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Self-checking sequential circuits with self-healing ability

Published: 18 April 2002 Publication History

Abstract

In this paper we deal with totally self-checking (TSC) synchronous sequential circuits (SSCs), that are able to recover after an occurrence of a fault. We call SSC owing this property as a self-healing SSC. A concept of a partially monotonic SSC is used in the paper. It is shown that the partially monotonic SSCs satisfy the self-healing property. A novel reduced m-out-of-n code is developed. It is proposed applying this code to the synthesis of a TSC checker for the state monotonic SSCs. The proposed method of synthesis is based on a LUT implementation of monotonic functions.For most circuits in a standard benchmark set, the proposed approach leads to a reduction of about 10-20% of the overhead as compared with the traditional methods.

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        cover image ACM Conferences
        GLSVLSI '02: Proceedings of the 12th ACM Great Lakes symposium on VLSI
        April 2002
        194 pages
        ISBN:1581134622
        DOI:10.1145/505306
        Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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        Published: 18 April 2002

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        April 18 - 19, 2002
        New York, New York, USA

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        • (2006)Designing Self-checking Circuits with Smooth Power Dissipation2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel10.1109/EEEI.2006.321147(1-5)Online publication date: Nov-2006
        • (2002)Self-healing ability of sequential circuitsThe 22nd Convention on Electrical and Electronics Engineers in Israel, 2002.10.1109/EEEI.2002.1178351(114-116)Online publication date: 2002

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