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New efficient algorithms for computing effective capacitance

Published: 01 April 1998 Publication History

Abstract

We describe a novel iterationless approach for computing the effective capacitance of an interconnect load at a driving gate output. Our new approach is considerably faster than previous methods for computing effective capacitance, with little or no loss of accuracy. Thus, the approach is suitable within the analysis loop for performance-driven iterative layout optimization. After reviewing previous gate load models and effective capacitance approximations, we separately derive our method for the cases of step and ramp waveform at the gate output, and note on-going extensions for the case of complex gates (e.g., channel-connected components). Experimental results using the new effective capacitance approach show that our resulting delay estimates are quite accurate — within 15% of IISPICE-computed delays on data corresponding to an 0.25µm microprocessor design.

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Cited By

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  • (2011)A Non-Iterative Method for Calculating the Effective Capacitance of CMOS Gates with Interconnect Load EffectIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.E94.A.1201E94-A:5(1201-1209)Online publication date: 2011
  • (2010)A non-iterative effective capacitance model for CMOS gate delay computing2010 International Conference on Communications, Circuits and Systems (ICCCAS)10.1109/ICCCAS.2010.5581849(896-900)Online publication date: Jul-2010
  • (2009)Accurate Method for Calculating the Effective Capacitance with RC Loads Based on the Thevenin ModelIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.E92.A.2531E92-A:10(2531-2539)Online publication date: 2009
  • Show More Cited By

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      cover image ACM Conferences
      ISPD '98: Proceedings of the 1998 international symposium on Physical design
      April 1998
      220 pages
      ISBN:158113021X
      DOI:10.1145/274535
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 01 April 1998

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      View all
      • (2011)A Non-Iterative Method for Calculating the Effective Capacitance of CMOS Gates with Interconnect Load EffectIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.E94.A.1201E94-A:5(1201-1209)Online publication date: 2011
      • (2010)A non-iterative effective capacitance model for CMOS gate delay computing2010 International Conference on Communications, Circuits and Systems (ICCCAS)10.1109/ICCCAS.2010.5581849(896-900)Online publication date: Jul-2010
      • (2009)Accurate Method for Calculating the Effective Capacitance with RC Loads Based on the Thevenin ModelIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.E92.A.2531E92-A:10(2531-2539)Online publication date: 2009
      • (2008)An advanced model for calculating the effective capacitance considering input waveform effect2008 International Conference on Communications, Circuits and Systems10.1109/ICCCAS.2008.4657957(1088-1092)Online publication date: May-2008
      • (2006)Modeling the Driver Load in the Presence of Process VariationsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2005.86273925:10(2264-2275)Online publication date: 1-Oct-2006
      • (2006)Modeling, testing, and analysis for delay defects and noise effects in deep submicron devicesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2003.81144222:6(756-769)Online publication date: 1-Nov-2006
      • (2005)Shielding effect of on-chip interconnect inductanceIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2004.84231513:3(396-400)Online publication date: 1-Mar-2005
      • (2005)A More Effective C_{EFF}Proceedings of the 6th International Symposium on Quality of Electronic Design10.1109/ISQED.2005.10(648-653)Online publication date: 21-Mar-2005
      • (2005)Quantifying Error in Dynamic Power Estimation of CMOS CircuitsAnalog Integrated Circuits and Signal Processing10.1007/s10470-005-6759-442:3(253-264)Online publication date: 1-Mar-2005
      • (2004)Performance Optimization of Critical Nets Through Active ShieldingIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2004.83824751:12(2417-2435)Online publication date: Dec-2004
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