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Substrate optimization based on semi-analytical techniques

1999

Abstract Several methods are presented for highly efficient calculation of substrate noise transport in integrated circuits. A three-dimensional Green's function-based boundary element method, accelerated through use of the fast Fourier transform, allows the computation of sensitivities with respect to all substrate parameters at a considerably higher speed than any methods reported in the literature. Substrate sensitivities are used in a number of physical optimization tools, such as placement and trend analysis.

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