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Experimental Ammann-line analysis of phasons in the Al-Cu-Co-Si decagonal quasicrystal

H. L. Li, Z. Zhang, and K. H. Kuo
Phys. Rev. B 50, 3645 – Published 1 August 1994
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Abstract

We report phason defects in the stable Al-Cu-Co-Si decagonal quasicrystal obtained by an Ammann-line analysis of a tiling derived from a high-resolution electron microscope image, covering an area of about 25×34 nm2. Ammann-line jags, corresponding to matching rule violations, are about 4% of the total tiling edges. This supports the quasiperiodic-tiling model of quasicrystals.

  • Received 12 April 1994

DOI:https://doi.org/10.1103/PhysRevB.50.3645

©1994 American Physical Society

Authors & Affiliations

H. L. Li, Z. Zhang, and K. H. Kuo

  • Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, P.O. Box 2724, 100080 Beijing, People’s Republic of China

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Vol. 50, Iss. 6 — 1 August 1994

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