IBM Opto-Electronic Device under Uniaxial Stress is an instrument-control software for studying the optical and electrical transport properties of nanoscale devices subject to mechanical uniaxial stress.
The characterization setup and methodology includes:
- a bending mechanical device;
- the desing of the strain substrate and of the electrical connectors;
- the software for data acquisition;
A thorough description of these setup is described in a peer reviewed paper in Review of Scientific Instruments (RSI link, arXiv link). Blue prints of the bending mechanics and of the electrical connectors are described in detail in the paper.
LICENSED MATERIALS – PROPERTY OF IBM Copyright © IBM Corp. 2016, All Rights Reserved Copyright © 2016 National Instruments Corporation. All Rights Reserved.
Licensed under the Apache License, Version 2.0 (the "License"); you may not use this file except in compliance with the License. You may obtain a copy of the License at
http://www.apache.org/licenses/LICENSE-2.0
Unless required by applicable law or agreed to in writing, software distributed under the License is distributed on an "AS IS" BASIS, WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. See the License for the specific language governing permissions and limitations under the License.