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Speedpath prediction based on learning from a small set of examples

Published: 08 June 2008 Publication History

Abstract

In high performance designs, speed-limiting logic paths (speedpaths) impact the power/performance trade-off that is becoming critical in our low power regimes. Timing tools attempt to model and predict the delay of all the paths on a chip, which may be in the millions. These delay predictions often have a significant error and when silicon is measured there is a large variation of path delays as compared to the prediction of the tools. This variation may be caused by process, environmental or other effects that are often unpredictable. It is therefore desirable to use early silicon data to better predict and model potential speedpaths for subsequent silicon steppings. In this paper, we present a novel machine learning-based approach that uses a small number of identified speedpaths to predict a larger set of potential speedpaths, thus significantly enhancing the traditional timing prediction flows post-silicon. We demonstrate the feasibility of this approach and summarize our findings based on the analysis of silicon speedpaths from a 65nm P4 microprocessor.

References

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L. Lee, L. Wang, P. Parvathala, TM Mak, "On Silicon-Based Speed Path Identification," Proc. VTS 2005.
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P. Bastani, B. Lee, L. Wang, M. Abadir, "Analyzing the risk of timing modeling based on path delay test," Proc. ITC, 2007.
[3]
Li-C. Wang, P. Bastani, M. Abadir, "Design-silicon timing correlation -- a data mining perspective," Proc. DAC, 2007.
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K. Killpack, C. Kashyap, E. Chiprout, "Silicon Speedpath Measurement and Feedback into EDA flows," Proc. DAC, 2007.
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B. Gottlieb, et al, "Silicon Debug: What Do You Do When Your ASIC Does Not Work as Fast as Expected?" Proc. DAC, 2004.
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A. Agarwal, D. Blaauw, and F. Dartu, "Statistical Gate Delay Model Considering Multiple Input Switching," Proc. DAC, 2004.
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P. Larsson and C. Svensson, "Noise in digital dynamic CMOS circuits," IEEE J. Solid-State Circuits June 1994, pp. 655--663.
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Cited By

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  • (2023)Design of Digital Integrated Circuits by Improving the Characteristics of Digital CellsMachine Learning-based Design and Optimization of High-Speed Circuits10.1007/978-3-031-50714-4_6(279-336)Online publication date: 31-Dec-2023
  • (2018)IR drop prediction of ECO-revised circuits using machine learning2018 IEEE 36th VLSI Test Symposium (VTS)10.1109/VTS.2018.8368657(1-6)Online publication date: Apr-2018
  • (2018)QBF-Based Post-Silicon Debug of Speed-Paths Under Timing VariationsIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2018.2858291(1-10)Online publication date: 2018
  • Show More Cited By

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  1. Speedpath prediction based on learning from a small set of examples

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    cover image ACM Conferences
    DAC '08: Proceedings of the 45th annual Design Automation Conference
    June 2008
    993 pages
    ISBN:9781605581156
    DOI:10.1145/1391469
    • General Chair:
    • Limor Fix
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 08 June 2008

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    Author Tags

    1. learning
    2. speedpath
    3. timing analysis

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    • CA Micro/Intel

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    Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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    Cited By

    View all
    • (2023)Design of Digital Integrated Circuits by Improving the Characteristics of Digital CellsMachine Learning-based Design and Optimization of High-Speed Circuits10.1007/978-3-031-50714-4_6(279-336)Online publication date: 31-Dec-2023
    • (2018)IR drop prediction of ECO-revised circuits using machine learning2018 IEEE 36th VLSI Test Symposium (VTS)10.1109/VTS.2018.8368657(1-6)Online publication date: Apr-2018
    • (2018)QBF-Based Post-Silicon Debug of Speed-Paths Under Timing VariationsIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2018.2858291(1-10)Online publication date: 2018
    • (2018)Post-silicon validation based on synthetic test patterns for early detection of timing anomalies2018 IEEE 19th Latin-American Test Symposium (LATS)10.1109/LATW.2018.8347237(1-5)Online publication date: Mar-2018
    • (2017)Generating power-optimal standard cell library specification using neural network technique2017 IEEE Asia Pacific Conference on Postgraduate Research in Microelectronics and Electronics (PrimeAsia)10.1109/PRIMEASIA.2017.8280374(101-104)Online publication date: Oct-2017
    • (2017)PSN‐aware circuit test timing prediction using machine learningIET Computers & Digital Techniques10.1049/iet-cdt.2016.003211:2(60-67)Online publication date: 25-Jan-2017
    • (2016)Statistical Framework and Built-In Self-Speed-Binning System for Speed Binning Using On-Chip Ring OscillatorsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2015.247892124:5(1675-1687)Online publication date: 1-May-2016
    • (2015)Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path SelectionACM Transactions on Design Automation of Electronic Systems10.1145/274623720:3(1-23)Online publication date: 24-Jun-2015
    • (2014)Post-silicon Timing Diagnosis Made Simple using Formal TechnologyProceedings of the 14th Conference on Formal Methods in Computer-Aided Design10.5555/2682923.2682949(131-138)Online publication date: 21-Oct-2014
    • (2014)SAT-based speedpath debugging using X traces2014 9th International Design and Test Symposium (IDT)10.1109/IDT.2014.7038595(100-105)Online publication date: Dec-2014
    • Show More Cited By

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