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SCOAP: Sandia controllability/observability analysis program

Published: 23 June 1980 Publication History

Abstract

SCOAP is a program developed at Sandia National Laboratories for the analysis of digital circuit testability. Testability is related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper reviews the testability analysis algorithms and describes their implementation in the SCOAP program.

References

[1]
L. H. Goldstein, "Controllability/Observability Analysis of Digital Circuits,&rdquo CANDE Workshop, Mt. Hood, Oregon (1978).
[2]
L. H. Goldstein, "Controllability/Observability Analysis of Digital Circuits," IEEE Trans. Circuits and Systems, Vol. 26, No. 9, (1979).
[3]
L. H. Goldstein, "Controllability/Observability Analysis of Separable Logic Structures," Design for Testability Workshop, Boulder, Colorado (1979).
[4]
E. B. Eichelberger and T. W. Williams, "A Logic Design Structure for LSI Testability," Proc. 14th Design Automation Conf., pp 462-468 (1977).
[5]
W. Keiner and R. West, "Testability Measures," AUTOTESTCON, pp 49-55 (1977).
[6]
W. J. Dejka, "Measure of Testability in Device and System Design," "Proc. 20th Midwest Symposium on Circuits and Systems," pp 39-52 (1977).
[7]
J. E. Stephenson and J. Grason, "A Testability Measure for Register Transfer Level Digital Circuits," Proc. 6th Fault-Tolerant Computing Symposium, pp 101-107 (1976).
[8]
J. Grason, "TMEAS, A Testability Measurement Program," Proc. 16th Design Automation Conference, pp 156-161 (1979).
[9]
Breuer and Associates, TEST/80—An Advanced ATG System for Digital Circuits, Report 1-77.
[10]
P. G. Kovijanic, "Testability Analysis," 1979 Semiconductor Test Conference, October 1979.
[11]
J. A. Dussault, "A Testability Measure," Proc. 1978 Semiconductor Test Conference, pp 113-116 (1978).
[12]
H. Y. Chang and G. H. Heimbigner, "LAMP: Controllability, Observability, and Maintenance Engineering Technique (COMET)," Bell System Tech. J., Vol. 53, No. 8, pp 1505-1534 (1974).
[13]
F. Barsi, F. Grandoni and P. Maestrini, "A Theory of Diagnosability of Digital Systems," IEEE Trans. Comput., Vol. C-25, pp 585-593 (1976).

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        cover image ACM Conferences
        DAC '80: Proceedings of the 17th Design Automation Conference
        June 1980
        642 pages
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        Published: 23 June 1980

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