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Prediction of interconnect adjacency distribution: derivation, validation, and applications

Published: 14 February 2004 Publication History

Abstract

An analytical interconnect adjacency distribution model for random logic interconnect networks based on the Bernoulli probability distribution is derived. By definition, interconnect adjacency is the fractional length of an interconnect for which there is a neighboring interconnect at minimum spacing. Some possible applications of the interconnect adjacency distribution are statistical cross-talk analysis, interconnect yield prediction, and statistical interconnect reference circuit for more realistic capacitance estimation.The model uses only simple and readily available system parameters well known to designers. These are the wire-length distribution and the average channel utilization. Comparison to product data shows good agreement with the model.

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cover image ACM Conferences
SLIP '04: Proceedings of the 2004 international workshop on System level interconnect prediction
February 2004
111 pages
ISBN:1581138180
DOI:10.1145/966747
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Association for Computing Machinery

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Publication History

Published: 14 February 2004

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Author Tags

  1. interconnect adjacency
  2. interconnect pattern density
  3. prediction
  4. probability density function
  5. stochastic model

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