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Radiation Hardening by Design Techniques for the Mutual Exclusion Element

Authors:

Moises Herrera,

Peter BeerelAuthors Info & Claims

GLSVLSI '22: Proceedings of the Great Lakes Symposium on VLSI 2022

Pages 267 - 273

https://doi.org/10.1145/3526241.3530310

Published: 06 June 2022 Publication History

Abstract

Circuits in advanced CMOS technology are increasingly more sensitive to transient pulses caused by radiation particles that strike vulnerable circuit components, specially turned off transistors, often generating multiple voltage upsets. Towards mitigating these issues, this paper presents a novel Radiation Hardened by Design (RHBD) mutual exclusion element (mutex) that incorporates multiple RHBD techniques with reduced area overhead.

We compared our proposed circuit to the baseline and the state-of-the-art designs, in terms of resiliency to Single Event Transients (SET) and Single Event Upsets (SEU), request to grant latency, and area overhead. Results shows that the proposed circuit mitigates SET and prevents SEU events incurring in 1.42x performance and 5.1x transistor area overhead compared to the baseline (unhardened) design. On the other hand, the proposed mutex circuit improves SEU resiliency at outputs, achieving 0.58x transistor area and 0.62x latency compared to the state-of-the-art RHBD mutex that uses modular redundancy.

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Cited By

Ahirwar RPattanaik MSrivastava P(2024)Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop ApplicationJournal of Electronic Testing: Theory and Applications10.1007/s10836-024-06113-x40:2(171-184)Online publication date: 17-Apr-2024
https://dl.acm.org/doi/10.1007/s10836-024-06113-x

Index Terms

Radiation Hardening by Design Techniques for the Mutual Exclusion Element
1. Hardware
  1. Integrated circuits
    1. Logic circuits
      1. Asynchronous circuits
  2. Robustness
    1. Hardware reliability
      1. Circuit hardening

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Published In

cover image ACM Conferences

GLSVLSI '22: Proceedings of the Great Lakes Symposium on VLSI 2022

June 2022

560 pages

ISBN:9781450393225

DOI:10.1145/3526241

General Chairs:
Ioannis Savidis
Drexel University, USA
,
Avesta Sasan
University of California, Davis, USA
,
Program Chairs:
Himanshu Thapliyal
University of Tennessee, Knoxville, USA
,
Ronald F. DeMara
University of Central Florida, USA

Copyright © 2022 Owner/Author.

This work is licensed under a Creative Commons Attribution-NonCommercial International 4.0 License.

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SIGDA: ACM Special Interest Group on Design Automation

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Association for Computing Machinery

New York, NY, United States

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Published: 06 June 2022

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Niobium Microsystems

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GLSVLSI '22

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GLSVLSI '22: Great Lakes Symposium on VLSI 2022

June 6 - 8, 2022

CA, Irvine, USA

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Overall Acceptance Rate 312 of 1,156 submissions, 27%

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Cited By

Ahirwar RPattanaik MSrivastava P(2024)Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop ApplicationJournal of Electronic Testing: Theory and Applications10.1007/s10836-024-06113-x40:2(171-184)Online publication date: 17-Apr-2024
https://dl.acm.org/doi/10.1007/s10836-024-06113-x

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