Article

A novel wavelet transform based transient current analysis for fault detection and localization

Authors:

Swarup Bhunia,

Kaushik Roy,

Jaume SeguraAuthors Info & Claims

DAC '02: Proceedings of the 39th annual Design Automation Conference

Pages 361 - 366

https://doi.org/10.1145/513918.514011

Published: 10 June 2002 Publication History

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Abstract

Transient current (IDD) based testing has been often cited and investigated as an alternative and/or supplement to quiescent current (IDDQ) testing. While the potential of IDD testing for fault detection has been established, there is no known efficient method for fault diagnosis using IDD analysis. In this paper, we present a novel integrated method for fault detection and localization using wavelet transform based IDD waveform analysis. The time-frequency resolution property of wavelet transform helps us detect as well as localize faults in digital CMOS circuits. Experiments performed on measured data from a fabricated 8-bit shift register and simulation data from more complex circuits show promising results for both detection and localization. Wavelet based detection method shows superior sensitivity than spectral and time domain methods. The effectiveness of the localization method in presence of process variation, measurement noise and complex power supply network is addressed.

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Cited By

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Roy KMak TCheng K(2006)Test Consideration for Nanometer-Scale CMOS CircuitsIEEE Design & Test10.1109/MDT.2006.5223:2(128-136)Online publication date: 1-Mar-2006
https://dl.acm.org/doi/10.1109/MDT.2006.52
Singh APlusquellic JPhatak DPatel C(2006)Defect Simulation Methodology for iDDT TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-006-9318-822:3(255-272)Online publication date: 1-Jun-2006
https://dl.acm.org/doi/10.1007/s10836-006-9318-8
Bhunia SRaychowdhury ARoy K(2005)Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply CurrentJournal of Electronic Testing: Theory and Applications10.1007/s10836-005-6144-321:2(147-159)Online publication date: 1-Apr-2005
https://dl.acm.org/doi/10.1007/s10836-005-6144-3
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Index Terms

A novel wavelet transform based transient current analysis for fault detection and localization
1. Hardware
  1. Hardware validation

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Published In

DAC '02: Proceedings of the 39th annual Design Automation Conference

June 2002

956 pages

ISBN:1581134614

DOI:10.1145/513918

General Chair:
Bryan Ackland
Agere Systems, Inc., Holmdel, NJ

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

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Published: 10 June 2002

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DAC02: 39th Design Automation Conference

June 10 - 14, 2002

Louisiana, New Orleans, USA

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DAC '02 Paper Acceptance Rate 147 of 491 submissions, 30%;

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

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Roy KMak TCheng K(2006)Test Consideration for Nanometer-Scale CMOS CircuitsIEEE Design & Test10.1109/MDT.2006.5223:2(128-136)Online publication date: 1-Mar-2006
https://dl.acm.org/doi/10.1109/MDT.2006.52
Singh APlusquellic JPhatak DPatel C(2006)Defect Simulation Methodology for iDDT TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-006-9318-822:3(255-272)Online publication date: 1-Jun-2006
https://dl.acm.org/doi/10.1007/s10836-006-9318-8
Bhunia SRaychowdhury ARoy K(2005)Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply CurrentJournal of Electronic Testing: Theory and Applications10.1007/s10836-005-6144-321:2(147-159)Online publication date: 1-Apr-2005
https://dl.acm.org/doi/10.1007/s10836-005-6144-3
Singh ATharian JPlusquellic J(2003)Path Delay Estimation using Power Supply Transient SignalsProceedings of the 2003 IEEE/ACM international conference on Computer-aided design10.5555/996070.1009971Online publication date: 9-Nov-2003
https://dl.acm.org/doi/10.5555/996070.1009971

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