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1999
Abstract Several methods are presented for highly efficient calculation of substrate noise transport in integrated circuits. A three-dimensional Green's function-based boundary element method, accelerated through use of the fast Fourier transform, allows the computation of sensitivities with respect to all substrate parameters at a considerably higher speed than any methods reported in the literature. Substrate sensitivities are used in a number of physical optimization tools, such as placement and trend analysis.
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design - ICCAD '02, 2002
IEEE Journal of Solid-State Circuits, 2000
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2000
IEEE Circuits and Devices Magazine, 2001
1997
Abstract A number of methods are presented for highly efficient calculation of substrate current transport. A three-dimensional Green Function based substrate representation, in combination with the use of the Fast Fourier Transform, significantly speeds up the computation of sensitivities with respect to all parameters associated with a given architecture.
2007 IEEE International Symposium on Circuits and Systems, 2007
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