2014 American Control Conference (ACC)
June 4-6, 2014. Portland, Oregon, USA
Cross-coupling Effect Compensation of an AFM
Piezoelectric Tube Scanner for Improved
Nanopositioning
M. S. Rana, Student Member, IEEE, H. R. Pota, Member, IEEE, and I. R. Petersen, Fellow, IEEE
Abstract—The imaging performance of an atomic force microscope (AFM) at high scanning speeds is limited due to the crosscoupling properties of its scanning unit; i.e., the piezoelectric
tube scanner (PTS). In order to increase the imaging speed of
an AFM, a multi-input multi-output (MIMO) model predictive
control (MPC) scheme is used for the PTS to reduce its crosscoupling effect. The design of this controller is based on an
identified MIMO model of the AFM PTS. Also, a damping
compensator is designed and included in the feedback loop
with the plant to suppress the vibration of the PTS at the
resonant frequency. Experimental results confirm the efficacy of
the proposed controller.
I. I NTRODUCTION
The atomic force microscope (AFM) invented by Binnig
et al. [1] is a unique invention capable of capturing highresolution images of samples in different environment. It
enables precise control, manipulation, and interrogation of
matter at nanoscale [2]. It has the ability to generate threedimensional images of material surfaces at an extremely high
resolution down to the atomic level (10−10 m). It is extensively
used in areas such as nanolithiography, DNA nanotechnology,
optics, microelectronics, material science, and nanofabrication [3]–[7]. It has high spatial resolution, but a low temporal
resolution, i.e., its imaging is slow, e.g., an image frame of
a living cell takes 1-2 minutes and this means that rapid
biological processes that occur in seconds cannot be studied
using the commercially available AFMs.
Fast and precise positioning is a basic requirement for
nanotechnology applications. Many AFMs use a piezoelectric
tube scanner (PTS) for actuation with nano-meter resolution
in all three spatial directions. Due to the dynamics of the
PTS, the imaging speed of the AFM is limited. The most
prominent limitations of the PTS are the low mechanical
resonance frequency [8], cross coupling between the axes [9],
and non-linear behavior in the form of hysteresis and creep
effects [10].
The lightly damped resonant modes in the PTS create significant distortions in the AFM’s scanned images. To suppress
the resonant mode of the PTS, a positive velocity and position
feedback (PVPF) controller is proposed by Bhikkaji et al.
in [11]. The fast axis, i.e., the X-axis of the PTS is driven
by a triangular signal and the slow axis, i.e., the Y -axis is
driven by a slowly increasing staircase signal or the ramp
signal [12]. This triangular signal contains odd harmonics of
the fundamental frequency excite the resonance of the PTS
due to which the images at high scanning rates are distorted.
To solve the triangular reference signal problem a spiral
scanning method with improved control is proposed in [7].
The effectiveness of the spiral trajectory scheme over that of
the conventional raster positioning pattern is examined in [13]
by applying it to a MEMS-based scanning-probe data-storage
setup for thermo-mechanical storage on a polymer medium.
Cycloid scanning is another scanning method which is introduced in [14]. In [15] an alternative non-raster scan method,
based on Lissajous pattern, which allows faster operations
compared to the ordinary scan patterns, is introduced.
One of the important problems in AFM imaging is the
cross-coupling effect between the axes of the PTS. The crosscoupling effect between the axes of the PTS introduces a significant amount of error in the high-speed precision positioning
of the PTS. Due to this effect, the signal applied to the any
of the axes of a PTS results in displacements in both axes
of the scanner and introduces artifacts on scanned images. To
compensate for the cross-coupling effect of a PTS in tappingmode AFM imaging, an inversion-based iterative control (IIC)
method is proposed in [16]. Although this technique works
well for cross-coupling compensation, it only produces good
quality scanned images up to 24.4 Hz scanning speed.
Improved mechanical design of the scanner can also limit
the cross-coupling effect. In [17], a novel flexure-based piezoelectric stack-actuated XY nanopositioning stage is presented
which significantly reduces the cross-coupling effect and combined with integral resonant control (IRC) and feedforward
control techniques, accurate high-speed scans up to 400 Hz
were achieved.
Nonlinearities in the form of hysteresis and creep effects
are also responsible for limiting the performance of the AFM,
with the former prominent during large scanning operations
and the latter when scanning is performed over an extended
period of time. In [18] a scheme is proposed to solve these
problems using a single-input single-output (SISO) model predictive control (MPC) and achieved a significant improvement
against hysteresis and creep effect but the cross-coupling effect
between the axes of its PTS limited the high-speed scanning
performance.
M. S. Rana, H. R. Pota, and I. R. Petersen are with the School of Engineering and Information Technology (SEIT), The University of New South
Wales, Canberra, ACT 2600, Australia (e-mail: m.rana@student.unsw.edu.au;
h.pota@adfa.edu.au; i.petersen@adfa.edu.au).
This work was supported by the Australian Research Council.
978-1-4799-3274-0/$31.00 ©2014 AACC
2456
DSA
20
ADC dSPACE DAC
1103
Magnitude (dB)
Magnitude (dB)
20
10
0
−10
−20 1
10
2
10
0
−20
−40
−60
−80 1
10
3
10
HVA
-Y
dx
Measured open−loop
Identified model
10
2
10
−20
−40 1
10
3
Frequency (Hz)
SAM
Measured open−loop
Identified model
10
2
10
3
Frequency (Hz)
+Y
(a) Gxx
Z
AFM PTS
(b) Gxy
Magnitude (dB)
20
Fig. 1. Block diagram of the experimental setup (ADC is analog to digital
converter and DAC is digital to analog converter).
0
−20
−40
−60 1
10
A. Contribution of This Work
20
Magnitude (dB)
-X
+X
3
0
10
2
10
3
10
0
−10
−20 1
10
The main contribution of this article is the utilization of
a multi-input multi-output (MIMO) MPC scheme with a
damping compensator to compensate for cross-coupling effects
of the PTS to achieve improved nanopositioning. Using the
MPC scheme proposed in this paper, it is possible to constrain
the control signal within allowable range of the PTS. Since
MPC is designed according to the linear PTS model, the
control signal computation is less complicated than that using
the nonlinear MPC. The augmented integral action of the MPC
controller reduces the nonlinear behavior of the PTS which,
in turn, solves the tracking error problem and a Kalman filter
is used to obtain full state information of the system.
The remainder of this paper is organized as follows: The
experimental setup used for the present work is described in
Section II. The identification and modeling of the PTS using
a system identification method is presented in Section III. The
design and selection of the controller are shown in Section IV,
while Section V presents the performance of the proposed
controller. Finally, the paper is concluded with brief remarks
in Section VI.
II. E XPERIMENTAL S ETUP
The experimental setup at the University of New South
Wales (UNSW), Canberra, Australia, consists of an NT-MDT
Ntegra scanning probe microscope (SPM), configured to operate as an AFM. It contains a signal access module (SAM),
control electronics, vibration isolator, computer for operating
the AFM NOVA software, and other accessories, that is, a
dynamic signal analyzer (DSA), a DSP dSPACE RT-1103,
and a high-voltage amplifier (HVA) with a constant gain of
15 for supplying power to the X, Y , and Z-piezos using the
SAM as an intermediate device. In this work, a Sm8133cl
type scanner is used which is a “scan by head” type of
scanner. The scanning range of this scanner in (X, Y , Z)
is 100 µm × 100 µm × 10 µm and resonance frequencies
in both the x and y directions of approximately 700-800 Hz
and in the z direction of about 5 kHz. A block diagram of the
experimental setup is shown in Fig. 1.
Phase (rad)
10
0
−10
−20 1
10
2
10
10
3
4
Phase (rad)
Capacitive
sensor
0
−5 1
10
10
20
Phase (rad)
Phase (rad)
5
2
10
Measured open−loop
Identified model
10
2
10
3
2
0
−2 1
10
Measured open−loop
Identified model
2
10
Frequency (Hz)
Frequency (Hz)
(c) Gyx
(d) Gyy
10
3
Fig. 2. Frequency responses of the measured and identified systems for (a)
input to the X-piezo and output from the X position sensor, (b) input to the
Y -piezo and output from the X position sensor, (c) input to the X-piezo and
output from the Y position sensor, and (d) input to the Y -piezo and output
from the Y position sensor.
III. I DENTIFICATION OF THE PTS DYNAMICS
A PTS is the most useful actuator in nanopositioning
applications, e.g., microscopes, and is made of ceramic lead
zirconate and titanate (PZT). It consists of a tube of radially
poled piezoelectric material, four external electrodes and a
grounded internal electrode. The dynamics of the PTS can
be modeled either using conventional mathematical theory or
using an experimental approach. In the present work, we have
used an experimental approach to model the AFM lateral
positioning system as a MIMO system. In this experiment,
the plant is identified using a bandlimited random noise signal
within the frequency range from 10 Hz to 1.0 kHz, using a
dual channel HP35665A DSA. This signal is supplied to the
HVA as an input and the corresponding amplified voltage is
supplied to the SAM of the AFM from which there is a direct
connection to the PTS. The output displacement of the PTS is
taken from the capacitive position sensor. The sensor output
is fed back to the DSA to obtain frequency response functions
(FRFs). The FRFs generated in the DSA are processed in
MATLAB and using prediction error method (PEM), a system
model is obtained. The best fit model frequency responses for
the X and Y -piezos are shown in Fig. 2. The two inputs are
the voltages applied to the x and y-axes amplifiers [vx , vy ]T
while the corresponding output from the capacitive sensors
[dx , dy ]T .
2457
R
Vin
Ci
+
Ai
R
Vout
-
-
Damping
Compensator
+
Ri
ux
Li
Fig. 3.
The FRFs of the AFM lateral positioning system can be
described by the following equation
[
]
Gxx (jω) Gxy (jω)
Gdv (jω) =
;
Gyx (jω) Gyy (jω)
[ d (jω) d (jω) ]
x
=
vx (jω)
dy (jω)
vx (jω)
=
AFM
Signal
Access
Module
vxref
v yref
∑
∑
AFM
PTS
Capacitive
Sensor
dx
Capacitive
Sensor
dy
;
(1)
Fig. 5. Block diagram of the closed-loop system. vxref and vyref are the
scanning reference waveforms provided by the AFM signal access module.
The outputs dx and dy are the displacements of the tube scanner.
−1.197×104 s3 −2.289×106 s2 +1.205×109 s−1.599×1013
s4 +3.859×105 s3 +6.626×107 s2 +1.806×1011 s+2.849×1013 ;(2)
B. Design of MIMO MPC
dx (s)
vy (s)
=
dy (s)
vx (s)
=
4.242s3 −2460s2 +2.682×106 s−8.622×108
s4 +95.6s3 +1.016×106 s2 +4.498×107 s+2.56×1011 ;
(3)
0.9309s3 −5498s2 +2.551×106 s−2.692×109
s4 +379.8s3 +9.67×105 s2 +1.772×108 s+2.327×1011 ;
(4)
The purpose of this section to present the design of an
MIMO MPC controller for minimizing the cross-coupling
effects in the AFM’s PTS. The construction of this closedloop system is shown in Fig. 5.
The plant is described by the following state-space model:
xm (k + 1)
and
dy (s)
vy (s)
MIMO
MPC
x
vy (jω)
dy (jω)
vy (jω)
where
dx (s)
vx (s)
Feedback loop of the damping compensator for the X-piezo.
Fig. 4.
A structure of damping compensator.
dx
Plant
(AFM PTS)
å
=
−40.86s3 +2.703×104 s2 −1.363×107 s−6.895×1010
s4 +1.763×103 s3 +7.812×105 s2 +8.214×108 s+1.316×1011 .(5)
IV. C ONTROLLER D ESIGN
A. Design of Damping Compensator
This section presents the design of a damping compensator,
the basic structure of which is shown in Fig. 3. Although the
MPC controller has itself some damping capacity, a damping
compensator is introduced to achieve better damping of the
resonant mode and higher bandwidth for an AFM’s PTS, and
its feedback loop for the X-piezo is shown in Fig. 4. The
general form of the damping compensator is [19]:
Ai =
N
∑
i=1
−ki
Ci s(Ri + Li s)
;
Li Ci s 2 + R i Ci s + 1
Am xm (k) + Bm u(k);
(7)
Cm xm (k) + Dm u(k);
(8)
Am , Bm , Cm , and Dm define the discrete state-space plant
model, derived from the identified plant model, as stated in
Eqs. (2)-(5) and Eq. (6) at a sampling time Ts , u = [vx , vy ]T
is the manipulated variable or input variable, y = [dx , dy ]T is
the measured output, and xm is the state variable vector with
a dimension of n. Due to the principle of receding horizon
control, where current information of the plant is required
for prediction and control, we have implicitly assumed that
the input u(k) cannot affect the output y(k) at the same
time and hence the feedthrough term, Dm = 0. In order
to incorporate integral action for disturbance rejection and
tracking a reference signal in the MPC algorithm, the plant
can be augmented in the following way [20]:
x(k+1)
z
[
(6)
where i = 1, 2, · · · , N , ki is the compensator gain of the
corresponding mode. By selecting the proper value of Li , Ri ,
and Ci , we are able to improve damping of the resonant mode
of the PTS.
Since ωi = √L1 C , the value of Li and Ci are chosen such
i i
that ωi is equal to or almost equal to the resonant frequency
of the system.
=
y(k) =
}|
]{
∆xm (k + 1)
y(k + 1)
x(k)
A
=
z
[
}|
0
I
Am
Cm Am
B
+
z[
]{ z[
}|
]{
∆xm (k)
y(k)
}|
]{
Bm
∆u(k);
Cm Bm
(9)
x(k)
C
y(k) =
z[
}|
z
]{
{] [
∆xm (k)
0 I
;
y(k)
}|
where A, B, and C are the augmented system matrices.
2458
(10)
−40 1
10
2
3
10
10
0
−5
Measured closed−loop
Measured open−loop
−10 1
10
−0.04
−0.04
10
2
0
−20
−0.06
10
2
Magnitude (dB)
0
−50
2
3
10
10
10
−40 1
10
2
0.08
10
+
2
3
10
Frequency (Hz)
10
−10 1
10
2
3
10
Frequency (Hz)
10
(d)
The output sequence for Np , prediction horizon can be
written as:
Y = F x(k) + Φ∆U ;
(11)
y(k + Np |k)
; ∆U =
∆u(k)
∆u(k + 1)
..
.
∆u(k + Nc − 1)
.
CANp −2 B
···
···
umin ≤ u(k + i − 1) ≤ umax , i = 1, . . . , Nc ;
(13a)
∆umin ≤ ∆u(k + i − 1) ≤ ∆umax , i = 1, . . . , Nc ;
(13b)
where Q is the state weighting matrix, R is the control
weighting, Rs is the reference signal, umin and umax are the
low and high levels of the control action, respectively, and
∆umin and ∆umax are the low and high levels of the control
increments, respectively.
By considering the above equations, the constrained MPC
problem can be expressed as a quadratic programming (QP)
problem:
1
(14)
min( ∆U T H∆U + ∆U T f );
2
s.t.
M ∆U ≤ γ;
where
where Nc is the control horizon, and the F matrix with
dimensions of (2Np , n) and the Φ matrix with dimensions
of (2Np , 2Nc ) are:
CA
CA2
3
F = CA ;
..
.
Np
CA
CB
0
··· ···
0
CAB
CB
··· ···
0
CA2 B
CAB
··· ···
0
Φ=
.
..
..
.
.
.
.
.
.
.
.
.
.
.
CANp −1 B
R(∆u(k + m − 1)) ;
subject to the linear inequality constraints on the system
inputs, i.e:
Measured open−loop
Measured closed−loop
Fig. 6.
Comparison of measured open-loop and closed-loop frequency
responses for: (a) X-piezo, (d) Y -piezo and cross-coupling for X and Y
sensor outputs (b) input to the Y -piezo, output from the X-piezo, (c) input
to the X-piezo, output from the Y -piezo.
y(k + 1|k)
y(k + 2|k)
..
.
(12)
2
m=1
0
−5
Q(y(k + m|k) − Rs (k + m))2
m=1
Nc
∑
3
10
(c)
Y =
0.04
0.06
Time (s)
(b)
Np
∑
J=
−20
Phase (rad)
Measured open−loop
Measured closed−loop
in which
0.02
cost function defined as:
0
5
0
−40 1
10
−0.08
0
Fig. 7. Cross-coupling properties of the scanner at 10.42 and 31.25 Hz,
respectively [closed-loop (red) and open-loop (blue)].
20
20
−20
0.2
(a)
3
10
Frequency (Hz)
0.1
0.15
Time (s)
(b)
50
−100 1
10
0.05
Measured open−loop
Measured closed−loop
−40 1
10
3
10
Frequency (Hz)
−0.08
0
(a)
Magnitude (dB)
3
−0.02
20
Phase (rad)
Phase (rad)
2
10
−0.06
5
Phase (rad)
−0.02
y
−50
−100 1
10
d (µm)
−20
0
0
0
y
0
0.02
0.02
50
d (µm)
Magnitude (dB)
Magnitude (dB)
20
CANp −Nc B
The control law is derived based on the minimization of the
H
=
ΦT QΦ + R;
f
=
ΦT QF x(k + 1|k) − ΦT QRs ;
M ∈ Rmc ×2Nc and γ ∈ R2Nc ×1 are computed using Eq. (13),
mc is the number of constraints and Rs ∈ R2Np ×1 is the
reference signal. In this paper for constraint calculation the
Hildreth’s QP algorithm has been considered. The constrained
minimization over ∆U is given by
∆U = −H −1 (f + M T λ)
(15)
where λ is the Lagrange multiplier, which is calculated by
using M , γ, H, and f . The Kalman state observer estimates
the states from the measured output and dynamics are:
x̂(k + 1)
ŷ(k)
=
=
(A − LC)x̂(k) + Bu(k) + Ly(k); (16)
Ĉ x̂(k);
(17)
where x̂(k) is the estimated state, ŷ(k) is the estimated
output, Ĉ is the identity matrix of dimension n × n, and L
2459
0
0.02
0.02
0
0
−0.01
d (µm)
d (µm)
−0.02
−0.02
x
x
−0.03
x
d (µm)
−0.02
−0.04
−0.06
0
−0.04
−0.04
−0.05
0.1
0.2
−0.06
0
0.3
Time (s)
−0.06
0.02
0.08
0.1
0
(b)
0.12
0.08
0.08
0.08
0.04
0.04
0.04
0
x
x
d (µm)
0.12
0
−0.04
−0.04
−0.08
−0.08
−0.08
0.1
0.2
−0.12
0
0.3
Time (s)
(d)
0.02
0.04
Time (s)
0.06
0
−0.04
−0.12
0
0.02
(c)
0.12
d (µm)
dx(µm)
(a)
0.04 0.06
Time (s)
0.04 0.06
Time (s)
0.08
−0.12
0
0.1
(e)
0.02
0.04
Time (s)
0.06
(f)
−0.066
−0.028
−0.0695
−0.067
−0.029
−0.07
−0.03
−0.0705
−0.031
−0.071
−0.032
−0.0715
0.2
0.4
−0.072
0
0.6
Time (s)
(a)
−0.071
0
0.3
y
−0.49
(c)
−0.4
−0.37
−0.38
Time (s)
(d)
0.6
−0.41
−0.42
−0.39
0.4
0.12
y
d (µm)
y
−0.48
0.04
0.08
Time (s)
−0.39
−0.36
0.2
−0.069
(b)
−0.47
d (µm)
0.1
0.2
Time (s)
−0.35
−0.46
−0.5
0
−0.068
−0.07
d (µm)
−0.033
0
dy (µm)
−0.069
dy (µm)
−0.027
y
d (µm)
Fig. 8. Sub-figures (a)-(c) are open-loop and sub-figures (d)-(f) are closed-loop in the comparison of tracking performance of triangular waves at 10.42,
31.25, and 62.50 Hz, respectively.
−0.4
0
0.1
0.2
Time (s)
(e)
0.3
−0.43
0
0.04
0.08
Time (s)
0.12
(f)
Fig. 9. Sub-figures (a)-(c) are open-loop and sub-figures (d)-(f) are closed-loop in the comparison of tracking performance of staircase waves at 10.42, 31.25,
and 62.50 Hz, respectively.
2460
is the observer gain which depends on the Gaussian white
noise, process noise covariance, and the measurement noise
covariance.
V. E XPERIMENTAL R ESULTS
For the purpose of performance evaluation, the proposed
controller is implemented on the AFM and a frequency domain
analysis carried out by comparing the measured open-loop
and closed-loop frequency responses and reductions in crosscoupling effect as shown in Fig. 6. Figure 6(a) and (d) show
comparisons of the closed-loop frequency plots of the X
and Y -piezos obtained by implementing the MIMO MPC
controller with the damping compensator, which indicate that
it achieves high closed-loop bandwidths and damping of the
resonant mode for X and Y -piezo, respectively, and in turn,
significantly reduces vibrations.
In addition, there is a reasonable amount of reduction in the
cross-coupling for the X and Y -piezos as shown in Fig. 6(b)
and (c). It is noteworthy that the resonant mode in the both
cases of the cross-coupling has been reduced significantly.
Thus, the controller reduces oscillation and vibration in the
system.
It should be noted that, using the current experimental setup,
it was not possible to measure the closed-loop frequency
responses of the AFM scanner with the well-tuned built-in
AFM PI controller.
Figure 7(a) and (b) show comparisons of the open-loop and
closed-loop cross-couplings for the 10.42 and 31.25 Hz input
reference signals, respectively. They illustrate that there is a
significant improvement in cross-coupling in the closed-loop.
To measure this cross-coupling, a reference triangular signal
is applied to the X-piezo, and the output is taken from the Y
position sensor.
The overall improvement in the nanopositioning of the
AFM PTS using the proposed controller is clearly be seen
from the resulting open-loop and closed-loop sensor output
displacement for the triangular reference input signal in the
X-piezo and staircase reference signal in the Y -piezo for
scanning speeds at 10.42, 31.25, and 62.50 Hz are given
in Fig. 8 and Fig. 9, respectively. Due to the uncontrolled
tube resonance in the open-loop condition, the output of the
sensor becomes distorted and this effect becomes extreme at
high scanning speeds. On the other hand, the improvement
in lateral positioning in the closed-loop condition the sensor
outputs remain better than the open-loop condition even at
high scanning speeds.
VI. C ONCLUSION
In this article, results from a study of the high-precision
positioning of an AFM PTS using an MIMO MPC controller
augmented with a damping compensator are reported. The
closed-loop frequency-domain performance is compared with
the open-loop frequency responses and is shown to achieve
significant damping of the resonant mode of the PTSs and to
reduce the cross-coupling effects between its axes. The experimental results show high-precision positioning performance
of the proposed controller at high scanning speed.
R EFERENCES
[1] G. K. Binnig, C. F. Quate, and C. Gerber, “Atomic force microscope
(AFM),” Physical Review Letters, vol. 56, no. 9, pp. 930–933, Mar.
1986.
[2] B. J. Kenton, A. J. Fleming, and K. K. Leang, “Compact ultra-fast
vertical nanopositioner for improving scanning probe microscope scan
speed,” Review of Scientific Instruments, vol. 82, no. 12, pp. 123 703–
123 703–8, Dec. 2011.
[3] M. S. Rana, H. R. Pota, and I. R. Petersen, “High-speed AFM image
scanning using observer-based MPC-Notch control,” IEEE Transactions
on Nanotechnology, vol. 12, no. 2, pp. 246–254, Mar. 2013.
[4] E. Meyer, H. J. Hug, and R. Bennewitz, Scanning Probe Microscopy.
Berlin, Germany: Springer-Verlag, 2004.
[5] M. S. Rana, H. R. Pota, I. R. Petersen, and Habibullah, “Improvement of
the tracking accuracy of an AFM using MPC,” in 8th IEEE Conference
on Industrial Electronics and Applications, 2013, pp. 1681–1686.
[6] Habibullah, H. R. Pota, I. R. Petersen, and M. S. Rana, “Creep,
hysteresis, and cross-coupling reduction in the high-precision positioning
of the piezoelectric scanner stage of an atomic force microscope,” IEEE
Transactions on Nanotechnology, vol. 12, no. 6, pp. 1125–1134, Nov.
2013.
[7] M. S. Rana, H. R. Pota, and I. R. Petersen, “Performance of
sinusoidal scanning with MPC in AFM imaging,” IEEE/ASME
Transactions on Mechatronics, 2014, [Preprint available online]
DOI:10.1109/TMECH.2013.2295112.
[8] S. O. R. Moheimani and B. J. G. Vautier, “Resonant control of
structural vibration using charge-driven piezoelectric actuators,” IEEE
Transactions on Control Systems Technology, vol. 13, no. 6, pp. 1021–
1035, Nov. 2005.
[9] S. Tien, Q. Zou, and S. Devasia, “Iterative control of dynamics-couplingcaused errors in piezoscanners during high-speed AFM operation,” IEEE
Transactions on Control Systems Technology, vol. 13, no. 6, pp. 921–
931, Nov. 2005.
[10] A. J. Fleming, S. S. Aphale, and S. O. R. Moheimani, “A new method
for robust damping and tracking control of scanning probe microscope
positioning stages,” IEEE Transactions on Nanotechnology, vol. 9, no. 4,
pp. 438–448, Jul. 2010.
[11] B. Bhikkaji, M. Ratnam, A. J. Fleming, and S. O. R. Moheimani, “Highperformance control of piezoelectric tube scanners,” IEEE Transactions
on Control Systems Technology, vol. 15, no. 5, pp. 853–866, Sep. 2007.
[12] Y. K. Yong, K. Liu, and S. O. R. Moheimani, “Reducing cross-coupling
in a compliant XY nanopositioner for fast and accurate raster scanning,”
IEEE Transactions on Control Systems Technology, vol. 18, no. 5, pp.
1172–1179, Sep. 2010.
[13] A. G. Kotsopoulos and T. A. Antonakopoulos, “Nanopositioning using
the spiral of archimedes: The probe-based storage case,” Mechatronics,
vol. 20, pp. 273–280, 2010.
[14] Y. K. Yong, S. O. R. Moheimani, and I. R. Petersen, “High-speed
cycloid-scan atomic force microscopy,” Nanotechnology, vol. 21, Aug.
2010.
[15] A. Bazaei, Y. K. Yong, and S. O. R. Moheimani, “High-speed lissajousscan atomic force microscopy: Scan pattern planning and control design
issues,” Review of Scientific Instruments, vol. 83, no. 6, pp. 063 701–
063 701–10, Jun. 2012.
[16] Y. Wu, J. Shi, C. Su, and Q. Zou, “A control approach to crosscoupling compensation of piezotube scanners in tapping-mode atomic
force microscope imaging,” Review of Scientific Instruments, vol. 80,
no. 4, pp. 043 709–10, Apr. 2009.
[17] Y. Yong, S. Aphale, and S. O. R. Moheimani, “Design, identification,
and control of a flexure-based XY stage for fast nanoscale positioning,”
IEEE Transactions on Nanotechnology, vol. 8, no. 1, pp. 46–54, 2009.
[18] M. S. Rana, H. R. Pota, and I. R. Petersen, “On the performance of an
MPC controller including a Notch filter for an AFM,” in 3rd Australian
Control Conference (AUCC), Nov. 2013, pp. 485–490.
[19] H. R. Pota, S. O. R. Moheimani, and M. Smith, “Resonant controller
for smart structures,” Smart Materials and Structures, vol. 11, pp. 1–8,
Feb. 2002.
[20] M. S. Rana, H. R. Pota, and I. R. Petersen, “Spiral scanning with improved control for faster imaging of AFM,” IEEE
Transactions on Nanotechnology, 2014, [Preprint available online]
DOI:10.1109/TNANO.2014.2309653.
2461