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This study presents a machine-learning (ML) framework called thicknessML, which rapidly extracts film thickness from spectroscopic reflection and transmission.
Jun 14, 2022 · High-throughput experimentation with autonomous workflows, increasingly used to screen and optimize optoelectronic thin films, ...
Jun 14, 2022 · Title:Tackling Data Scarcity with Transfer Learning: A Case Study of Thickness Characterization from Optical Spectra of Perovskite Thin Films.
This sofware package implements thicknessML framework that rapidly extracts/predicts semiconductor thin film thickness d from optical spectroscopic ...
Jul 13, 2023 · Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films†.
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Jul 12, 2023 · Tackling Data Scarcity with Transfer Learning: A Case Study of Thickness Characterization from Optical Spectra of Perovskite Thin Films.
Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films. SIP Tian, Z Ren, S ...
Tackling Data Scarcity with Transfer Learning: A Case Study of. Thickness Characterization from Optical Spectra of Perovskite Thin Films. Siyu Isaac Parker ...
Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films. SIP Tian, Z Ren, S ...
Nov 30, 2022 · In this paper, we propose a simple and elegant method to extract the thickness and the optical constants of various films from the reflectance ...