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Most cited papers in IC Testing Industry
En este artículo se realiza una breve revisión acerca de las estrategias de diagnóstico utilizadas en el diseño y fabricación de circuitos integrados analógicos en general, pero haciendo énfasis en los utilizados en comunicaciones. Se... more
En este artículo se realiza una breve revisión acerca de las estrategias de diagnóstico utilizadas en el diseño y fabricación de circuitos integrados analógicos en general, pero haciendo énfasis en los utilizados en comunicaciones. Se exponen los nuevos paradigmas que rigen el diseño electrónico moderno. A la luz de estos paradigmas, luego se revisan los aspectos más relevantes del diseño microelectrónico moderno, desde una perspectiva cualitativa, así como una exploración
breve acerca de los tipos de diagnóstico que podemos encontrar partiendo de las fallas que los originan. Se introducen luego algunas estrategias más usuales para el
diagnostico de circuitos integrados de comunicaciones, así como algunas aproximaciones neuronales. Se discute acerca de los aspectos que hacen tan particular el diseño y diagnostico de circuitos integrados de comunicaciones y la comparativa
entre las distintas técnicas. Finalmente se propone una estrategia neuronal que combina la técnica MADBIST con una red neuronal para realizar el diagnostico.
breve acerca de los tipos de diagnóstico que podemos encontrar partiendo de las fallas que los originan. Se introducen luego algunas estrategias más usuales para el
diagnostico de circuitos integrados de comunicaciones, así como algunas aproximaciones neuronales. Se discute acerca de los aspectos que hacen tan particular el diseño y diagnostico de circuitos integrados de comunicaciones y la comparativa
entre las distintas técnicas. Finalmente se propone una estrategia neuronal que combina la técnica MADBIST con una red neuronal para realizar el diagnostico.
Highly accelerated life test (HALT) is a test methodology to evaluate reliability of mechanical and electromechanical devices. HALT is often used on devices that must be guaranteed for high reliability over a long time span. HALT... more
Highly accelerated life test (HALT) is a test
methodology to evaluate reliability of mechanical and
electromechanical devices. HALT is often used on devices
that must be guaranteed for high reliability over a long
time span. HALT simulates the life cycle of the device,
usually until it experiments a failure. HALT tests are used
to assess reliability of devices at the end of the production
cycle, but are also used to improve the design and manufacturing
process, allowing to find and correct potential
problems when changes to the production process are less
costly. HALT tests are usually difficult and time consuming,
and there is a strong need for their automation. This
paper proposes a methodology to design software and
hardware for HALT automated tests. The goals pursued
are to standardize the test process, to reduce the need for
manual commands at the minimum and to simplify the
data gathering process. The methodology proposed starts
from domain requirement analysis and is conceived to
be as general as possible, with the goal to make it easily
extensible and adaptable to multiple testing domains.
Finally, the paper reports on a case study describing a
HALT test device designed according to the proposed
methodology and currently in use to test electromechanical
actuators.
methodology to evaluate reliability of mechanical and
electromechanical devices. HALT is often used on devices
that must be guaranteed for high reliability over a long
time span. HALT simulates the life cycle of the device,
usually until it experiments a failure. HALT tests are used
to assess reliability of devices at the end of the production
cycle, but are also used to improve the design and manufacturing
process, allowing to find and correct potential
problems when changes to the production process are less
costly. HALT tests are usually difficult and time consuming,
and there is a strong need for their automation. This
paper proposes a methodology to design software and
hardware for HALT automated tests. The goals pursued
are to standardize the test process, to reduce the need for
manual commands at the minimum and to simplify the
data gathering process. The methodology proposed starts
from domain requirement analysis and is conceived to
be as general as possible, with the goal to make it easily
extensible and adaptable to multiple testing domains.
Finally, the paper reports on a case study describing a
HALT test device designed according to the proposed
methodology and currently in use to test electromechanical
actuators.
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