganta, L. Nazhandali L, et al. "A novel statistical and circuit-based technique for counterfeit detection in existing ICs," 2013: 1--6.

[2]

U. Guin, K. Huang, D. DiMase, J. M. Carulli, M. Tehranipoor and Y. Makris, "Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain," in Proceedings of the IEEE, vol. 102, no. 8, pp. 1207--1228, Aug. 2014.

[3]

U. Guin, K. Huang, D. DiMase, J. M. Carulli, M. Tehranipoor and Y. Makris, "Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain," in Proceedings of the IEEE, vol. 102, no. 8, pp. 1207--1228, Aug. 2014.

[4]

D. Rossi, V. Tenentes, S. Khursheed and S. M. Reddy, "Recycled IC detection through aging sensor," 2018 IEEE 23rd European Test Symposium (ETS), Bremen, 2018, pp. 1--2.

[5]

P. Song, F. Stellari and A. Weger, "Counterfeit IC detection using light emission," 2014 International Test Conference, Seattle, WA, 2014, pp. 1--8.

[6]

G. Qu and M. Potkonjak, "Fingerprinting Intellectual Property using Constraint-addition," Proceedings of the 37th Annual Design Automation Conference, pp. 810--813, 2000.

Digital Library

[7]

A. E. Caldwell et al., "Effective iterative techniques for fingerprinting design IP," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 23, no. 2, pp. 208--215, Feb. 2004.

Digital Library

[8]

M. Miller J M, And J. Hayward. "Traceability in the age of globalization: A proposal for a marking protocol to assure authenticity of electronic parts," Proceedings of the SAE, 2012.

[9]

J. Hayward and J. Meraglia. "DNA Marking and Authentication: A unique, secure anti-counterfeiting program for the electronics industry," International Symposium on Microelectronics, 2011.

[10]

DNA authentication marking on items in fsc 5962[EB/OL]. https://www.dibbs.bsm.dla.mil/ notices/msgdspl.aspx?msgid=685.

[11]

X. Zhang, K. Xiao and M. Tehranipoor, "Path-delay fingerprinting for identification of recovered ICs," 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Austin, TX, 2012, pp. 13--18.

[12]

I T Jolliffe. Principal Component Analysis [M]. 2ed Edition. Springer, 2002: 16.

[13]

K. Huang, J. M. Carulli and Y. Makris, "Parametric counterfeit IC detection via Support Vector Machines," 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Austin, TX, 2012, pp. 7--12.

[14]

P. Kumari, B. M. S. B. Talukder, S. Sakib, B. Ray and M. T. Rahman, "Independent detection of recycled flash memory: Challenges and solutions," 2018 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), Washington, DC, 2018, pp. 89--95.

[15]

H. Dogan, D. Forte and M. M. Tehranipoor, "Aging analysis for recycled FPGA detection," 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Amsterdam, 2014, pp. 171--176.

[16]

M. M. Alam, M. Tehranipoor and D. Forte, "Recycled FPGA detection using exhaustive LUT path delay characterization," 2016 IEEE International Test Conference (ITC), Fort Worth, TX, 2016, pp. 1--10.

[17]

X. Zhang and M. Tehranipoor, "Design of On-Chip Lightweight Sensors for Effective Detection of Recycled ICs," in IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 22, no. 5, pp. 1016--1029, May 2014.

[18]

C. W. Lin and S. Ghosh, "Novel self-calibrating recycling sensor using Schmitt-Trigger and voltage boosting for fine-grained detection," Sixteenth International Symposium on Quality Electronic Design, Santa Clara, CA, 2015, pp. 465--469.

[19]

B. Habib, J-P. Kaps, K. Gaj. "Efficient SR-Latch PUF", Proceedings of the Applied Reconfigurable Computing, 2015: 205--216.

[20]

A. Cui, W. Zhou, G. Qu and H. Li, "A New Scheme to Extract PUF Information by Scan Chain," 2018 IEEE 27th Asian Test Symposium (ATS), Hefei, 2018, pp. 104--108.

[21]

X. Zhang, N. Tuzzio and M. Tehranipoor, "Identification of recovered ICs using fingerprints from a light-weight on-chip sensor," DAC Design Automation Conference 2012, San Francisco, CA, 2012, pp. 703--708.

Cited By

Mahmod JHicks MQuek TGao DZhou JCardenas A(2024)SRAM Imprinting for System Protection and DifferentiationProceedings of the 19th ACM Asia Conference on Computer and Communications Security10.1145/3634737.3657011(453-466)Online publication date: 1-Jul-2024
https://dl.acm.org/doi/10.1145/3634737.3657011
Odom GTisha ZGuin U(2024)A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538766(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538766
Nyako KDevkota SLi FBorra V(2023)Building Trust in Microelectronics: A Comprehensive Review of Current Techniques and Adoption ChallengesElectronics10.3390/electronics1222461812:22(4618)Online publication date: 11-Nov-2023
https://doi.org/10.3390/electronics12224618
Show More Cited By

Index Terms

A New Aging Sensor for the Detection of Recycled ICs
1. Security and privacy
  1. Security in hardware

Recommendations

Identification of recovered ICs using fingerprints from a light-weight on-chip sensor
DAC '12: Proceedings of the 49th Annual Design Automation Conference

The counterfeiting and recycling of integrated circuits (ICs) have become major problems in recent years, potentially impacting the security of electronic systems bound for military, financial, or other critical applications. With identical ...
EM-Based on-Chip Aging Sensor for Detection and Prevention of Counterfeit and Recycled ICs
ICCAD '15: Proceedings of the IEEE/ACM International Conference on Computer-Aided Design

The counterfeiting and recycled integrated circuits (ICs) has become a major security threat for commercial and military systems. In addition to the huge economic impacts, they post significant security and safety threats on those systems. In this paper,...
Golden-Free Robust Age Estimation to Triage Recycled ICs
Nondestructive golden-free detection of recycled/counterfeit integrated circuits (ICs) is the focus of this article. This is achieved by estimating the functional/operational age of the IC. The age estimation method is based on exploiting short-term aging ...

Comments

Information & Contributors

Information

Published In

cover image ACM Other conferences

GLSVLSI '20: Proceedings of the 2020 on Great Lakes Symposium on VLSI

September 2020

597 pages

ISBN:9781450379441

DOI:10.1145/3386263

General Chairs:
Tinoosh Mohsenin
University of Maryland, Baltimore County, USA
,
Weisheng Zhao
Beihang University, China
,
Program Chairs:
Yiran Chen
Duke University, USA
,
Onur Mutlu
ETH Zurich, Switzerland

Copyright © 2020 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

Publisher

Association for Computing Machinery

New York, NY, United States

Publication History

Published: 07 September 2020

Permissions

Request permissions for this article.

Request Permissions

Check for updates

Author Tags

Qualifiers

Research-article

Funding Sources

National Natural Science Foundation of China
Shenzhen Fundamental Science Research Foundation
AFOSR

Conference

GLSVLSI '20

GLSVLSI '20: Great Lakes Symposium on VLSI 2020

September 7 - 9, 2020

Virtual Event, China

Acceptance Rates

Overall Acceptance Rate 312 of 1,156 submissions, 27%

Contributors

Other Metrics

View Article Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

6
Total Citations
View Citations
316
Total Downloads

Downloads (Last 12 months)92
Downloads (Last 6 weeks)19

Reflects downloads up to 13 Nov 2024

Other Metrics

View Author Metrics

Citations

Cited By

Mahmod JHicks MQuek TGao DZhou JCardenas A(2024)SRAM Imprinting for System Protection and DifferentiationProceedings of the 19th ACM Asia Conference on Computer and Communications Security10.1145/3634737.3657011(453-466)Online publication date: 1-Jul-2024
https://dl.acm.org/doi/10.1145/3634737.3657011
Odom GTisha ZGuin U(2024)A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538766(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538766
Nyako KDevkota SLi FBorra V(2023)Building Trust in Microelectronics: A Comprehensive Review of Current Techniques and Adoption ChallengesElectronics10.3390/electronics1222461812:22(4618)Online publication date: 11-Nov-2023
https://doi.org/10.3390/electronics12224618
Surabhi VKrishnamurthy PAmrouch HHenkel JKarri RKhorrami F(2023)Golden-Free Robust Age Estimation to Triage Recycled ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.323829142:9(2839-2851)Online publication date: Sep-2023
https://doi.org/10.1109/TCAD.2023.3238291
Aramoon OQu GCui A(2022)Building Hardware Security Primitives Using Scan-based Design-for-Testability2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)10.1109/MWSCAS54063.2022.9859460(1-6)Online publication date: 7-Aug-2022
https://doi.org/10.1109/MWSCAS54063.2022.9859460
Kalanadhabhatta SDutt RKhursheed SAcharyya A(2021)IC age estimation methodology using IO pad protection diodes for prevention of Recycled ICs2021 IEEE International Symposium on Circuits and Systems (ISCAS)10.1109/ISCAS51556.2021.9401363(1-5)Online publication date: May-2021
https://doi.org/10.1109/ISCAS51556.2021.9401363

View Options

View options

PDF

View or Download as a PDF file.

eReader

View online with eReader.

Get Access

Login options

Check if you have access through your login credentials or your institution to get full access on this article.

Full Access

Get this Publication

Media

Figures

Other

Tables

View Table of Contents