A rational design combining morphology and charge-dynamic for hematite/nickeliron oxide thin-layer photoanodes: insights on the role of the absorber/catalyst
junction.
Michele Orlandi,†*a Serena Berardi,‡*a Alberto Mazzi,† Stefano Caramori,‡ Rita
Boaretto,‡ Francesco Nart,‡ Carlo A. Bignozzi,‡ Nicola Bazzanella,† Nainesh Patel,§
Antonio Miotello.†
† Department of Physics, University of Trento, I-38123, Povo (Trento), Italy.
‡ Department of Chemical and Pharmaceutical Sciences, University of Ferrara, Via
Fossato di Mortara 17-19, 44100, Ferrara, Italy.
§ Department of Physics, University of Mumbai, Vidyanagari, Santacruz (E), Mumbai
400 098, India.
Corresponding authors: michele.orlandi@unitn.it, serena.berardi@unife.it
a
These authors contributed equally to the manuscript.
KEYWORDS: thin-layer photoanode, oxygen evolving catalyst, pulsed laser
deposition, porous morphology, photoelectrosynthesis, adaptive junction, nickel iron
oxide, impedance spectroscopy.
1
ABSTRACT
Water oxidation represents the anodic reaction in most of the photoelectrosynthetic
set-ups for artificial photosynthesis developed so far. The efficiency of the overall
process strongly depends on the joint exploitation of good absorber domains and
interfaces with minimized recombination pathways. To this end, we report on the
effective coupling of thin layer hematite with amorphous porous nickel-iron oxide
catalysts prepared via pulsed laser deposition. The rational design of such composite
photoelectrodes leads to the formation of a functional adaptive junction, with
enhanced photoanodic properties with respect to bare hematite. Electrochemical
impedance spectroscopy has contributed to shine light on the mechanisms of
photocurrent generation, confirming the reduction of recombination pathways as
the main contributor to the improved performances of the functionalized
photoelectrodes. Our results highlight the importance of the amorphous catalysts’
morphology, since dense and electrolyte impermeable layers hinder the pivotal
charge compensation processes at the interface. The direct comparison with all-iron
and all-nickel catalytic counterparts further confirm that the control over kinetics of
both hole transfer and charge recombination, enabled by the adaptive junction, is
key for the optimal operation of this kind of semiconductor/catalyst interfaces.
2
1. INTRODUCTION
Photoelectrochemical water splitting is one of the most pursued strategies aimed at
producing hydrogen fuel through the exploitation of abundant and renewable
resources, such as water and sunlight.1 In this sense, most of the reported
approaches rely on the use of photoelectrochemical cells (PEC) featuring
semiconductor materials, that fulfill the double role of visible light absorbers and
photogenerated carriers’ separators.2 In such a set-up, the efficiency of the overall
water splitting process is generally hampered by the water oxidation reaction, which
is both thermodynamically and kinetically demanding.3,4 Indeed, an efficient water
oxidation catalysis is also central to other important fuel-forming reactions, such as
CO2 reduction,5,6 as well as to the development of photoelectrochemical cell
technology in general. Thus, the development of efficient photoanodes is of
paramount importance. Furthermore, in view of a future industrial implementation
of this kind of approach, earth-abundant and cheap materials should be preferred.
We thus propose novel photoanodes entirely constituted by first-row transition
metals, namely iron and nickel. In particular, hematite (α-Fe2O3) is the
semiconductor of choice, possessing: (i) a small band gap (ca. 2.1 eV) which allows
for the absorption of a significant portion of the visible light spectrum, resulting in
theoretical photocurrent densities up to 12.6 mA/cm2; (ii) a valence band maximum
positioned at more positive potentials with respect to the water oxidation potential;
(iii) essentially null toxicity and (iv) good chemical stability in alkaline aqueous media.
However, hematite’s photoanodic performances are severely limited by the short
hole diffusion length (2-10 nm),7 which contrasts with the optical penetration depth
(ca. 100 nm for a 500 nm photon wavelength),8 as well as by the low conductivity of
the majority carriers9 and, to a less extent, by the hole transfer kinetics to the
electrolyte.10 All these features result in extracted photocurrent values far below the
theoretical maximum. Anyway, several strategies have been proposed in order to
overcome such limitations, including: (i) the rational nanostructuring of the hematite
film, aimed at obtaining morphologies with comparable size to that of the hole
diffusion length, as, for example, in a vapor phase deposited hematite, which
displays 5-10 nm-size particles at the tip of the tree-like aggregates;11 (ii) the
3
introduction of substitutional dopant elements in the lattice (such as, but not limited
to, Ti(IV),12–14 Sn(IV),15 Si(IV),11 Pt(IV)16 and Mg(II)17), in order to enhance the
electrical conductivity; (iii) the functionalization with suitable oxygen evolving
catalysts (OECs), able to boost the interfacial kinetics of water oxidation exploiting
their ability to collect and store photogenerated holes.18–24 This latter aspect is still a
hotly debated topic in the literature, since some groups have reported on effects
different than hole collection (e.g. passivation25 or the enhanced depletion layer
width26,27) as the main reason for the improved performances of OEC-functionalized
hematite electrodes. A further complication to take into account is the type of
junction formed between the hematite absorber and the OEC. Recent reports21,28,29
have detailed the importance of establishing an adaptive rather than a buried
junction, which can be achieved with a porous instead of a compact OEC morphology.
In this work, we combine the three abovementioned strategies for the design of a
photoanode consisting of Sn-doped thin layer hematite (SnHTL) functionalized with
amorphous nickel/iron oxides OECs. Fine-control of the OEC morphology down to
the nanometric scale is achieved by employing the pulsed laser deposition (PLD)
technique, allowing for the formation of an adaptive junction. The merging of all
these features leads to enhanced photoanodic performances when compared to the
single-metal oxide counterparts and/or to compact OECs morphology. With respect
to recent literature, where other hematite/nickel-iron oxides interfaces are
investigated,30,31 our work reports a systematic approach of comparison between
porous or compact catalyst morphology and between the mixed-metal oxide and its
single-metal
oxide
counterparts.
An
in-depth
(photo)electrochemical
characterization allows then to identify the key factors dictating the photoanode
performance and to gain insights into the photocurrent generation mechanism by
the modified interfaces.
2. EXPERIMENTAL METHODS
General procedures. FTO slides were cleaned by 10 min sonication in an Alconox®
aqueous solution, followed by 10 min sonication in isopropanol. Quartz and p-Si
4
substrates were cleaned by 10 min sonication in acetone, followed by rinsing with
isopropanol. The electrolytic solutions (either 0.1 M or 1 M KOH) were purified
according to literature procedures.32
Synthesis of OECs. Ni, Fe and NiFe oxides OECs were synthesized by a PLD method
on the following substrates: commercial (Sigma-Aldrich) quartz and p-type Si
substrates (for UV-Vis and SEM characterization, respectively), commercial (SigmaAldrich) FTO (for Raman spectroscopy and electrochemistry) and on FTO/SnHTL
electrodes (for photoelectrochemistry). For single metal oxides, a metallic disk
(purity 99.9% for Fe and 99.95% for Ni, Sematrade) was used as the target, while for
the mixed oxides the target was a metallic iron disk (99.9%, Sematrade) with a nickel
gauze mounted on top (50 mesh woven from 0.05mm diameter Puratronic® wire,
99.99% purity, Alfa-Aesar). PLD was carried out using a KrF excimer laser (Lambda
Physik LP 220i) with an operating wavelength of 248 nm, pulse duration of 25 ns,
repetition rate of 20 Hz, and laser fluence of 2.0 J/cm2. The deposition chamber was
evacuated up to a base pressure of 10−4 Pa, oxygen gas was then backfilled into the
chamber through a mass flow controller. Deposition was performed at a constant
oxygen pressure of 45 Pa. The distance between the metallic iron target and
substrates was set to 5.5 cm and the number of pulses was fixed (2,000 pulses), to
ensure that all samples have the same quantity of material. A set of samples on p-Si
was produced with 20,000 pulses specifically for SEM cross-section and Energy
Dispersive X-ray Spectroscopy (EDXS) analysis. Substrate temperatures were either
room temperature or 300°C (DEP). A more detailed description of the PLD apparatus
is available elsewhere.33 Samples deposited at room temperature were then
annealed for 2 hours at 300°C (AN) in air in a tubular furnace, with a heating rate of
10 °C/min.
Synthesis of SnHTL. 0.5 mmol (0.135 g) di FeCl3 and 5 µmol (1% doping) of SnCl4
were dissolved in 5 mL of EtOH containing 120 µL di PEG-600 as additive. The
resulting solution was spin coated on cleaned FTO slides (600 rpm for 6 s, then 2000
rpm for 20 s). Three spin coating cycles were performed, each one followed by an
annealing step at 550°C for 15 min. A final annealing at 800°C was then performed. It
is worth noting that a final annealing up to 800°C for 10 min is needed in order to
5
achieve good photoelectrochemical performances, since further Sn will be
incorporated in the hematite structure by partial migration from the FTO substrate,
thus enhancing the doping while reducing the grain boundaries and the superficial
concentration of hydroxyl- moieties, acting as recombination centers. At the same
time, it is important not to exceed in the annealing time at 800°C, since the
conductibility of FTO can be severely compromised.
Characterization of the (photo)electrodes. SEM-EDXS analysis was performed using
a JEOL JSM-7001F FEG-SEM equipped with an EDXS (Oxford INCA PentaFETx3).
Measurements were taken with 20.0 keV electron beam energy and the working
distance was maintained between 3 to 8 mm. Surface morphology images were
acquired in top-down and tilted mode whereas cross section analysis was performed
putting the films on a 90° stub. Raman measurements were performed on a Horiba
LabAramis setup equipped with a HeNe 633 nm laser as source and a confocal
microscope (100x objective) coupled to a 460 mm-focal length CCD-based
spectrograph equipped with a four interchangeable gratings-turret. In the range
between 450 nm and 850 nm, the wavenumber accuracy is 1 cm-1 with an 1800
l/mm grating. The laser power is 15 mW and the maximum spot size is 5 μm. An
accumulation number of 10 and an exposure time of 7 s were employed for all
measurements. XPS was performed using a PHI 5000 VersaProbe II equipped with a
mono-chromatic Al Kα (1486.6 eV) X-ray source and a hemispherical analyser.
Electrical charge compensation was required to perform the XPS analysis. Data
analysis was performed using the XPSPeak 4.1 software, using a Shirley-type
background and a weighted least-squares fitting of model curves (20% Gaussian,
80% Lorentzian) to the experimental data to obtain peak positions. Atomic force
microscopy (AFM) images were collected using a Digital Instruments Nanoscope III
scanning probe Microscope (Digital Instruments, CA). The instrument was equipped
with a silicon tip (RTESP-300 Bruker) and operated in tapping mode. Surface
topographical analysis of raw AFM images was carried out with Nanoscope analysis
1.5 program. UV-Vis absorption spectra were measured in transmission mode with a
JASCO V-570 and corrected for the bare FTO background. Photoelectrochemical
measurements were carried out on a PGSTAT 30 electrochemical workstation in a
6
three-electrode configuration, using SCE and Pt wire respectively as the reference
and the counter electrode. A LOT-Oriel solar simulator, equipped with an AM1.5G
filter, was used as the illumination source, and set to 0.1 W/cm2 incident irradiance
power by means of a Power Meter (Newport 1918-C). J-V curves were recorded at
20 mV/s scan rate in the KOH purified electrolyte. J-V curves under shuttered
illumination were acquired by manually chopping the excitation source. Unless
otherwise stated, all the potential values are given versus the reversible hydrogen
electrode (RHE), through the following equation:
=
+ 0.24 + 0.059 ∙
Incident Photon to Current Efficiencies (IPCEs) were measured in a three-electrode
configuration under the monochromatic illumination generated by an air cooled
Luxtel 175 W Xe lamp, coupled to an Applied Photophysics monochromator. The
resulting photocurrent, recorded at the selected constant potential, was measured
by a PGSTAT 30 potentiostat. Absorbed Photon to Current Efficiencies (APCEs) were
calculated from IPCE data by normalizing them for the light harvesting efficiency
(LHE) obtained from absorption spectra.
Electrochemical Impedance Spectroscopy (EIS) under illumination, the photoanodes
were sampled from 0.92 to 1.32 V at 50 or 100 mV intervals, employing a FRA2.v10
frequency response analyzer controlled by Nova 1.10. A 10 mV amplitude sinusoidal
perturbation, whose frequency ranged between 100000 and 0.05 Hz, was used. The
EIS data were fitted by means of the equivalent circuit reported in Figure S12a using
the ZView software, with typical relative errors lower than 10%.
3. RESULTS AND DISCUSSION
3.1 Structural and Morphological Characterization
Mixed-metal oxide coatings of iron and nickel (NiFe) and their single-metal
counterparts (Ni, Fe) are obtained by PLD in oxygen atmosphere from metallic
targets. Substrate temperature was either room temperature (RT) or 300°C. The
nomenclature selected to indicate samples accounts for the abovementioned
different deposition temperature, being DEP the designation for the samples
7
deposited at 300°C, while AN indicates the samples prepared at room temperature
and successively submitted to a 2 h post-annealing step at 300°C. It is worth pointing
out that this annealing step is not expected to significantly alter the morphology of
the deposited materials, but it only leads to some aggregation of the smaller
particles. On the other hand, the post-annealing treatment significantly improves the
adhesion on the conductive FTO substrates, which translates in a better long-term
stability.21 Furthermore, the two synthetic routes yielding DEP and AN oxides, have
been purposely designed to provide different film morphology, yet the same amount
of metal catalyst. This is possible since the oxide morphology, for fixed laser pulse
energy, is dictated by the substrate temperature, whereas the quantity of deposited
material critically depends on the background gas pressure, which in our case is kept
constant.
Figure 1 shows the scanning electron microscopy (SEM) images of all the deposited
oxides. It can be clearly seen that, as expected,21 two different film morphologies are
obtained through the two deposition procedures. In all cases, the depositions at RT
with subsequent annealing at 300°C resulted in a highly porous and nanostructured
oxide layer (see Figure 1, left column). On the other hand, the depositions
performed with the substrates heated at 300°C produce a compact morphology,
with assembled nanoparticles (see Figure 1, right column). This effect is due to the
higher mobility of the particles when they hit the heated substrate, leading to
aggregation and the formation of bigger and partially fused particles,34 as also
observed in the previous characterization of both the single-metal oxides.21,35
8
Figure 1. SEM cross-section images of catalyst layers deposited on silicon slides. Thicker
layers, produced by 20,000 (20k) laser pulses instead of 2,000 (2k) were analyzed here for
better cross-section imaging. First row: NiFe_AN (left) and NiFe_DEP (right). Second row:
Ni_AN (left) and Ni_DEP (right). Third row: Fe_AN (left) and Fe_DEP (right).
Further spectroscopic characterization of the thin oxides has been performed by
means of micro-Raman analysis, aimed at identifying the amorphous/crystalline
nature of the deposited materials. As reported in Figure S1, the Raman spectra of
both DEP and AN samples reveal only broad, unresolved features, almost
superimposable on those of FTO, thus indicating that the metallic oxides are largely
9
amorphous in nature. Note that, at least for the more compact morphology, metaloxide layers of similar thickness but annealed at higher temperatures (>550°C), have
been reported to exhibit clear spectral signatures.36 It is worth noting that the noncrystallinity of these catalytic materials does not jeopardize their activity towards
water oxidation, on the contrary, it is expected to enhance it. Several examples of
amorphous OECs more active than their crystalline counterparts have been reported
so-far.37–42
X-ray photoelectron spectroscopy (XPS) has been employed to investigate the
chemical composition of the films and the results for NiFe_DEP and NiFe_AN are
reported in Figure 2 and summarized in Table 1.
Table 1. XPS data for NiFe_DEP and NiFe_AN, extrapolated from Figure 2.
Sample
B.E. (eV) ± 0.5 eV
NiFe_DEP
854.6
855.7
861.2
865.3
710.3
712.1
718.2
723.8
725.6
529.7
531.2
855.0
856.0
861.4
866.1
710.5
712.4
718.5
723.6
725.5
529.9
531.5
NiFe_AN
Attribution
Ni 2p 3/2
Ni 2p 3/2
Ni 2p 3/2
Satellite
Fe 2p 3/2
Fe 2p 3/2
Satellite
Fe 2p 1/2
Fe 2p 1/2
O 1s
O 1s
Ni 2p 3/2
Ni 2p 3/2
Ni 2p 3/2
Satellite
Fe 2p 3/2
Fe 2p 3/2
Satellite
Fe 2p 1/2
Fe 2p 1/2
O 1s
O 1s
10
NiO
Ni(OH)2 – NiOOH - NiFe2O4
Ni(OH)2 – NiOOH
NiO
Fe2O3 – NiFe2O4
Fe(OH)3 – FeOOH
Fe2O3
Fe2O3
FeOOH
NiO - Fe2O3 – NiFe2O4
FeOOH - Ni(OH)2 – NiOOH
NiO
Ni(OH)2 – NiOOH - NiFe2O4
Ni(OH)2 – NiOOH
NiO
Fe2O3 – NiFe2O4
Fe(OH)3 - FeOOH
Fe2O3
Fe2O3
FeOOH
NiO - Fe2O3 – NiFe2O4
FeOOH - Ni(OH)2 – NiOOH
NiFe_DEP
NiFe_AN
Satellite
Ni 2p 3/2
Ni 2p 3/2
Ni 2p 3/2
Satellite
Ni2p 3/2
Ni2p 3/2
Ni2p 3/2
870
865
860
855
850
870
865
B.E.(eV)
860
855
850
B.E.(eV)
Fe2p 3/2
Fe2p 3/2
Satellite
Fe2p 1/2
Fe2p 1/2
Fe2p 3/2
Fe2p 3/2
Satellite
Fe2p 1/2
Fe2p 1/2
735 730 725 720 715 710 705
730 725 720 715 710 705
B.E.(eV)
B.E.(eV)
O1s
O1s
O1s
O1s
536 534 532 530 528 526
538 536 534 532 530 528 526
B.E.(eV)
B.E.(eV)
Figure 2. XPS spectra and corresponding fits for NiFe_DEP and NiFe_AN. Raw data is
reported as a black line, fitting curves in red and background in gold.
The corresponding analysis for the single-metal oxides are reported in Table S1,
while the XPS spectra are collected in figure S2. All the signals can be attributed to
Fe3+, Ni2+ and O and are compatible with the presence of the single-metal oxides
(Fe2O3 and NiO),43-48 their related hydroxide-oxyhydroxide systems (Ni(OH)2 – NiOOH,
Fe(OH)3 – FeOOH)45,48,49-52 and the NiFe2O4 mixed-metal oxide.45,49,53,54 The
formation of hydroxide-oxyhydroxide species is due to hydroxylation upon exposure
to air humidity and is a common feature for metal-oxide surfaces.55
11
Energy-dispersive X-ray spectroscopy (EDXS) analysis (Figure S3) performed on the
thicker (20k pulses) layers, confirms the uniform presence of Fe and Ni, with an
atomic ratio of 1.5-1.7/1. We thus attribute to NiFe_DEP and NiFe_AN films a
stoichiometry of NiFe1.5-1.7Ox.
The UV-Vis spectra of the thin oxide films are reported in Figure S4, confirming their
scarce absorbance (< 0.2) and excluding a significant parasitic light absorption when
they are used in combination with photoanodes. In all the cases, the porous
morphology leads to even lower absorption (< 0.1), with the best transparencies
achieved with NiFe_AN and Ni_AN (≤ 0.05 at 300 nm).
3.2. Electrochemical Properties of the Catalytic Layers
The electrochemical activity of the DEP and AN amorphous oxides has been tested in
0.1 M KOH, since these metal oxides are known to be stable in basic pHs.56 It is
worth noting that all the (photo)electrochemical characterizations reported in this
work have been performed in a purified “Fe-free” KOH electrolyte. Indeed, as
extensively studied by Boettcher and co-workers,32 even sub-ppm amounts of iron in
the electrolytic solution can be incorporated in the nickel-oxide structure, thus
forming layered mixed NiFe oxides and, therefore, altering the actual performances
of the pure nickel oxide catalysts.
Ni_AN
Ni_DEP
NiFe_AN
NiFe_DEP
Fe_AN
Fe_DEP
FTO
7.5
5.0
2.5
overpotential (V)
J (mA/cm2)
10.0
0.0
1.4
1.5
1.6
1.7
V (V) vs RHE
a
0.7
0.6
0.5
Ni_AN
Ni_DEP
NiFe_DEP
NiFe_AN
Fe_AN
Fe_DEP
0.4
0.3
-5
-4
-3
log J
-2
b
Figure 3. iR-drop compensated J-V curves for the DEP and AN oxides registered in purified
0.1 M KOH (a) and the corresponding Tafel plots (b).
12
As evidenced by the current density versus potential (J-V) curves reported in Figure
3a, all the catalysts result to be active toward water oxidation, in the order NiFe > Ni
> Fe. Furthermore, these experiments evidenced that the electroactivity does not
significantly change upon varying the film morphology. Indeed, porous and compact
films display pretty much the same onset of the catalytic current (values given at 1
mA/cm2 and reported in Table 2, together with the corresponding overpotentials). It
is worth noting that in the case of the pure nickel oxide catalysts, a pre-wave,
corresponding to the oxidation of Ni(II) to Ni(III) has been also observed at potential
values of 1.44 V vs RHE.
Table 2. Results of the electrochemical analyses for all the oxides.
OEC
Onset
Overpotential, η
Tafel slope
(@1 mA/cm2), V
(@1 mA/cm2), V
(mV/dec)
Ni_AN
1.65
0.42
58
Ni_DEP
1.67
0.44
61
NiFe_AN
1.60
0.37
28
NiFe_DEP
1.60
0.37
27
Fe_AN
1.75
0.52
32-70
Fe_DEP
1.73
0.50
28-63
The Tafel analysis further confirms that the mixed NiFe catalysts outperform the two
pure counterparts (Figure 3b). While a linear trend has been observed over two
current decades for both NiFe- and Ni-based catalysts, in the case of Fe-oxides the
Tafel characteristics are less linear, and could better be fitted with a polynomial
function. This behavior can be reasonably ascribed to a more significant variation of
the surface coverage of the adsorbed intermediates of water oxidation as a function
of the applied potential. Furthermore, for all the catalysts, a saturation region starts
to be evident at η > 0.4 V, where the current tends to become essentially
13
independent on the applied bias, suggesting that in these conditions all anodes tend
to reach a kinetic regime dominated by the chemical desorption of molecular O2
(Volmer-Tafel mechanism).57
3.3 Photoelectrochemical Properties of functionalized hematite
Given their good electrochemical performances, all the thin film catalysts have been
deposited on the Sn-doped hematite photoanodes (SnHTL). These electrodes have
been prepared using a new and straightforward synthetic procedure involving the
spin-coating and successive annealing of suitable precursors on FTO electrodes (see
the Supporting Information for further details). This synthesis yields thin layer
hematite photoanodes displaying a quite uniform coverage of nanoparticles,
homogeneously distributed both in shape and size, with an average diameter of ca.
50 nm, as evidenced by means of atomic force microscopy (Figure S5). The thin films
showed 0.7 maximum absorbance at 400 nm, tailing up to 590 nm, in agreement
with the band gap energy (2.1 eV theoretical value versus 2.3 eV calculated by the
experimental Tauc plot, see Figure S6). From the absorption spectrum, the layer
thickness can be estimated to be ca. 70 nm (given 2.3 · 105 cm-1 the absorption
coefficient of hematite at 400 nm8). This value has been further confirmed by SEM
analysis (Figure S7). This layer thickness has been shown to be a good compromise
between light absorption and charge collection, since the photoelectrochemical
performances of thick hematite films are strongly limited by the short minority
carrier diffusion length.13 Indeed, our SnHTL electrodes show photocurrent values up
to 0.55 mA/cm2 at 1.67 V (the onset of the dark current) when tested under 0.1
W/cm2 AM1.5G solar simulated irradiation in purified 0.1 M KOH (Figure 4, orange
curve).
The photoelectrochemical performances of this photoanodic material can be further
boosted by the introduction of the transparent catalytic films deposited by PLD.
Figure 4a reports the photoelectrochemical performance of the SnHTL electrodes
functionalized with the two kinds of mixed NiFe oxides in purified 0.1 M KOH,
compared to the bare hematite. The samples have been illuminated through the
14
electrolyte/hematite interface (front irradiation), as opposed to illumination through
the electron collector (FTO, back illumination).
0.50
1.5
SnHTL/NiFe_AN
SnHTL/NiFe_DEP
SnHTL
J (mA/cm2)
J (mA/cm2)
0.75
0.25
0.00
0.8
1.0
0.5
0.0
1.0
1.2
1.4
0.8
1.6
V (V) vs RHE
1.0
1.2
1.4
1.6
V (V) vs RHE
a
b
18
8
SnHTL
SnHTL/NiFe_AN
6
% IPCE
% IPCE
SnHTL
SnHTL/NiFe_AN
2x SnHTL/NiFe_AN tandem
2x SnHTL/NiFe_AN
tandem+back reflector
@1.1 V
4
2
15
SnHTL
SnHTL/NiFe_AN
12
@1.6 V
9
6
3
0
350 400 450 500 550 600
0
350 400 450 500 550 600
wavelength (nm)
c
wavelength (nm)
d
Figure 4. a) J-V curves of SnHTL photoanodes, before (orange) and after the functionalization
with NiFe_AN (dark green) and NiFe_DEP (light green), recorded in purified 0.1 M KOH under
1 sun illumination (0.1 W/cm2 AM1.5G). The corresponding dark J-V curves are reported as
dashed lines; b) J-V curves of 2 SnHTL/NiFe_AN photoanodes in tandem configuration, with
(gray) and without (blue) an Al back reflector. The J-V curve of the single SnHTL (orange) and
SnHTL/NiFe_AN (dark green) are also reported for sake of comparison, together with the
dark curve for SnHTL (orange dashed line); c-d) Incident photon to current conversion
efficiency (IPCE) curves for SnHTL (orange) and SnHTL/NiFe_AN (dark green) recorded in
purified 0.1 M KOH (pH 13.3) under 1.1 V (c) and 1.6 V (d) vs RHE applied bias; front
illumination.
The results evidence the striking differences between compact and porous catalysts.
It can be clearly seen that when the interface is functionalized with the NiFe_AN, i.e.
15
the porous catalyst, we observe a 0.1 V shift in the photocurrent onset with respect
to the bare hematite, as well as an increase in the total photocurrent (up to 0.6
mA/cm2 at 1.65 V). It is also interesting to observe that the J-V curves obtained by
irradiating through the transparent electron collector (FTO side) are slightly lower
than those obtained by excitation through the electrolyte (Figure S8), probably due
to a partial absorption of < 380 nm light by the FTO. The photoaction spectra
(collected under monochromatic illumination and 1.1 V applied bias, Figure 4c)
further confirm the improved performances upon functionalization, being the
incident photon to current conversion efficiency (IPCE) of the SnHTL/NiFe_AN
electrode ca. three times higher than that of the bare SnHTL in the whole
wavelength region explored (7% maximum IPCE at 350 nm, corresponding to 10%
APCE, absorbed photon to current conversion efficiency, in Figure S9a). At the
photocurrent plateau (i.e. under 1.6 V applied bias), SnHTL and SnHTL/NiFe_AN
electrodes reach 15% and 17% IPCE values, corresponding to 20% and 24% APCE
values respectively (Figures 4d and S9b). The presence of the OEC thus offers a major
gain at lower overpotentials, corresponding to the activation region of the J-V curve,
where recombination is more important. In addition, the good transparency of the
catalyst allows for the front side illumination of photoanode, which enables the
assembly of tandem PEC configuration, where photons transmitted through the first
electrode can be absorbed by a second cell or photoelectrode. This latter set-up has
been realized by the parallel connection of a stack of two SnHTL/NiFe_AN electrodes
delivering a maximum photocurrent of 0.79 mA/cm2 at 1.65 V, which could be
further enhanced up to 1.1 mA/cm2 by introducing an Al back reflector (Figure 4b).
Conversely to the functionalization with NiFe_AN, when NiFe_DEP is deposited on
top of hematite, the photoresponse of the resulting photoanode results almost
completely suppressed (light green curve in Figure 4a). These observations are in line
with our previous report on pure iron oxide amorphous catalysts,21 yielding a socalled adaptive junction when coupled with hematite semiconductors.28 Briefly,
unlike compact catalysts, porous amorphous catalysts display accessible electronic
states (in which the photogenerated holes can be trapped and accumulated),
resulting in the decoupling of the quasi-Fermi level of the semiconductor from that
16
of the catalyst/electrolyte junction.23,28 Furthermore their good solvent permeability
enables ion migration, which in turns leads to a better charge compensation at the
interface. On the other hand, compact and dense catalysts yield buried junctions
with the semiconductor, thus severely hampering the hole transfer to the electrolyte
and jeopardizing the charge separation and photovoltage generation of the
functionalized electrodes.28
After the rationalization of the photoanodic behavior of SnHTL/NiFe interfaces, we
extended the study to the pure Ni- and Fe-oxide based counterparts. Figure S10
reports the performances of SnHTL functionalized with the pure nickel oxides,
evidencing again the almost complete suppression of the photoanodic response of
hematite in the presence of compact Ni_DEP catalyst (compare gray and orange
curves). Furthermore, the SnHTL/Ni_DEP electrode results essentially insensitive to
light, as evidenced by the almost perfect matching of the J-V curves collected in the
dark or under illumination (gray traces). Thus, in this latter case, given the insulating
properties of hematite in the dark, the electrochemical response is most probably
due to just the Ni_DEP particles in electrical contact with the underlying FTO, (as
evidenced by the presence of the Ni(II)/Ni(III) wave in the dark) possibly causing
shorting when the photoanode operates under illumination.58 On the other hand,
the functionalization with porous Ni_AN does not yield the expected improved
performances (compare black and orange curves), yet not completely suppressing
the photoresponse. This behavior can be ascribed to the lower intrinsic activity of
pure Ni oxides with respect to the mixed NiFe (as reported in the literature40,56 and
consistent with the Tafel slopes in Table 2), resulting in a photoanodic assembly
limited by the charge transfer to the electrolyte (vide infra and Figure 6a). Anyway, a
direct evidence of the formation of the two different kinds of junctions upon
functionalization of SnHTL with the two different nickel oxide morphologies is indeed
given by the ca. 0.45 V cathodic shift of the Ni(II)/Ni(III) wave for Ni_AN with respect
to Ni_DEP, even if this value results lower than that of unmodified SnHTL (0.7 V,
estimated for the onset of the corresponding J-V curves in the dark and under
illumination), as a probable consequence of charge recombination. Anyway, the
photovoltage cannot be exploited in the case of Ni_DEP compact layer, since the
17
resulting junction experiences the pinning of the quasi-Fermi level of hematite to
that of the catalyst.
The photoanodic performances obtained upon functionalization of SnHTL with pure
Fe oxides are reported in Figure S11. We have limited the study to SnHTL/Fe_AN
electrodes, since the functionalization of hematite with Fe_DEP has been already
proven to be scarcely effective.21 In spite of our expectations, the presence of the
porous Fe_AN leads to a decrease in the total photocurrent (0.45 vs 0.55 mA/cm2 at
1.67 V), while the onset remains the same. We can rationalize this evidence by
invoking subtle differences in the surface of the SnHTL electrodes with respect to
that of the undoped hematite thin layers (HTL) used in our previous work,21 which
has possibly led to less uniform PLD deposition of the catalytic Fe layers. Indeed, due
to the well-known poor electrical conductivity of amorphous iron oxides,56 the
possible presence of regions with thicker agglomerates of catalyst can introduce a
voltage drop, partially preventing the access to Fe centers more distant from the
substrate, thus hindering the water oxidation kinetics. Recombination rate is also
higher for SnHTL/Fe_AN photoanodes when compared to bare SnHTL, as it will be
discussed later in the manuscript (Figure 6b).
3.4 Electrochemical Impedance Spectroscopy of the Photoanodes
In order to gain further insights on the interfacial processes associated with the
photoelectrochemical performances of the functionalized photoanodes, we have
performed electrochemical impedance spectroscopy (EIS) experiments on the SnHTL
photoanodes functionalized with the three kinds of porous catalysts.
The complex plane Nyquist plots, recorded under different applied biases (in the
steepest region of the J-V curves) are reported in Figure S12 along with the
corresponding fittings and the selected circuital model, a nested mesh generally
used to describe functionalized hematite interfaces.20,21 All the photoanodes share
similar impedance features, consisting of two semicircles. The high-frequency arc is
in all cases attributed to the charge transport through the space charge (SC) layer of
the semiconductor, characterized by the CPESC constant phase element (i.e. a nonideal capacitance, [note 1]) and the RSC resistance (see Figure S12a). Ideally, the low18
frequency semicircle is associated to the charge transfer (CT) from the catalyst states
to the electrolyte as far as the functionalized electrodes are concerned, whereas it is
related to the transfer of hole trapped in hematite surface states in the case of the
bare photoanode. Intermediate situations where the CT occurs from both the
catalyst and the hematite surface exposed to the electrolyte could however exist,
depending on the electrode regime of operation. For sake of simplicity, the
capacitance and resistance values associated to these processes are indicated as
CPECT and RCT without further distinction (Figure S12a).
Figure S13 shows the inverse of the differential resistance (dI/dV, calculated from
the I-V curves) versus the applied potential (gray curves), compared to RSC-1, RCT-1 and
Rtot-1 values (being Rtot = Rs + RSC + RCT the total resistance and Rs the serial resistance
associated to the cell geometry). It can be clearly seen that Rtot-1 nicely correlates
with the dI/dV curve in all cases, confirming that the selected circuital model
properly describes the active elements involved in photocurrent generation, thus
validating the resistance and capacitance values extracted from the fit. At the same
time, we can establish that at V < 1.12 V the major resistive contribution to the
photocurrent generation is given by RCT, the resistance associated with the charge
transfer to the electrolyte, which follows the same trend of the dI/dV curve in the
explored potential range. The J-V curves are instead dominated by the charge
transport through the space charge (RSC) at higher potentials (> 1.12 V), as previously
reported also by the Hamman group.20
It is also worth noting that for SnHTL, the CCT shows a bell shaped dependence on
the applied bias (Figure S14, orange curve), typical of the photogenerated holes
trapping in surface states,20,21,59 progressively emptied by the anodic potential scan.
These trapped holes on hematite surface are generally deemed as highly valent ironoxo species, the key reactive intermediates for oxygen evolution.60 Upon
functionalization with NiFe_AN, the CCT maintains the bell-shaped trend, with ca. 10
times higher values with respect to bare SnHTL (see Figure S14, green vs orange
curve). Furthermore, the CCT maximum results cathodically shifted by 0.25 V,
speaking in favor of a direct involvement of the catalyst in the storage of the
photoproduced charges. It is also worth noting that the position of the CCT maximum
19
(0.97 V) almost coincides with the minimum of the resistance of charge transfer to
the electrolyte, RCT (at 1.07 V), as better evidenced in Figure 5. Furthermore, these
values are also in agreement with the inflection point of the J-V curve for
SnHTL/NiFe_AN (dark green line in Figure 4a), thus clearly indicating that the hole
transfer step leading to water oxidation takes place predominantly from surface
trapped holes, most likely localized on electronic states of the catalyst.
6x104
4x104
0.5
2x104
0.0
0.9
RCT (Ω)
CCT (mF)
1.0
0
1.0
1.1
1.2
1.3
V (V) vs RHE
Figure 5. Correlation between CCT and RCT for SnHTL/NiFe_AN photoanodes as a function of
the applied bias. The data were extracted from EIS experiments recorded in purified 0.1 M
KOH under 1 sun illumination (0.1 W/cm2 AM1.5G).
From the EIS data, we could also determine the photoelectrochemical water
oxidation efficiency (ηWO), using the approach reported by Peter et al.,61 and
successively implemented by Mendes et al.62 This parameter accounts for the
interfacial performances of hematite under illumination, essentially depending on:
(i) the kinetics of water oxidation, ultimately ascribable to the reaction between
surface trapped holes and surface bound water, and characterized by the charge
transfer rate constant to the electrolyte, kCT (note that as far as the functionalized
photoanodes are concerned, kCT is associated to the charge transfer from the
catalyst states to the electrolyte); (ii) the e-/h+ recombination rate (kREC) at the
surface of the hematite electrode, which depends on the applied bias, and (as far as
the hole concentration is concerned) on the excitation intensity;61 (iii) the charge
20
recombination in the bulk of the film, which is neglected in this approach, being
almost independent on surface modifications.
Both kCT and kREC can be extracted from the fit of EIS data. By considering the
interfacial charge transfer arc, kCT can be obtained using:63
=(
·
)
where CCT is the equivalent capacitance calculated as in note 1.
At high applied bias, kREC can instead be obtained by the following simplified
equation, where RSC is the charge transport resistance through the space charge:64
∙
≅
,
while the photoelectrochemical water oxidation efficiency (ηWO) for the
photogenerated charges able to cope recombination and reach the interface is
actually a balance between the two rate constants, and can be expressed as follows:
!"# =
$ %&
% .
The dependence from the applied bias of the calculated ηWO is reported in Figure 6c.
The results reflect the J-V trend shown in Figure S12b for all the tested photoanodes,
further confirming the improved performances (up to 80% WO efficiency) of the
hematite thin layers modified with the porous mixed NiFe oxide, the only one able to
yield a functional junction when coupled with the semiconductor. Similar efficiencies
have been reported by Mendes et al. investigating mixed Ru/Ir oxide modified
hematite.62 From the analysis of the rate constants (Figures 6a-b), we can also
ascribe this improvement to a reduced recombination (kREC more than one order of
magnitude lower for SnHTL/NiFe_AN with respect to bare SnHTL), rather than to an
increased charge transfer rate (similar kCT values are found for both photoanodes
when V > 1.05 V). The kCT trend for SnHTL/NiFe_AN undergoing a net increase
between 0.9 and 1.1 V is apparently unique to such interface and is most likely due
to the scarce electrical conductivity of the mixed oxide under relatively low biases. It
is indeed well-known that the conductivity of iron-nickel oxides sharply increases
21
upon oxidation of the Ni(II) centers, which occurs at comparatively lower voltages
compared to Fe(III).23
kCT (s-1)
103
SnHTL
SnHTL/Ni_AN
SnHTL/NiFe_AN
SnHTL/Fe_AN
102
101
100
10-1
10-2
0.9 1.0 1.1 1.2 1.3 1.4
V (V) vs RHE
kREC (s-1)
103
SnHTL
SnHTL/Ni_AN
a
SnHTL/NiFe_AN
SnHTL/Fe_AN
102
101
100
0.9 1.0 1.1 1.2 1.3 1.4
V (V) vs RHE
SnHTL
SnHTL/Ni_AN
ηWO (%)
100
b
SnHTL/NiFe_AN
SnHTL/Fe_AN
75
50
25
0
0.9
1.0
1.1
1.2
1.3
V (V) vs RHE
1.4
c
Figure 6. a-c) Rate constants associated to charge transfer (kCT, in a) and recombination (kREC,
in b) and water oxidation efficiency (ηWO, in c) for SnHTL (orange squares), SnHTL/NiFe_AN
(green circles), SnHTL/Ni_AN (black triangles) and SnHTL/Fe_AN (wine reverted triangles).
Data extracted from EIS experiments recorded in purified 0.1 M KOH under 1 sun
22
illumination (0.1 W/cm2 AM1.5G).
It is also interesting to observe that the reduced recombination with the NiFe oxides
provides a clear advantage of the NiFe oxides over the other catalysts presented in
this work, despite the fact that, at least up to 1.1 V, the charge transfer rate constant
is lower than the other species. Thanks to the reduced recombination,
SnHTL/NiFe_AN exhibits, already at 1 V, an interfacial efficiency ηWO comparable to
that of SnHTL/Fe_AN, which has the best charge transfer properties within the
explored series. As the anodic bias increases, SnHTL/NiFe_AN gains the superiority,
reaching a maximum ηWO value at 1.15 V. The reduced recombination can be
probably ascribed to passivation of surface defects, which act as recombination
centers in hematite, or to a beneficial heterointerfacial effect, like the one observed
with Co-Pi,65,66 resulting in an increase of the band bending in the space charge
region, thus favoring charge separation. However, no evidence of catalytic effect in
terms of increased charge transfer rate to the electrolyte was reported in the case of
Co-Pi. The fact that SnHTL/Ni_AN displays the lowest recombination rate constant
corroborates the formation of heterointerfacial effects useful to retard
recombination when Ni oxides are deposited on hematite. Reasonably, in the case of
Fe_AN the heterointerface may not form since, basically, two materials with the
same type of chemistry are coupled together. As a result, SnHTL/Fe_AN is limited by
the highest recombination rate (Figure 6b), while in the case of SnHTL/Ni_AN the
main limitation turns out to be the slower rate of charge transfer to the electrolyte
(Figure 6a).
CONCLUSIONS
Efficient water oxidation catalysts based on earth-abundant, first-row transition
metal oxides (Ni, Fe and mixed NiFe amorphous oxides) have been successfully
deposited onto FTO by means of Pulsed Laser Deposition (PLD).
PLD has been proven to be a very versatile route to tune the nanometric
morphology of highly transparent catalytic films, which could be obtained by varying
23
the deposition temperature or the post-annealing parameters, allowing thus for a
systematic investigation of the properties of the resulting functional materials in
electrochemical and photoelectrochemical cells for water splitting.
Among
the
explored
cases,
the
most
notable
improvement
in
the
photoelectrochemical performances of Sn-doped hematite thin films (both in terms
of onset shift and total photocurrent) was achieved with the porous mixed oxide
(NiFe_AN) overlayer, which incorporates heterointerfacial effects instrumental in
retarding recombination and good interfacial charge transfer properties. The
combination of these two factors translates in a water oxidation efficiency of ca. 75%
at V < 1.2 V vs RHE. We found that the porous morphology of the catalytic layers
generally allows for the formation of adaptive junctions, in which the
photogenerated holes are efficiently stored within the electronic states of the
catalyst and the charge buildup in the catalyst is easily compensated via ion
migration from the electrolyte, yielding larger charge separation efficiencies at a
correspondingly lower bias. On the other hand, compact electrocatalytic layers
hamper the hole transfer to the electrolyte, and severely reduce the resulting
photocurrent regardless of their response in pure electrochemical conditions. These
results are paradigmatic of a common situation in this field, when, upon
functionalization of the photoelectrode with a given electrocatalyst, good
electrocatalytic
performances
do
not
necessarily
translate
into
good
photoelectrochemical ones.
Future experiments will be thus aimed at further investigating the optimal
composition of the porous catalysts, as well as their interfacial properties when
coupled with improved hematite photoanodes, and to other n-type semiconductors
suffering from fast recombination/slow water oxidation kinetics, in order to
optimize their energy conversion performance. To this end, fabrication methods
such as PLD, capable of offering a fine and reproducible control over catalyst
stoichiometry and morphology, will be playing a major role.
_______________________
[note 1] The equivalent capacitance (C) can be obtained from the CPE admittance
and n extracted from the fit according to:
24
= ( · ())*
where ω is the angular frequency corresponding to the largest imaginary
component of the charge transfer arc and n is the CPE exponent (0.8 ≤ n ≤ 1).
ASSOCIATED CONTENT
The Supporting Information is available free of charge.
Raman spectra of NiFe_DEP and NiFe_AN; XPS analysis and spectra for Ni_DEP,
Ni_AN, Fe_DEP and Fe_AN catalysts; EDXS analysis for NiFe_DEP and NiFe_AN; UVVis spectra of the OECs deposited on FTO; AFM and SEM images of SnHTL; UV-Vis
spectrum of SnHTL and Tauc plot; J-V curves of SnHTL and SnHTL/NiFe_AN upon
changing the direction illumination; APCE spectra of SnHTL and SnHTL/NiFe_AN; J-V
curves of SnHTL/Ni_AN, SnHTL/Ni_DEP and SnHTL/Fe_AN; Nyquist plots for SnHTL,
SnHTL/NiFe_AN, SnHTL/Ni_AN and SnHTL/Fe_AN; Applied bias dependence of the
resistance and capacitance values.
ACKNOWLEDGMENTS
The project leading to this application has received funding from the European
Union's Horizon 2020 research and innovation programme under the Marie
Skłodowska-Curie Grant Agreement No 705723. Project ERICSOL of the University of
Trento is also acknowledged for financial support.
25
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Graphical abstract
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