ABSTRACT The on-off fluctuations of the tunnel current in thin oxide MOS structures before breakd... more ABSTRACT The on-off fluctuations of the tunnel current in thin oxide MOS structures before breakdown is a well known phenomenon since 1985. Notwithstanding this, most of the models proposed in the last years to justify the failure of the structure ignore this phenomenon. The physical mechanism responsible for it is not completely clear, even if some possible explanations have been proposed. Some new results, obtained by using a novel characterization tool, are presented in this paper. These results could open new perspectives in the comprehension of the final stage of time dependent breakdown of thin oxides. .
Activation energy Ea of grain-boundary vacancies was evaluated by means of noise measurements and... more Activation energy Ea of grain-boundary vacancies was evaluated by means of noise measurements and MTF tests in narrow Al/Si (1%) resistors. The values obtained by these techniques are 0.93 and 0.96 eV respectively. Noise measuremen-ts revealed that after every temperature change the microstructure of the films was unstable. The presence of instabilities can strongly affect the Ea value.
In this work we analyze the noise properties of the current at the hard-breakdown of a 6 nm thick... more In this work we analyze the noise properties of the current at the hard-breakdown of a 6 nm thick oxide in an MOS structure. It is shown that in the quantum point contact case single fluctuators, probably consisting of electron traps inside the oxide, can be resolved, whereas the current noise at the thermal breakdown presents a 1 /f spectrum, due to the averaging process between many of these fluctuators. 2001 Published by Elsevier Science B.V.
International Journal of Circuit Theory and Applications
Efficient procedures for evaluating nonlinear distortion and noise valid for any OTA-C filter of ... more Efficient procedures for evaluating nonlinear distortion and noise valid for any OTA-C filter of arbitrary order are developed based on matrix description of a general OTA-C filter model. Since those procedures use OTA macromodels, they allow us to obtain ...
ABSTRACT The on-off fluctuations of the tunnel current in thin oxide MOS structures before breakd... more ABSTRACT The on-off fluctuations of the tunnel current in thin oxide MOS structures before breakdown is a well known phenomenon since 1985. Notwithstanding this, most of the models proposed in the last years to justify the failure of the structure ignore this phenomenon. The physical mechanism responsible for it is not completely clear, even if some possible explanations have been proposed. Some new results, obtained by using a novel characterization tool, are presented in this paper. These results could open new perspectives in the comprehension of the final stage of time dependent breakdown of thin oxides. .
Activation energy Ea of grain-boundary vacancies was evaluated by means of noise measurements and... more Activation energy Ea of grain-boundary vacancies was evaluated by means of noise measurements and MTF tests in narrow Al/Si (1%) resistors. The values obtained by these techniques are 0.93 and 0.96 eV respectively. Noise measuremen-ts revealed that after every temperature change the microstructure of the films was unstable. The presence of instabilities can strongly affect the Ea value.
In this work we analyze the noise properties of the current at the hard-breakdown of a 6 nm thick... more In this work we analyze the noise properties of the current at the hard-breakdown of a 6 nm thick oxide in an MOS structure. It is shown that in the quantum point contact case single fluctuators, probably consisting of electron traps inside the oxide, can be resolved, whereas the current noise at the thermal breakdown presents a 1 /f spectrum, due to the averaging process between many of these fluctuators. 2001 Published by Elsevier Science B.V.
International Journal of Circuit Theory and Applications
Efficient procedures for evaluating nonlinear distortion and noise valid for any OTA-C filter of ... more Efficient procedures for evaluating nonlinear distortion and noise valid for any OTA-C filter of arbitrary order are developed based on matrix description of a general OTA-C filter model. Since those procedures use OTA macromodels, they allow us to obtain ...
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