Reliability 2008
Reliability 2008
Reliability 2008
RELIABILITY REPORT
2008
Power Semiconductor Devices
January 2006 - December 2007
IXYS Corporation
3540 Bassett Street
Santa Clara CA 95054
USA
Humidity Test
Power Cycle
Failure Modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling can
cause
thermal
and
electrical
performance
degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF, IDSS,
ICES, IDRM, IRRM, BVDSS, BVCES, VDRRM,
VRRM.
TERMS IN TABLES
SUMMARY TABLES 1 AND 2:
AF: acceleration factor
AF = exp { Ea *[ (T2 -T1) / ( T2 * T1 ) ] / k }
(1)
RELIABILITY TESTS
N = r + dr
(2)
TABLES 3:
DEFINITION OF FAILURE
Failure criteria are defined according to IEC 60747
standard series
Temperature Cycle
Failure modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling,
causing thermal and electrical performance degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF.
Table 1A
Table 1B
Table 1C
Table 1D
Table 1E
Table 1F
Table 1G
Table 1H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
ISOPLUS
discrete device *)
Module
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
592
35
169
4932
2
3
12483
747
13
116
0
0.92
45956
2752
15
160
1
2
17190
1029
17
170
0
0.92
1939
116
35
645
0
0.92
845
51
24
570
0
0.92
16855
1009
12
210
1
2
20
456
1
-
5066720
193
3220
73702
9
153
43520
2
41
53520
7
111
474548
59
983
1089301
135
2257
118658
7
113
465622
-
Table 2A
Table 2B
Table 2C
MOSFET/IGBT
MOSFET/IGBT
ISOPLUS
discrete device *)
Module
231
75
138
4030
0
0.92
4606
1486
15
210
0
0.92
15
460
0
-
3976960
493
1530
199740
25
77
506800
-
*) including ISOPLUS
Table 3A
Table 3B
Table 3C
Table3D
Table 3E
Table 3F
Table 3G
Table 3H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Isoplus
discrete device *)
Module
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
15
344
0
2960000
7
139
0
751300
5
50
0
850000
5
50
0
370000
10
190
0
410000
6
224
0
1520088
9
140
0
380000
2
100
0
280000
Table 4A
Table 4B
Table 4C
Table4D
Table 4E
Table 4F
Table 4G
Table 4H
Table 4J
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Isoplus
Breakover
discrete device *)
Module
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
13
353
0
135700
12
119
0
8400
27
290
2
19500
20
210
0
14900
25
450
0
29900
19
614
0
302000
17
300
0
14300
Table 5A
Table 5E
Table 5F
Table 5G
Table 5H
Table 5J
MOSFET/IGBT
FRED
Schottky
Thyr./Diode
Isoplus
Breakover
discrete device *)
*)
Diode*)
discrete device*)
4
80
0
24800
8
138
0
11088
9
294
1
64384
3
60
0
3840
*) including ISOPLUS
Diode
2
40
0
1920
4
80
0
3840
Diode
18
532
0
198200
4
80
0
4000
Temp.
[C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
20
20
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
60
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
3360
3360
3360
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
60000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
Temp.
[C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
150
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
1000
1000
1000
800
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
27
30
30
30
30
30
30
30
30
30
30
30
30
20
20
20
20
20
20
20
20
20
20
20
30
30
30
30
30
30
30
30
30
30
30
30
25
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
27000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
20000
20000
20000
3360
3360
20000
20000
20000
16000
3360
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
25000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
Temp.
[C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
20000
Remark
Voltage
[V]
240
1120
480
960
480
480
960
960
1540
1360
960
480
400
Temp.
[C]
150
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
1000
1000
168
168
168
1000
1000
1000
1000
1000
168
168
Sample
Size
6
10
10
10
10
10
10
10
5
5
10
10
10
Failures
Voltage
[V]
1120
1120
800
1120
1120
1120
1120
1120
1120
1120
1120
1120
1120
1120
1120
Temp.
[C]
125
125
126
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
168
168
168
168
168
168
1000
168
168
168
168
168
168
168
Sample
Size
10
10
20
10
10
10
10
10
10
10
10
10
10
10
10
Failures
Voltage
[V]
1120
1120
1120
1120
1120
1120
1120
1120
1120
960
960
1260
1120
1260
1260
1120
1120
Temp.
[C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
168
168
168
168
168
168
168
168
168
1000
168
1000
168
1000
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1008
10000
10000
1680
1680
1680
10000
10000
5000
5000
10000
1680
1680
Device Hours
[hrs]
10000
1680
3360
1680
1680
1680
1680
10000
1680
1680
1680
1680
1680
1680
1680
Device Hours
[hrs]
1680
1680
1680
1680
1680
1680
1680
1680
1680
1680
1680
10000
1680
10000
1680
10000
1680
Remark
Konverter tested
Inverter tested
Remark
I_R @ increased
Remark
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
DHF30IM600PN
DHF30IM600QB
DHG10I1200PM
DHG10I600PM
DHG20C600QB
DHG30I1200HA
DHG30I1200HA
DHG40C1200HB
DHG40C600PB
DHG60C600HB
DPG15I400PM
DPG20C200PN
DPG20C400PN
DPG30C300HB
DPG30C300PB
DPG60C200QB
DPG60C300HB
DPG60C300QB
DPG60C400QB
DPG60IM300PC
DSEC60-02Aq
DSEI2x31-06C
DSEI2x61-12B
DSEP15-06A
DSEP29-03
DSEP29-06A
DSEP2x61-12A
DSEP30-06BR
DSEP30-12AR
DSEP60-03A
DSEP60-06A
DSEP75-06AR
DSEP8-03AS
MEO450-12
MEO500-06DA
Date Code
or
Test #
1508
1625
1682
1685
1711
1652
1734
1903
2037
1668
1770
1692
1768
1644
1923
1608
1525
1481
1446
1643
1929
1563
1607
2020
1954
1736
1984
1952
1634
1537
1572
1619
1738
1826
1934
Voltage
[V]
480
480
960
480
480
960
960
960
480
480
320
240
320
240
240
160
240
240
320
240
160
480
960
480
240
480
960
480
960
240
480
480
240
960
480
Temp.
[C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
168
168
168
168
168
168
168
168
168
1000
1000
186
168
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
10
10
20
20
20
10
20
20
20
20
20
20
6
9
Failures
Date Code
or
Test #
1507
1907
1981
1906
1714
1781
1782
1674
1942
1622
1718
1783
1672
1673
2019
1871
1709
1467
2039
1723
1838
1982
1600
1857
Voltage
[V]
150
150
100
100
45
100
100
200
45
36
24
36
60
12
36
12
100
100
100
150
150
20
150
150
Temp.
[C]
125
125
125
125
125
125
125
125
100
100
100
100
125
100
100
100
125
125
125
150
150
100
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
1000
1000
168
168
1000
1000
168
168
168
Sample
Size
20
20
20
20
20
16
20
20
20
20
20
20
20
20
20
20
20
10
10
77
77
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
20000
3360
1680
1680
3360
3360
3360
1680
3360
3360
3360
3360
20000
20000
1116
1512
Remark
Device Hours
[hrs]
20000
20000
20000
20000
20000
16000
20000
20000
20000
20000
20000
20000
20000
20000
3360
20000
20000
1680
1680
77000
77000
3360
3360
3360
Remark
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
DSA120C150QB
DSA120C150QB
DSA30C100HB
DSA30C100PN
DSA30C45HB
DSA60C100PB
DSA70C100HB
DSA90C200HB
DSB10I45PM
DSB15IM45IB
DSB30C30PB
DSB30C45PB
DSB30C60PB
DSB40C15PB
DSS10-0045B
DSS20-0015B
DSS20-01AC
DSS2x41-01A
DSS2x41-01A
DSS6-015AS
DSS6-015AS
DSSK38-0025B
DSSK60-015A
DSSK60-015AR
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Temp.
[C]
125
125
125
125
125
125
125
150
150
125
150
150
Time
[hrs]
168
168
1000
168
168
1000
168
168
168
168
168
168
Sample
Size
20
20
20
10
20
20
10
20
10
20
20
20
Failures
0
0
1
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
3360
3360
20000
1680
3360
20000
1680
3360
1680
3360
3360
3360
Remark
I_DRM increased
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
CS45-16io1
DSEP30-06BR
DSEP30-12AR
DSEP75-06AR
DSS20-01AC
GWM160-0055P3
IXEL40N400
IXFL60N80P
IXFR12N100Q
IXFR14N100Q2
IXFR26N100P
IXGR120N60C2
IXGR48N60C3D1
IXKC13N80C
IXKC25N80C
IXKR25N80C
IXTC110N25T
IXTC200N075T
IXUC200N055
LKK47-06C5
Date Code
or
Test #
1808
1952
1634
1619
1709
1524
1611
SP0605
TP0703
SP0732
SP0742
SP0722
SP0722
1769
1590
1521
SP0721
SP0627
1594
1675
Voltage
[V]
1120
480
960
480
100
240
3000
640
800
800
800
480
480
640
640
640
200
60
44
480
Temp.
[C]
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
150
Time
[hrs]
168
168
168
1000
1000
168
168
1000
1000
1000
1000
1000
1000
1000
1000
168
1000
1000
1000
1000
Sample
Size
20
20
20
20
20
6
10
30
30
30
30
30
30
20
20
20
30
30
20
20
Failures
Date Code
or
Test #
1941
1800
1576
2096
Voltage
[V]
640
800
800
800
Temp.
[C]
125
125
125
125
Time
[hrs]
168
168
168
168
Sample
Size
20
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
Device Hours
[hrs]
3360
3360
3360
20000
20000
1008
1680
30000
30000
30000
30000
30000
30000
20000
20000
3360
30000
30000
20000
20000
Remark
I_DSS increased
Part Number
1
2
3
4
IXBOD1-08
IXBOD1-09
IXBOD1-10
IXBOD1-10
10
0
0
0
0
Device Hours
[hrs]
3360
3360
3360
3360
Remark
Temp.
[C]
125
150
150
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
11
Sample
Size
30
10
20
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
13
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
27
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
1680
3360
3360
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
13000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
27000
30000
30000
30000
Remark
Temp.
[C]
125
125
125
125
125
125
125
125
125
125
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
12
Sample
Size
30
30
30
30
20
30
30
30
30
30
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
20000
30000
30000
30000
30000
30000
3360
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
Temp.
[C]
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
500
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
Voltage
[V]
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
Temp.
[C]
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
1000
126
168
1000
168
168
168
1000
1000
168
168
168
168
168
Sample
Size
10
80
10
10
10
10
10
10
5
5
10
10
10
10
10
Failures
Voltage
[V]
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
Temp.
[C]
150
150
150
150
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
1000
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
10
80
20
20
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
15000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
Device Hours
[hrs]
1680
80000
1260
1680
10000
1680
1680
1680
5000
5000
1680
1680
1680
1680
1680
Remark
Device Hours
[hrs]
1680
80000
3360
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
Part Number
GWM100-01X1SL
GWM120-0075P3SL
IXER35N120D1
IXER35N120D1
IXFL100N50P
IXFL60N80P
IXFL82N60P
IXFR12N100Q
IXFR14N100Q2
IXFR26N100P
IXGR120N60C2
IXGR40N60C2D1
IXGR48N60C3D1
IXTC110N25T
IXTC200N075T
Date Code
or
Test #
1965
1720
1950
1950
SP0549
SP0605
SP0550
TP0703
SP0732
TJ1159E
SP0722
SP0635
SP0722
SP0721
SP0627
13
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
[K]
80
80
100
100
100
100
100
80
80
100
50
50
100
100
100
Number
of
Cycles
2000
2000
10000
10000
10000
10000
10000
2000
10000
10000
10000
10000
10000
10000
10000
Sample
Size
20
20
24
24
24
24
24
20
20
24
24
24
24
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
40000
40000
240000
240000
240000
240000
240000
40000
200000
240000
240000
240000
240000
240000
240000
Tj(max)
[C]
150
125
125
125
125
125
125
[K]
100
80
80
80
80
80
80
Number
of
Cycles
3000
10000
10000
10000
5000
10000
7130
Sample
Size
80
9
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
240000
90000
100000
100000
50000
100000
71300
Tj(max)
[C]
125
125
125
125
125
[K]
80
80
80
80
80
Number
of
Cycles
10000
20000
5000
30000
20000
Sample
Size
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
100000
200000
50000
300000
200000
[K]
80
80
80
80
80
Number
of
Cycles
5000
5000
20000
2000
5000
Sample
Size
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
50000
50000
200000
20000
50000
14
Remark
Remark
Remark
Remark
Tj(max)
[C]
125
125
145
145
150
145
125
150
125
145
[K]
80
80
100
105
105
100
80
105
80
100
Number
of
Cycles
2000
2000
2000
2000
2000
2000
2000
2000
5000
2000
Sample
Size
20
20
20
20
20
20
20
20
10
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
40000
40000
40000
40000
40000
40000
40000
40000
50000
40000
Date Code
or
Test #
2018
1856
1723
1838
1873
1575
Tj(max)
[C]
145
125
140
140
150
125
[K]
100
80
100
100
105
80
Number
of
Cycles
2000
4000
8572
8572
2000
2000
Sample
Size
20
10
77
77
20
20
Failures
Device Cycles
0
0
0
0
0
0
80000
40000
660044
660044
40000
40000
[K]
80
80
80
80
80
105
80
105
105
Number
of
Cycles
2000
2000
2000
5000
2000
2000
4000
2000
2000
Sample
Size
20
10
10
20
10
20
20
10
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
40000
20000
20000
100000
20000
40000
80000
20000
40000
[K]
80
100
Number
of
Cycles
2000
3000
Sample
Size
20
80
Failures
Device Cycles
0
0
40000
240000
Part Number
1
2
3
4
5
6
7
8
9
10
DH60-18A
DSEC30-02A
DSEI120-12A
DSEI60-02A
DSEI60-12A
DSEP12-12A
DSEP15-12CR
DSEP29-06A
DSEP2x61-06A
DSEP60-12A
Remark
Part Number
1
2
3
4
5
6
DSS16-0045A
DSS2x160-01A
DSS6-015AS
DSS6-015AS
DSSk60-0045A
DSSK80-006B
Remark
Remark
Part Number
1
2
DSEP15-12CR
GWM160-0055X1
Date Code
or
Test #
1930
1960
Tj(max)
[C]
125
150
15
Remark
High
Temp.
[C]
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
50
1000
500
20
100
100
50
50
100
100
1000
90
Sample
Size
20
20
83
30
10
20
20
20
20
20
20
20
50
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
1000
83000
15000
200
2000
2000
1000
1000
2000
2000
20000
4500
High
Temp.
[C]
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
100
50
50
100
50
50
50
100
50
100
100
Sample
Size
10
9
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
500
900
500
500
1000
500
500
500
1000
500
1000
1000
Low
Temp.
[C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
16
Remark
Remark
Low
Temp.
[C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
50
50
100
50
50
50
50
50
100
100
50
50
150
50
50
50
50
50
100
50
50
100
50
100
50
Sample
Size
10
10
10
10
20
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
20
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
1
0
0
0
500
500
500
500
2000
500
500
500
500
500
1000
1000
500
500
1500
500
500
500
500
500
2000
500
500
1000
500
1000
500
Low
Temp.
[C]
-40
-40
-55
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
125
Number
of
Cycles
150
50
300
50
50
50
50
20
50
50
50
50
150
10
100
10
50
100
50
50
Sample
Size
10
20
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1500
1000
3000
500
500
500
500
200
500
500
500
500
1500
100
1000
100
500
1000
500
500
17
Remark
V_F increased
V_F increased
Remark
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
DH60-18A
DHG10I600PM
DHH55-36N1F
DPG15I400PM
DPG60C300QB
DSEE29-06CC
DSEI120-12A
DSEI120-12A
DSEI2x121-02A
DSEI2x31-06C
DSEI60-06A
DSEP15-06A
DSEP15-12CR
DSEP25-16AR
DSEP2x25-12C
DSEP30-06BR
DSEP30-06CR
DSEP8-03AS
DSEP8-12A
DSEP8-12A
DSEP9-06CR
MEE250-12I
MEE300-06DA
MEK300-06
MEO450-12DA
Date Code
or
Test #
1568
1685
1604
1770
1909
1771
1538
1756
2042
1563
1804
2020
1514
1712
1468
1700
2015
1738
1438
1956
1437
1887
2064
1737
2000
Low
Temp.
[C]
-40
-55
-55
-55
-55
-55
-40
-40
-40
-40
-40
-55
-55
-40
-40
-55
-55
-40
-55
-55
-55
-40
-40
-40
-40
High
Temp.
[C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
100
100
100
100
100
50
50
20
20
50
50
50
50
50
50
50
100
50
50
50
50
100
50
100
Sample
Size
20
20
40
20
20
20
20
20
10
10
20
20
20
20
10
20
20
20
20
20
20
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
2000
4000
2000
2000
2000
1000
1000
200
200
1000
1000
1000
1000
500
1000
1000
2000
1000
1000
1000
500
1000
500
1000
Date Code
or
Test #
1907
1906
1674
1622
2018
1709
1856
1985
1596
1596
1492
1723
1807
1982
1557
1457
1591
1573
1575
Low
Temp.
[C]
-55
-55
-55
-55
-55
-55
-40
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
100
100
100
50
100
100
50
1000
1000
500
1000
50
50
50
50
200
50
50
Sample
Size
20
20
20
20
20
20
10
10
80
80
77
77
20
20
20
20
40
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
2000
2000
2000
1000
2000
1000
500
80000
80000
38500
77000
1000
1000
1000
1000
8000
1000
1000
Remark
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
DSA120C150QB
DSA30C100PN
DSA90C200HB
DSB15IM45IB
DSS16-0045A
DSS20-01AC
DSS2x160-01A
DSS2x61-01A
DSS31-0045A
DSS31-0045A
DSS31-0045A SN
DSS6-015AS
DSSK30-01A
DSSK38-0025B
DSSK40-0015B
DSSK60-0045B
DSSK60-015AR
DSSK60-015AR
DSSK80-006B
18
Remark
High
Temp.
[C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
20
50
100
20
50
100
20
50
20
20
20
20
50
50
50
Sample
Size
30
20
20
20
20
10
20
20
10
20
20
10
10
10
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1500
1000
400
1000
2000
200
1000
2000
200
1000
400
200
200
200
1000
1000
1000
Remark
Low
Temp.
[C]
-55
-55
-55
-55
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
100
100
50
50
50
50
50
100
50
100
100
1000
1000
1000
100
100
90
Sample
Size
30
40
20
20
20
20
20
20
20
20
22
20
80
80
10
20
20
50
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1500
4000
2000
1000
1000
1000
1000
1000
2000
1000
2200
2000
80000
80000
10000
2000
2000
4500
Low
Temp.
[C]
-40
-40
-40
-40
High
Temp.
[C]
150
150
150
150
Number
of
Cycles
50
50
50
50
Sample
Size
20
20
20
20
Failures
Device Cycles
0
0
0
0
1000
1000
1000
1000
Part Number
19
Remark
Remark
Rel. H.
[%]
100
100
85
100
Time
[hrs]
96
48
1000
96
Sample
Size
30
20
20
10
Failures
0
0
0
0
Device Hours
[hrs]
2880
960
20000
960
Remark
Device Hours
[hrs]
1920
768
1920
960
960
960
1920
1680
Remark
Device Hours
[hrs]
1920
20000
1920
1920
20000
1920
1920
7392
7392
Remark
Temp.
[C]
121
121
121
121
121
121
121
85
Rel. H.
[%]
100
100
100
100
100
100
100
85
Time
[hrs]
96
96
96
48
48
48
96
168
Sample
Size
20
8
20
20
20
20
20
10
Failures
Date Code
or
Test #
1907
1835
1835
1974
1836
1836
1622
1492
1723
Temp.
[C]
121
85
121
121
85
121
121
121
121
Rel. H.
[%]
100
85
100
100
85
100
100
100
100
Time
[hrs]
96
1000
96
96
1000
96
96
96
96
Sample
Size
20
20
20
20
20
20
20
77
77
Failures
Rel. H.
[%]
100
100
100
Time
[hrs]
48
48
96
Sample
Size
20
20
20
Failures
Part Number
1
2
3
4
5
6
7
8
DPG20C300PN
DPG60C400QB
DSEI2x61-12B
DSEI8-06AS
DSEP30-06BR
DSEP30-12CR
DSEP8-03AS
MEO450-12DA
0
0
0
0
0
0
0
0
Part Number
1
2
3
4
5
6
7
8
9
DSA120C150QB
DSA20C100PB
DSA20C100PB
DSA20C60PN
DSA90C200HB
DSA90C200HB
DSB15IM45IB
DSS31-0045A SN
DSS6-015AS
0
0
0
0
0
1
0
0
0
0
0
0
I_R increased
Device Hours
[hrs]
960
960
1920
Remark
Device Hours
[hrs]
960
960
Remark
Device Hours
[hrs]
960
960
960
960
Remark
Temp.
[C]
121
121
Rel. H.
[%]
100
100
Time
[hrs]
48
48
Sample
Size
20
20
Failures
Temp.
[C]
121
121
121
121
Rel. H.
[%]
100
100
100
100
Time
[hrs]
48
48
48
48
Sample
Size
20
20
20
20
Failures
Part Number
1
2
DSEP30-06BR
DSEP30-12CR
20
0
0
0
0
0
0