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Phys. Status Solidi A 207, No. 4, 824–830 (2010) / DOI 10.1002/pssa.200983310
a
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applications and materials science
pH-sensitive properties of barium
strontium titanate (BST) thin films prepared by
pulsed laser deposition technique
1,2
2,3
1
3
Vahe V. Buniatyan , Maryam H. Abouzar , Norayr W. Martirosyan , Jürgen Schubert ,
4
2,3
,2,3
Spartak Gevorgian , Michael J. Schöning , and Arshak Poghossian*
1
Department of Microelectronics and Biomedical Devices, State Engineering University of Armenia, 0009 Yerevan, Armenia
Institute of Nano- and Biotechnologies, Aachen University of Applied Sciences, 52428 Jülich, Germany
3
Institute of Bio- and Nanosystems, Research Centre Jülich GmbH, 52425 Jülich, Germany
4
Department of Microtechnology and Nanoscience, Chalmers University of Technology, 41296 Gothenburg, Sweden
2
Received 20 October 2009, revised 17 December 2009, accepted 19 December 2009
Published online 19 March 2010
Keywords barium strontium titanate, PLD, biosensor, field effect sensor
* Corresponding
author: e-mail a.poghossian@fz-juelich.de, Phone: þ49 2461 612605, Fax: þ49 241 6009 53235
pH-sensitive properties of barium strontium titanate (BST)
high-k thin films as alternative gate material for field-effect
capacitive (bio-)chemical sensors based on an electrolyteinsulator-semiconductor system have been investigated.
The BST films of different compositions (Ba0.31Sr0.69TiO3,
Ba0.25Sr0.75TiO3 and Mg-doped Ba0.8Sr0.2Mg0.1Ti0.9O3) were
deposited by pulsed laser deposition technique from targets
fabricated by self-propagating high-temperature synthesis. The
realised sensors have been electrochemically characterised by
means of impedance-spectroscopy, capacitance–voltage and
constant-capacitance method. The sensors possess a Nernstianlike pH sensitivity in the concentration range between pH 3 and
11 with a response time of 5–10 s. An equivalent circuit model
for the BST-based capacitive field-effect sensor is discussed.
ß 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
1 Introduction Because of the unique multifunctional material properties (ferroelectric, pyroelectric, piezoelectric, mirowave and electro-optic), the high permittivity,
low loss and electric tuneable features, perovskite-type
composite oxides of the ABO3 system have received
intensive research activities in many applications [1–5].
Perovskite oxides are used in high-density dynamic random
access memories (DRAM) [1], voltage-tuneable capacitors
(varactors) [1–4], ferroelectric field-effect transistors [6, 7],
optical memories and electro-optic modulators [1], solidoxide fuel cells [8], etc. In addition, the mixed conductive
properties and high catalytic activity of perovskite oxides
have been used to develop a large variety of gas and vapour
sensors. Examples of realised devices include sensors sensitive to carbon monoxide and hydrocarbon [9], hydrogen [10],
ethanol [11, 12] and acetone [12] vapour, humidity [13], etc.
The sensing principle of these sensors is mainly related to the
catalytic oxidation of the compounds to be detected in the
presence of the oxygen vacancies in perovskite oxides.
Due to the multifunctional material properties and large
variety in the oxide composition by choosing different A and
B elements, perovskite oxides are also very attractive for the
creation of chemical sensors and biosensors working in
liquids. For instance, pH-sensitive characteristics of perovskite oxides of different compositions (Li2xCa0.5xTaO3
(0.05 x 0.25), lead titanate, Mg2þ-doped lead titanate,
PrTiO3 and Li0.30La0.56TiO3) have been investigated in
[14–19]. The suitability of La0.5Sr0.5CoO3 thin films and
BaTiO3 nanotubes for the detection of hydrogen peroxide
was shown in Ref. [20, 21]. The possibility of application of
perovskite oxides for immuno-electrodes was demonstrated
in Ref. [22].
Perovskite oxides of the barium strontium titanate (BST)
composition belong to the most popular ferroelectric
materials. While their ferroelectric, pyroelectric, piezoelectric, microwave and electro-optic properties have been
well studied [1–4], to our knowledge, very little is known
so far about the behaviour of high-k BST thin films in
electrolyte solutions and their application for (bio-)chemical
sensors [22–24].
In the present work, pH-sensitive properties of BST thin
films of different compositions prepared by means of pulsed
ß 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Original
Paper
Phys. Status Solidi A 207, No. 4 (2010)
laser deposition (PLD) technique from targets fabricated by
the self-propagating high-temperature synthesis (SHS) have
been investigated using field-effect capacitive electrolyteBST-insulator-semiconductor (EBSTIS) structures. In contrast to the conventional high-temperature ceramic technology, the SHS method is simple, ecologically clean, wasteless, energy-saving, high productive and cost-effective. By
variation of the initial mixture components and the
combustion conditions, it is possible to produce multiphase
materials with a given chemical and phase composition as
well as to control their microstructure and properties. In
addition, the high velocity of the process provides a short
synthesis time. These important features of the SHS
technology often result in remarkably improved material
properties in comparison with the same composites prepared
by conventional ceramic techniques. The possibility of
application of SHS-prepared BST thin films as pH-sensitive
gate material for capacitive field-effect sensors has been
recently demonstrated for the first time by the authors in
Ref. [23].
2 Experimental
2 . 1 H i g h - t e m p er a t u re se l f - p r o p a g at i n g
synthesis of BST materials Perovskite oxides of different compositions (Ba0.31Sr0.69TiO3, Ba0.25Sr0.75TiO3 and
Mg-doped Ba0.8Sr0.2Mg0.1Ti0.9O3) have been synthesised
using the SHS technological equipment schematically
shown in Fig. 1 [23, 25]. In the SHS process, a highly
exothermic combustion of a powder mixture is locally
initiated from the sample surface by means of a heat flux.
After initiation, the reaction proceeds in the mode of selfpropagation, resulting in a formation of a high-temperature
front that propagates and converts the initial materials
into the final high-quality product with a minimal amount
of impurities due to the so-called self-purification process
[26, 27].
For the SHS experiments, the initial materials (Ti, TiO2,
SrCO3 and BaO2) have been milled to powder with grain
sizes of about 5–10 mm, dried and thoroughly mixed. The
grinding has been done by planetary milling method for 3 h
under wet conditions with acetone as a milling medium. The
mixture of reactant powders is then placed in a quartz-tube
reactor and ignited by the heated wire. The use of oxygen as
825
an oxidant and Ti as a fuel provides combustion temperatures
of 1 400–1 800 8C and wave-front propagation velocities of
1–4 mm/s. To prepare targets for the PLD process, the
synthesized SHS product has been milled to powders of
0.5–5 mm, pressed into pellets at a pressure of 4.5 ton/cm2,
and then heated at 1 350 8C for 4–5 h. The resulting target had
a cylindrical shape with a height of 15 mm and a diameter of
15 mm.
2.2 PLD deposition of BST thin films The amorphous BST thin films (100 nm thick) of Ba0.25Sr0.75TiO3,
Ba0.31Sr0.69TiO3 and Mg-doped Ba0.8Sr0.2Mg0.1Ti0.9O3
composition were prepared onto Si-SiO2 substrates (p-Si,
r ¼ 5–10 Vcm; 50 nm SiO2, chip size: 10 10 mm2) by PLD
technique using the targets fabricated by the SHS method.
The main advantages of the PLD technique are the
compatibility with silicon technology, the controlled deposition of multicomponent materials as perovskite oxides in a
defined stoichiometry as well as the short deposition time
due to the high growth rates [28, 29]. The BST films were
deposited at 400 8C in an oxygen ambient (2 103 mbar)
using a KrF excimer laser with a wavelength of 248 nm. The
laser pulse length, frequency and energy were 20 ns, 10 Hz
and 2.5 J/cm2, respectively. Before the PLD growth, a
300 nm thick Al film was deposited on the rear side of the
chip as contact layer.
The prepared BST layers have been physically characterised (thickness, surface morphology, composition) by
means of ellipsometry, scanning-electron microscopy
(SEM), Rutherford backscattering spectrometry (RBS) and
X-ray diffraction analysis (XRD) methods. As an example,
Fig. 2a shows the cross-sectional SEM picture of a Si-SiO2BST layer structure with a 47 nm SiO2 and a 92 nm BST film.
RBS measurements (Fig. 2b) could verify the stoichiometric
transfer from the original target material to the thin-film
state.
2.3 Measurement setup The realised p-Si-SiO2BST capacitive field-effect structures were characterised in
different pH buffer solutions by means of capacitance–
voltage (C–V), constant-capacitance (ConCap) and impedance-spectroscopy (in a frequency range from 1 Hz to
1 MHz) methods using an impedance analyser (Zahner
Figure 1 (online colour at: www.pss-a.com)
Schematic of the technological equipment used
for the SHS process. 1: quartz-tube reactor;
2: tungsten/rhenium (W/Re) thermocouple;
3: green mixture; 4: combustion front; 5:
igniter; 6: signal amplifier; 7: analogue-digital
convertor; 8: personal computer.
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V. V. Buniatyan et al.: pH-sensitive properties of barium strontium titanate (BST) thin films
O-ring and contacted on its front side by the electrolyte and a
reference electrode (conventional liquid-junction Ag/AgCl
electrode, Metrohm), and on its rear side by a gold-plated
pin. For operating the sensor, a dc polarisation voltage is
applied via the reference electrode to set the working point in
the depletion range of the capacitance–voltage curve, and a
small superimposed ac voltage with an amplitude of 20 mV
is applied to measure the capacitance of the sensor. All
potential values are referred to the Ag/AgCl reference
electrode. The contact area of the sensor with the solution
was about 0.5 cm2. The measurements have been performed
in a dark Faraday cage at room temperature. For the details of
the experimental setup, see e.g., Ref. [30].
3 Results and discussion Figure 4 depicts a set of
C–V curves for the p-Si-SiO2-Ba0.31Sr0.69TiO3 (a) and p-SiSiO2-Ba0.8Sr0.2Mg0.1Ti0.9O3 (b) structure, respectively, as a
function of the frequency (so-called capacitance–voltage
spectroscopy or frequency-dependent C–V curves) measured
Figure 2 (online colour at: www.pss-a.com) Cross-sectional SEM
picture of the Si-SiO2-BST layer structure (a) and results of RBS
measurements (b).
Elektrik). The measurement setup for the electrochemical
characterisation of the sensors and schematic of the layer
structure is presented in Fig. 3.
For the measurements, the Si-SiO2-BST chip was
mounted into a home-made measuring cell, sealed by an
Figure 3 (online colour at: www.pss-a.com) Measurement setup
for the electrochemical characterisation of BST-based capacitive
field-effect sensors (a), and schematic of the layer structure (b).
ß 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Figure 4 (online colour at: www.pss-a.com) Frequency-dependent C–V curves for the p-Si-SiO2-Ba0.31Sr0.69TiO3 (a) and p-Si-SiO2Ba0.8Sr0.2Mg0.1Ti0.9O3 (b) structure measured in buffer solution
of pH 7 at different frequencies from 30 Hz to 1 kHz. For comparison,
the C–V curve for a bare p-Si-SiO2 structure, measured at a frequency
of 100 Hz, is presented, too.
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Phys. Status Solidi A 207, No. 4 (2010)
in Titrisol buffer solution of pH 7 at different frequencies
from 30 Hz to 1 kHz. For comparison, the C–V curve of a
bare p-Si-SiO2 EIS (electrolyte-insulator-semiconductor)
structure, measured at a frequency of 100 Hz, is presented,
too (Fig. 4a).
As can be seen, similar to the metal-insulator-semiconductor or EIS capacitor, dependent on the magnitude and
polarity of the applied gate voltage, Vg, the C–V curves of the
BST-based sensors show three distinct regions: accumulation (Vg < 1.5 V), depletion (approximately between 1
and 0 V) and inversion (Vg > 0.5 V). However, in comparison with the bare p-Si-SiO2 structure, the C–V curves and
flat-band voltage of the p-Si-SiO2-BST structure are shifted
(DVfb 0.6 V) to more negative gate voltages. This is a first
indication of the presence of additional positive charges in
the EBSTIS structure, in particular, in the BST layer and/or at
the BST/SiO2 and electrolyte/BST interfaces. In the
accumulation range, the capacitance of the whole EBSTIS
structure is determined by the geometrical capacitance of the
gate insulator, i.e. the capacitances of the SiO2 and BST in
series. For a capacitive field-effect sensor application, the
more useful range represents, however, the depletion region
of the C–V curve.
Because the BST films usually exhibit a certain ionic or
mixed conductivity, they can be described as a parallel
network of the BST geometric resistance, RBST, and the
capacitance, CBST, which is in series with the capacitance of
the bare p-Si-SiO2 structure. Due to the high dielectric
constant (e.g., a dielectric constant value of 80 has been
reported for 150 nm thick amorphous Ba0.3Sr0.7TiO3 films at
room temperature [5]), and therefore, higher capacitance of
the BST films, the maximum capacitance in the accumulation region is not significantly influenced by the BST layer,
compared to the bare p-Si-SiO2 structure (36 nF for a
50 nm SiO2 layer, see Fig. 4a). On the other hand, with
increase in the frequency, the C–V curves slightly shift along
the capacitance axis towards smaller capacitance values that
is due to the presence of the RBST resistance. Similar
behaviour has also been observed for EIS structures covered
with an additional ion-sensitive membrane [31–35]. This
suggestion is supported by impedance spectroscopy
measurements.
As an example, Fig. 5a shows impedance spectra for a pSi-SiO2-Ba0.31Sr0.69TiO3 structure recorded in a pH 7 buffer
solution in the accumulation, depletion and inversion range
at polarisation voltages of 3.5, 1 and 2 V, respectively. A
linear behaviour has been observed at low frequencies,
which bends over to a plateau of a constant impedance at
frequencies>1 kHz. In addition, at frequencies of less than
1 kHz, the impedance is increased by passing from the
accumulation to the depletion region and even further raised
in case of the inversion region. Such behaviour of the
impedance curves can be explained due to the decrease in
total capacitance of the sensor structure. However, at very
low frequencies (<20–30 Hz), the impedance of the sensor in
the inversion range recovers to values that correspond to the
impedance in the accumulation range, which can be
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Figure 5 Impedance spectra for a p-Si-SiO2-Ba0.31Sr0.69TiO3
structure recorded in pH 7 buffer solution in the accumulation,
depletion and inversion range (a), and simplified equivalent circuit
of an EBSTIS structure (b). BST is described as parallel network of
the BST geometric resistance, RBST, and the capacitance, CBST.
attributed to the low frequency C–V behaviour of the sensor,
where the total capacitance of the sensor is again increased
passing from the depletion to the inversion range (see Fig. 4).
The complete ac equivalent circuit of an EBSTIS system
is complex and combines components, like the bulk
resistance and space-charge capacitance of the Si, capacitance of the SiO2, resistance and capacitance of the BST film,
double-layer capacitance at the electrolyte/BST interface,
resistance of the electrolyte solution, and impedance of the
reference electrode. However, for usual values of an
insulator thickness of 30–100 nm and in high ionic-strength
solutions (>104 M), the interferences from several components can be ignored, and the equivalent circuit of an
EBSTIS structure can be simplified as a series connection of
the space-charge capacitance of the semiconductor, insulator
capacitance and impedance of the BST film. Figure 5b shows
a simplified equivalent circuit of an EBSTIS structure, where
the BST layer is described as a parallel network of the BST
geometric resistance, RBST, and the capacitance, CBST. Then,
the experimentally measured capacitance of the EBSTIS
structure, Cmeas, can be expressed as:
Cmeas ¼ C
2
1 þ R2BST CBST
v2
;
2
1 þ R2BST CCBST þ CBST
v2
(1)
where C is the capacitance of the original EIS structure
without BST layer, v ¼ 2pf and f is the measuring frequency.
Thus, the measured capacitance is affected by the BST
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V. V. Buniatyan et al.: pH-sensitive properties of barium strontium titanate (BST) thin films
Figure 6 Typical set of C–V curves for BST-based field-effect
sensors with Ba0.31Sr0.69TiO3 (a) and Ba0.8Sr0.2Mg0.1Ti0.9O3 (b) film
as pH-sensitive material measured in buffer solutions with
different pH values from pH 3 to 11.
resistance. As it has been demonstrated in Ref. [31–35],
generally, any series resistance (e.g., bulk resistance of lowionic strength electrolyte, resistance of Si substrate, backside contact resistance as well as resistance of the reference
electrode) can affect the measured capacitance and deform
the C–V curves.
Figure 6 depicts a typical set of C–V curves for sensors
with a Ba0.31Sr0.69TiO3 and a Ba0.8Sr0.2Mg0.1Ti0.9O3 film
measured in buffer solutions with different pH values
from pH 3 to 11.
As expected, the C–V curves of the EBSTIS structure are
pH-dependent due to the contribution of the potential at the
BST/electrolyte interface. With decrease in pH, the C–V
curves are shifted along the voltage axis in the direction of a
more negative flat-band voltage due to the change of the
additional potential drop at the electrolyte/BST interface. A
similar behaviour has been observed for an EBSTIS sensor
with a Ba0.25Sr0.75TiO3 film as pH-sensitive gate material.
The EBSTIS sensors with both Ba0.25Sr0.75TiO3 and
Ba0.31Sr0.69TiO3 films show an average pH sensitivity of
46–50 mV/pH in the range of pH 3–11 (the pH sensitivity
of the sensors was evaluated from the linear region of the
ß 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
C–V curves at 60% of the maximum capacitance). For
some sensors, a pH sensitivity of 54–56 mV/pH has been
observed that is comparable with pH-sensitivity values
reported for Si3N4 (46–56 mV/pH), Al2O3 (49–57 mV/pH)
and Ta2O5 films (55–59 mV/pH), which have often been
utilised as pH-sensitive transducer material in ionsensitive field-effect transistors [35–40]. The pH sensitivity
of Ba0.8Sr0.2Mg0.1Ti0.9O3 films was 35–40 mV/pH in the
range from pH 3 to 11 that is comparable with the
average pH sensitivity reported for SiO2 (37 mV/pH in
the range of pH 3–9 [35]). The smaller pH sensitivity of
the Ba0.8Sr0.2Mg0.1Ti0.9O3 layer in comparison with
Ba0.25Sr0.75TiO3 and Ba0.31Sr0.69TiO3 films might be
explained due to the partial replacement of both the lattice
and surface Ti4þ ions by Mg2þ ions [41].
The mechanism of the pH sensitivity of BST films can be
explained by the protonation/deprotonation of the hydroxyl
groups at the BST surface according to the site-binding
model (see e.g., Ref. [35] and references there). The resulting
pH-dependent electrical surface charge of BST leads to a
modulation of the space-charge capacitance in the Si, thus
generating a pH-dependent sensor signal that in fact, was
observed during the C–V measurements.
Figure 7 exemplarily demonstrates the dynamic pH
response of an EBSTIS sensor with a Ba0.31Sr0.69TiO3 (a)
and a Ba0.8Sr0.2Mg0.1Ti0.9O3 (b) layer recorded in different
pH buffer solutions at a frequency of 100 Hz. In this
experiment, the capacitance of the EBSTIS sensor has been
kept at a fixed value within the depletion region of the C–V
curve (a working point was chosen at 60% of the maximum
capacitance) using a feedback-control circuit, and the pHdependent signal changes were directly recorded.
As can be seen, the sensor signal shows a clear
dependence on the pH value of the solution within the loop
cycle of pH 7 ! 13 ! 11 ! 13 ! 3 ! 13 (a) and pH
7 ! 3 ! 11 ! 3 ! 11 (b). The response time (t90%) was
about 5–10 s. In contrast to pH sensors based on sputtered
Ba0.7Sr0.3TiO3 films reported in Ref. [24], which were
almost insensitive at pH > 10, our structures are pH-sensitive
up to a pH value of 13 (see Fig. 7a). On the other hand, in
comparison with often used pH-sensitive materials such as
Si3N4 or Ta2O5, the hysteresis of the BST sensors was
relatively large. In addition, surprisingly, the pH sensitivity
values evaluated from the ConCap curves were smaller than
that from the C–V curves. The performed experiments do not
allow to explain the origin for this phenomenon. Since such
an effect has not been observed for most of the pH-sensitive
materials, like SiO2, Ta2O5, Al2O3, it can be attributed to
possible polarisation effects in the bulk BST, BST/
electrolyte or BST/SiO2 interfaces and/or relatively large
hysteresis within the loop cycle. In further works, this effect
will be studied in detail.
4 Conclusions The obtained results demonstrate the
potential of PLD-prepared BST films as alternative gate
material for capacitive field-effect pH sensors based on
an electrolyte-high-k dielectric-insulator-semiconductor
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Phys. Status Solidi A 207, No. 4 (2010)
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References
Figure 7 ConCap response of an EBSTIS sensor with Ba0.31Sr0.69TiO3 (a) and Ba0.8Sr0.2Mg0.1Ti0.9O3 (b) film recorded in buffer
solutions of different pH values.
system. The main advantages of the realised sensors are their
simple structure, and the ecologically clean and costeffective synthesis of the BST targets of desired composition
and doping elements by means of the SHS technology.
Future experiments will focus on a detailed investigation of
the effects of composition, crystalline structure (amorphous,
polycrystalline), post-treatment and oxygen vacancies in the
BST films on the device performances.
Although the obtained values of pH sensitivity of BSTbased sensors were comparable or smaller than in case of
Ta2O5 films [35–40], nevertheless, BST films are very
attractive in the (bio-)chemical sensor field as catalytically
active multifunctional materials, for instance, for the
development of so-called high-order multisensor systems
[36, 37, 39] that is based on the same material but
different transducer concepts (e.g., field-effect, amperometric electrodes, changes in work function and/or dielectric
constant).
Acknowledgements The authors gratefully thank H. P.
Bochem for technical support. V. B. gratefully thanks the German
Academic Exchange Service (DAAD) for financial support.
www.pss-a.com
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