IS61LV25616AL: 256K X 16 High Speed Asynchronous Cmos Static Ram With 3.3V Supply
IS61LV25616AL: 256K X 16 High Speed Asynchronous Cmos Static Ram With 3.3V Supply
IS61LV25616AL: 256K X 16 High Speed Asynchronous Cmos Static Ram With 3.3V Supply
256K x 16 HIGH SPEED ASYNCHRONOUS CMOS STATIC RAM WITH 3.3V SUPPLY
FEATURES
High-speed access time: 10, 12 ns CMOS low power operation Low stand-by power: Less than 5 mA (typ.) CMOS stand-by TTL compatible interface levels Single 3.3V power supply Fully static operation: no clock or refresh required Three state outputs Data control for upper and lower bytes Industrial temperature available Lead-free available
ISSI
FEBRUARY 2006
A0-A17
DECODER
VDD GND I/O0-I/O7 Lower Byte I/O8-I/O15 Upper Byte I/O DATA CIRCUIT
COLUMN I/O
CE OE WE UB LB CONTROL CIRCUIT
Copyright 2006 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
IS61LV25616AL
ISSI
WE X H X H H H L L L CE H L L L L L L L L OE X H X L L L X X X LB X X H L H L L H L UB X X H H L L H L L I/O PIN I/O0-I/O7 I/O8-I/O15 High-Z High-Z High-Z DOUT High-Z DOUT DIN High-Z DIN High-Z High-Z High-Z High-Z DOUT DOUT High-Z DIN DIN VDD Current ISB1, ISB2 ICC I CC
TRUTH TABLE
Mode Not Selected Output Disabled Read
Write
I CC
PIN DESCRIPTIONS
A0-A17 I/O0-I/O15 CE Address Inputs Data Inputs/Outputs Chip Enable Input Output Enable Input Write Enable Input Lower-byte Control (I/O0-I/O7) Upper-byte Control (I/O8-I/O15) No Connection Power Ground
A0 A1 A2 A3 A4 CE I/O0 I/O1 I/O2 I/O3 VDD GND I/O4 I/O5 I/O6 I/O7 WE A5 A6 A7 A8 A9
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
A17 A16 A15 OE UB LB I/O15 I/O14 I/O13 I/O12 GND VDD I/O11 I/O10 I/O9 I/O8 NC A14 A13 A12 A11 A10
OE WE LB UB NC VDD GND
IS61LV25616AL
ISSI
48-Pin mini BGA
1 2 3 4 5 6
1 2
CE I/O0 I/O1 I/O2 I/O3 VDD GND I/O4 I/O5 I/O6 I/O7
44 43 42 41 40 39 38 37 36 35 34 33 1 32 2 31 3 30 4 29 5 TOP VIEW 28 6 27 7 26 8 25 9 24 10 23 11 12 13 14 15 16 17 18 19 20 21 22
WE A0 A1 A2 A3 A4 A5 A6 A7 A8 A9
I/O15 I/O14 I/O13 I/O12 GND VDD I/O11 I/O10 I/O9 I/O8 NC
A B C D E F G H
3 4 5 6 7
PIN DESCRIPTIONS
A0-A17 I/O0-I/O15 CE OE WE LB UB NC VDD GND Address Inputs Data Inputs/Outputs Chip Enable Input Output Enable Input Write Enable Input Lower-byte Control (I/O0-I/O7) Upper-byte Control (I/O8-I/O15) No Connection Power Ground
8 9 10 11 12
IS61LV25616AL
ISSI
Value 0.5 to VDD+0.5 65 to +150 1.0 Unit V C W
Note: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
OPERATING RANGE
VDD Range Commercial Industrial Ambient Temperature 0C to +70C 40C to +85C 10ns 3.3V +10%, -5% 3.3V +10%, -5% 12ns 3.3V + 10% 3.3V + 10%
Notes: 1. VIL (min.) = 2.0V for pulse width less than 10 ns.
IS61LV25616AL
ISSI
Test Conditions VDD = Max., Com. IOUT = 0 mA, f = fMAX Ind. VDD = Max., VIN = VIH or VIL CE VIH, f = fMAX. VDD = Max., VIN = VIH or VIL CE VIH, f = 0 Com. Ind. Com. Ind. -10 Min. Max. 100 110 50 55 20 25 15 20 -12 Min. Max. 90 100 45 50 20 25 15 20 Unit mA mA
1 2 3 4 5 6
Symbol Parameter ICC ISB VDD Dynamic Operating Supply Current TTL Standby Current (TTL Inputs) TTL Standby Current (TTL Inputs) CMOS Standby Current (CMOS Inputs)
ISB1
mA
ISB2
VDD = Max., Com. CE VDD 0.2V, Ind. VIN VDD 0.2V, or VIN 0.2V, f = 0
mA
Note: 1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change. Shaded area product in development
CAPACITANCE
Symbol CIN COUT
(1)
Max. 6 8
Unit pF pF
7 8 9 10 11 12
Note: 1. Tested initially and after any design or process changes that may affect these parameters.
IS61LV25616AL
ISSI
-10 Min. Max. 10 2 0 0 3 0 0 0 10 10 4 4 4 4 3 10 -12 Min. Max. 12 2 0 0 3 0 0 0 12 12 5 5 6 5 4 12 Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns
tRC tAA tOHA tACE tDOE tHZOE(2) tLZOE(2) tHZCE(2 tLZCE(2) tBA tHZB(2) tLZB(2) tPU tPD
Notes: 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0V to 3.0V and output loading specified in Figure 1. 2. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage.
AC TEST LOADS
319 3.3V
319 3.3V
Figure 1
Figure 2
AC TEST CONDITIONS
Parameter Input Pulse Level Input Rise and Fall Times Input and Output Timing and Reference Level Output Load 6 Unit 0V to 3.0V 3 ns 1.5V See Figures 1 and 2
IS61LV25616AL
ISSI
AC WAVEFORMS READ CYCLE NO. 1(1,2) (Address Controlled) (CE = OE = VIL, UB or LB = VIL)
1 2
t OHA
DATA VALID
READ1.eps
t RC
ADDRESS
t AA t OHA
DOUT
PREVIOUS DATA VALID
3 4
5 6
tAA tOHA tDOE tHZOE
OE
7 8
CE
LB, UB
DOUT
HIGH-Z
tLZB
tBA
tRC
DATA VALID
tHZB
tPU
50%
tPD
ICC
50%
9 10 11 12
ISB
UB_CEDR2.eps
Notes: 1. WE is HIGH for a Read Cycle. 2. The device is continuously selected. OE, CE, UB, or LB = VIL. 3. Address is valid prior to or coincident with CE LOW transition.
IS61LV25616AL
ISSI
tRC
ADDRESS
tAA
OE
tOHA
tDOE
CE
tHZOE
LB, UB
DOUT
HIGH-Z
tLZB
tBA
tRC
DATA VALID
tHZB
VDD
Supply Current
tPU
50%
tPD
ICC
50%
ISB
UB_CEDR2.eps
Notes: 1. WE is HIGH for a Read Cycle. 2. The device is continuously selected. OE, CE, UB, or LB = VIL. 3. Address is valid prior to or coincident with CE LOW transition.
tWC tSCE tAW tHA tSA tPWB tPWE1 tPWE2 tSD tHD tHZWE(2) tLZWE(2)
Notes: 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0V to 3.0V and output loading specified in Figure 1. 2. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100% tested. 3. The internal write time is defined by the overlap of CE LOW and UB or LB and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the write.
IS61LV25616AL
ISSI
1
t HA
t SA
CE
t SCE
2 3
WE
UB, LB
t HZWE
DOUT
DATA UNDEFINED
HIGH-Z
t LZWE
4 5
UB_CEWR1.eps
t SD
DIN
t HD
DATAIN VALID
Notes: 1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CE and WE inputs and at least one of the LB and UB inputs being in the LOW state. 2. WRITE = (CE) [ (LB) = (UB) ] (WE).
6 7
WRITE CYCLE NO. 2 (WE Controlled. OE is HIGH During Write Cycle) (1,2)
t WC
ADDRESS
VALID ADDRESS
8
t HA
OE
9 10
CE
LOW
t AW t PWE1
WE
t SA
UB, LB
t PBW
t HZWE
DOUT
DATA UNDEFINED
HIGH-Z
t LZWE
11
UB_CEWR2.eps
t SD
DIN
t HD
DATAIN VALID
12
IS61LV25616AL
ISSI
AC WAVEFORMS WRITE CYCLE NO. 3 (WE Controlled. OE is LOW During Write Cycle) (1)
t WC
ADDRESS
VALID ADDRESS
OE CE
LOW
t HA
LOW
t AW t PWE2
WE
t SA
UB, LB
t PBW
t HZWE
DOUT
DATA UNDEFINED
HIGH-Z
t LZWE
t SD
DIN
t HD
DATAIN VALID
UB_CEWR3.eps
t WC
ADDRESS 2
OE
t SA
CE
LOW
WE
t HA t SA t PBW t PBW
WORD 2
t HA
UB, LB
WORD 1
t HZWE
DOUT
HIGH-Z
t LZWE t HD
DATAIN VALID
DATA UNDEFINED
t SD
DIN
t SD
DATAIN VALID
t HD
UB_CEWR4.eps
Notes: 1. The internal Write time is defined by the overlap of CE = LOW, UB and/or LB = LOW, and WE = LOW. All signals must be in valid states to initiate a Write, but any can be deasserted to terminate the Write. The t SA, t HA, t SD, and t HD timing is referenced to the rising or falling edge of the signal that terminates the Write. 2. Tested with OE HIGH for a minimum of 4 ns before WE = LOW to place the I/O in a HIGH-Z state. 3. WE may be held LOW across many address cycles and the LB, UB pins can be used to control the Write function.
10
IS61LV25616AL
ISSI
Test Condition See Data Retention Waveform VDD = 2.0V, CE VDD 0.2V See Data Retention Waveform See Data Retention Waveform
O
1 2 3 4
VDR
IDR
tSDR tRDR
tRC
Note 1: Typical values are measured at VDD = 3.0V, TA = 25 C and not 100% tested.
tRDR
5 6
1.4V
CE GND
7 8 9 10 11 12
11
IS61LV25616AL
ISSI
Package TSOP (Type II) TSOP (Type II), Lead-free 400-mil SOJ TSOP (Type II)
12
12
12
PACKAGING INFORMATION
LQFP (Low Profile Quad Flat Pack) Package Code: LQ (44-pin)
D D1
ISSI
E1
b e SEATING PLANE
L1 L
A2 A A1
Low Profile Quad Flat Pack (LQ) Ref. Std. MS-026 No. Leads 44 Millimeters Inches Symbol Min Max Min Max A 1.60 0.063 A1 0.05 0.15 0.002 0.006 A2 1.35 1.45 0.053 0.057 b 0.30 0.45 0.012 0.018 C 0.09 0.20 0.004 0.008 D 12.00 BSC 0.472 BSC D1 10.00 BSC 0.394 BSC E 12.00 BSC 0.472 BSC E1 10.00 BSC 0.394 BSC e 0.80 BSC 0.031 BSC L 0.45 0.75 0.018 0.030 L1 1.00 REF. 0.039 REF. 0o 7o 0o 7o
Notes: 1. All dimensioning and tolerancing conforms to ANSI Y14.5M-1982. 2. Dimensions D1 and E1 do not include mold protrusions. Allowable protrusion is 0.25 mm per side. D1 and E1 include mold mismatch. 3. Controlling dimension: millimeters.
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
PACKAGING INFORMATION
400-mil Plastic SOJ Package Code: K
ISSI
Notes: 1. Controlling dimension: millimeters. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. 4. Reference document: JEDEC MS-027.
N/2+1
E1
N/2
D A
SEATING PLANE
C A2
A1
E2
Millimeters Inches Min Max Min Max (N) 28 3.25 3.75 0.128 0.148 0.64 0.025 2.08 0.082 0.38 0.51 0.015 0.020 0.66 0.81 0.026 0.032 0.18 0.33 0.007 0.013 18.29 18.54 0.720 0.730 11.05 11.30 0.435 0.445 10.03 10.29 0.395 0.405 9.40 BSC 0.370 BSC 1.27 BSC 0.050 BSC
Millimeters Min Max 32 3.25 3.75 0.64 2.08 0.38 0.51 0.66 0.81 0.18 0.33 20.82 21.08 11.05 11.30 10.03 10.29 9.40 BSC 1.27 BSC
Inches Min Max 0.128 0.148 0.025 0.082 0.015 0.020 0.026 0.032 0.007 0.013 0.820 0.830 0.435 0.445 0.395 0.405 0.370 BSC 0.050 BSC
Millimeters Min Max 36 3.25 3.75 0.64 2.08 0.38 0.51 0.66 0.81 0.18 0.33 23.37 23.62 11.05 11.30 10.03 10.29 9.40 BSC 1.27 BSC
Inches Min Max 0.128 0.148 0.025 0.082 0.015 0.020 0.026 0.032 0.007 0.013 0.920 0.930 0.435 0.445 0.395 0.405 0.370 BSC 0.050 BSC
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
PACKAGING INFORMATION
ISSI
Millimeters Min Max 42 3.25 3.75 0.64 2.08 0.38 0.51 0.66 0.81 0.18 0.33 27.18 27.43 11.05 11.30 10.03 10.29 9.40 BSC 1.27 BSC Inches Min Max 0.128 0.148 0.025 0.082 0.015 0.020 0.026 0.032 0.007 0.013 1.070 1.080 0.435 0.445 0.395 0.405 0.370 BSC 0.050 BSC Millimeters Min Max 44 3.25 3.75 0.64 2.08 0.38 0.51 0.66 0.81 0.18 0.33 28.45 28.70 11.05 11.30 10.03 10.29 9.40 BSC 1.27 BSC 0.128 0.148 0.025 0.082 0.015 0.020 0.026 0.032 0.007 0.013 1.120 1.130 0.435 0.445 0.395 0.405 0.370 BSC 0.050 BSC Inches Min Max
Millimeters Inches Symbol Min Max Min Max No. Leads (N) 40 A 3.25 3.75 0.128 0.148 A1 0.64 0.025 A2 2.08 0.082 B 0.38 0.51 0.015 0.020 b 0.66 0.81 0.026 0.032 C 0.18 0.33 0.007 0.013 D 25.91 26.16 1.020 1.030 E 11.05 11.30 0.435 0.445 E1 10.03 10.29 0.395 0.405 E2 9.40 BSC 0.370 BSC e 1.27 BSC 0.050 BSC
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
PACKAGING INFORMATION
Mini Ball Grid Array Package Code: B (48-pin)
Top View 1 2 3 4 5 6 6
ISSI
Bottom View
b (48x)
A B C D D E F G H D1
A B C D E F G H
e E E1
A2 SEATING PLANE A1
A A1 A2 D D1 E E1 e b
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
PACKAGING INFORMATION
Plastic TSOP Package Code: T (Type II)
ISSI
Notes: 1. Controlling dimension: millimieters, unless otherwise specified. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. 4. Formed leads shall be planar with respect to one another within 0.004 inches at the seating plane.
N/2+1
E1
1 D
N/2
SEATING PLANE
ZD
.
e b L A1 C
Plastic TSOP (T - Type II) Millimeters Inches Min Max Min Max 44 1.20 0.047 0.05 0.15 0.002 0.006 0.30 0.45 0.012 0.018 0.12 0.21 0.005 0.008 18.31 18.52 0.721 0.729 10.03 10.29 0.395 0.405 11.56 11.96 0.455 0.471 0.80 BSC 0.032 BSC 0.41 0.60 0.016 0.024 0.81 REF 0.032 REF 0 5 0 5
Millimeters Min Max 50 1.20 0.05 0.15 0.30 0.45 0.12 0.21 20.82 21.08 10.03 10.29 11.56 11.96 0.80 BSC 0.40 0.60 0.88 REF 0 5
(N) 32 1.20 0.047 0.05 0.15 0.002 0.006 0.30 0.52 0.012 0.020 0.12 0.21 0.005 0.008 20.82 21.08 0.820 0.830 10.03 10.29 0.391 0.400 11.56 11.96 0.451 0.466 1.27 BSC 0.050 BSC 0.40 0.60 0.016 0.024 0.95 REF 0.037 REF 0 5 0 5
0.047 0.002 0.006 0.012 0.018 0.005 0.008 0.820 0.830 0.395 0.405 0.455 0.471 0.031 BSC 0.016 0.024 0.035 REF 0 5
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.