Mohamed H. Aissa
Von Karman Institute, Turbomachinery and Propulsion, Graduate Student
The aim of this work is to accelerate an existing two-dimensional explicit Euler solver implemented on a single CPU. The solver based on Discontinuous-Galerkin method for the spatial discretization is ported to run on a graphical... more
The aim of this work is to accelerate an existing two-dimensional explicit Euler solver implemented on a single CPU. The solver based on Discontinuous-Galerkin method for the spatial discretization is ported to run on a graphical processing units (GPU) using the CUDA programming language.
The input has been rearranged in one-dimensional buffers to maximize the profit from the GPU SIMD architecture. A GPU implementation of the explicit solver has been performed. The GPU implementation runs on a Tesla C1060 GPU and a Tesla K20
GPU. The CPU implementation has been also extended to run on multi-core CPU over OpenMP. The multi-CPU program runs on a hyper-threaded E5540 Intel Xeon processor.
Peak speedup of 66x has been achieved for the simulation of an acoustic pulse between GPU and single CPU implementation and peak speedup of 6x between the GPU and multiple CPUs implementation.
The input has been rearranged in one-dimensional buffers to maximize the profit from the GPU SIMD architecture. A GPU implementation of the explicit solver has been performed. The GPU implementation runs on a Tesla C1060 GPU and a Tesla K20
GPU. The CPU implementation has been also extended to run on multi-core CPU over OpenMP. The multi-CPU program runs on a hyper-threaded E5540 Intel Xeon processor.
Peak speedup of 66x has been achieved for the simulation of an acoustic pulse between GPU and single CPU implementation and peak speedup of 6x between the GPU and multiple CPUs implementation.
Research Interests:
Optical inspection systems constitute hardware components (e.g. measurement sensors, lighting systems, positioning systems etc.) and software components (system calibration techniques, image processing algorithms for defect detection and... more
Optical inspection systems constitute hardware components (e.g. measurement sensors, lighting systems, positioning systems etc.) and software components (system calibration techniques, image processing algorithms for defect detection and classification, data fusion, etc.). Given an inspection task choosing the most suitable components is not a trivial process and requires expert knowledge. For multiscale measurement systems, the optimization of the measurement system is an unsolved problem even for human experts. In this contribution we propose two assistant systems (hardware assistant and software assistant), which help in choosing the most suitable components depending on the task considering the properties of the object (e.g. material, surface roughness, etc.) and the defects (e.g. defect types, dimensions, etc.). The hardware assistant system uses general rules of thumb, sensor models/simulations and stored expert knowledge to specify the sensors along with their parameters and the hierarchy (if necessary) in a multiscale measurement system. The software assistant system then simulates many measurements with all possible defect types for the chosen sensors. Artificial neural networks (ANN) are used for pre-selection and genetic algorithms are used for finer selection of the defect detection algorithms along with their optimized parameters. In this contribution we will show the general architecture of the assistant system and results obtained for the detection of typical defects on technical surfaces in the micro-scale using a multiscale measurement system.