Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                

5 X-Ray Lithography - 1

Download as pptx, pdf, or txt
Download as pptx, pdf, or txt
You are on page 1of 5

Setup of proximity x-ray lithography

Mask is made of absorber (Au) on membrane (Si3N4)

X-ray lithography advantages

Wavelength: 10s nm (soft x-rays) down to 1 (subatomic).

Little diffraction effects when using such small .


No backscatter or reflections: very fine features with vertical sidewalls. Very large depth of focus: wafer with non-flat surface is OK. Simpler (in principle) than optical or e-beam lithography: no complex optics (dont really have x-ray optics now). All that needed is an x-ray source and an x-ray mask.

X-ray lithography limits


1X mask technology because refractive index for all materials is (almost) absolutely 1.0 (no lens for demagnification). (4 for DUV lithography, mask easier to make) X-ray mask difficult to fabricate with many issues: fragile, defects, aspect ratio, bending due to heating. Strong, stable, collimated, single frequency x-ray sources are hard to find. X-rays produced in synchrotrons fit this criteria, but with high cost and huge size. Resolution is still limited by Fresnel diffraction and scattering of secondary electrons in the resist. Typical resist is insensitive, need long time to expose.

w
h Aspect ratio=pattern height/width=h/w.
3

Comparison to other lithographies


Photolithography, diffraction limits resolution E-beam lithography (scattering, proximity effect)

X-ray lithography, little diffraction, high depth of focus

Ion beam lithography, low penetration depth (very thin resist)

The physics of microfabrication, I. Brodie and J. J. Murray, Plenum Press, 1982

X-ray lithography: resolution limit due to diffraction

Precise gap must be maintained: too close will damage membrane mask, too far reduce resolution. Although is very small, diffraction still present. Resolution limit due to diffraction R=3/2[(g+t/2)]1/2, g: gap; t: resist thickness. (This is the same resolution equation as for photolithography) E.g. 100nm feature size requires =1nm, g=4.4m (assume t<<g).

5 Cerrina, J Phys D, 2000

You might also like