Ca3306 (A, C)
Ca3306 (A, C)
Ca3306 (A, C)
UCT P RO D E P RO DU CT E T E L UT O BS O ter at BSTIT LE SU Support Cen /tsc IB S S PO al om FOR A our Technic ww.intersil.c t w c a r t c on SIL o INTER 1-888
Features
CMOS Low Power with Video Speed (Typ) . . . . . 70mW Parallel Conversion Technique Signal Power Supply Voltage . . . . . . . . . . . 3V to 7.5V 15MHz Sampling Rate with Single 5V Supply 6-Bit Latched Three-State Output with Overflow Bit Pin-for-Pin Retrofit for the CA3300
Description
The CA3306 family are CMOS parallel (FLASH) analog-to-digital converters designed for applications demanding both low power consumption and high speed digitization. Digitizing at 15MHz, for example, requires only about 50mW. The CA3306 family operates over a wide, full scale signal input voltage range of 1V up to the supply voltage. Power consumption is as low as 15mW, depending upon the clock frequency selected. The CA3306 types may be directly retrofitted into CA3300 sockets, offering improved linearity at a lower reference voltage and high operating speed with a 5V supply. The intrinsic high conversion rate makes the CA3306 types ideally suited for digitizing high speed signals. The overflow bit makes possible the connection of two or more CA3306s in series to increase the resolution of the conversion system. A series connection of two CA3306s may be used to produce a 7-bit high speed converter. Operation of two CA3306s in parallel doubles the conversion speed (i.e., increases the sampling rate from 15MHz to 30MHz). Sixty-four paralleled auto balanced comparators measure the input voltage with respect to a known reference to produce the parallel bit outputs in the CA3306. Sixty-three comparators are required to quantize all input voltage levels in this 6-bit converter, and the additional comparator is required for the overflow bit.
Applications
TV Video Digitizing Ultrasound Signature Analysis Transient Signal Analysis High Energy Physics Research High Speed Oscilloscope Storage/Display General Purpose Hybrid ADCs Optical Character Recognition Radar Pulse Analysis Motion Signature Analysis Robot Vision
Pinouts
CA3306 (PDIP, SBDIP) TOP VIEW CA3306 (SOIC) TOP VIEW
(MSB) B6 1 OVERFLOW 2 VSS 3 NC 4 VZ 5 CE2 6 CE1 7 CLK 8 PHASE 9 VREF + 10 20 B5 19 B4 18 REF CENTER 17 B3 16 B2 15 B1 (LSB) 14 VDD 13 NC 12 VIN 11 VREF -
B5
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a registered trademark of Intersil Americas Inc. Copyright Intersil Americas Inc. 2002. All Rights Reserved All other trademarks mentioned are the property of their respective owners.
B4
(MSB) B6 1
18 B5
FN3102.2
1
R/2 VREF+ R
1 2
1 2
COMP 64 D Q CL THREE-STATE OVERFLOW
COMP 63
D Q CL
B6 (MSB)
120
REF CENTER
D Q CL
B5
D Q CL
B4
D Q CL
B3
D Q CL
B2
D Q CL
B1 (LSB)
50k
CLOCK CE1
2 (SAMPLE UNKNOWN)
PHASE
1 (AUTO BALANCE)
CE2
0.1F
Thermal Information
Thermal Resistance (Typical, Note 1) JA (oC/W) JC (oC/W) SBDIP Package. . . . . . . . . . . . . . . . . . . . 75 24 PDIP Package . . . . . . . . . . . . . . . . . . . . . 95 N/A SOIC Package. . . . . . . . . . . . . . . . . . . . . 115 N/A CLCC Package . . . . . . . . . . . . . . . . . . . . 80 28 Maximum Junction Temperature Hermetic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175oC Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150oC Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . . 300oC (SOIC - Lead Tips Only)
Operating Conditions
Supply Voltage Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3V to 8V Temperature Range (TA) Ceramic Package (D Suffix) . . . . . . . . . . . . . . . . . -55oC to 125oC Plastic Package (E or M Suffix) . . . . . . . . . . . . . . . -40oC to 85oC
CAUTION: Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE: 1. JA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
PARAMETER SYSTEM PERFORMANCE Resolution Integral Linearity Error, INL
TA = 25oC, VDD = 5V, VREF + = 4.8V, VSS = VREF - = GND, Clock = 15MHz Square Wave for CA3306 or CA3306A, 10MHz for CA3306C TEST CONDITIONS MIN TYP MAX UNITS
0.25 0.2 0.25 0.2 0.5 0.25 0.5 0.25 +0.1 -0.1
Bits LSB LSB LSB LSB LSB LSB LSB LSB mV/oC mV/oC
Gain Temperature Coefficient Offset Temperature Coefficient DYNAMIC CHARACTERISTICS (Input Signal Level 0.5dB Below Full Scale) Maximum Conversion Speed CA3306C CA3306, CA3306A Maximum Conversion Speed CA3306C CA3306, CA3306A Allowable Input Bandwidth -3dB Input Bandwidth Signal to Noise Ratio, SNR RMSSignal = -------------------------------RMSNoise Signal to Noise Ratio, SINAD RMSSignal = ----------------------------------------------------------RMSNoise+Distortion Total Harmonic Distortion, THD fS = 15MHz, fIN = 100kHz fS = 15MHz, fIN = 5MHz fS = 15MHz, fIN = 100kHz fS = 15MHz, fIN = 5MHz fS = 15MHz, fIN = 100kHz fS = 15MHz, fIN = 5MHz Effective Number of Bits, ENOB fS = 15MHz, fIN = 100kHz fS = 15MHz, fIN = 5MHz
10 15
fCLOCK/2 -
MSPS MSPS MSPS MSPS MHz MHz dB dB dB dB dBc dBc Bits Bits
1, 2 Minimum
(Note 4)
(Note 4)
12 18 DC -
5000 5000 50 40 -
ns
ns ns ns psP-P ns ns ns ns ns
AUTO BALANCE
SAMPLE N+1 tD tH
AUTO BALANCE
SAMPLE N+2
DATA N-2
DATA N-1
DATA N
FIGURE 1. INPUT-TO-OUTPUT
CE1
CE2
tDIS
BITS 1-6
DATA
1
tD
CLOCK
2
tD
OUTPUT
OLD DATA
NEW DATA
OUTPUT
OLD DATA
NEW DATA
2
tD
OUTPUT
INVALID DATA
NEW DATA
100
75
20
50
10 VDD = 3V
VREF + = VDD VIN = 0 TO VREF + SINE WAVE AT fCLK/2 ZENER NOT CONNECTED
(Continued)
VDD = 8V VDD = 5V
0 -5 -10 -15
(Continued)
11 10 9 IDD (mA) 8 7
10 fS (MHz)
15
20
32.5 30.0
27.5 ENOB (LSB) -25 0 25 50 75 100 tD (ns) 25.0 22.5 20.0 17.5 15.0 -50
5.1 4.8 4.5 4.2 3.9 3.6 3.3 3.0 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90
TEMPERATURE (oC)
TEMPERATURE (oC)
14.0 12.6 11.2 NON-LINEARITY (LSB) 9.8 8.4 IDD (mA) 7.0 5.6 4.2 2.8 1.4 0.0 -40 -30 -20 -10 0 10 20 30 40 50 TEMPERATURE (oC) 60 70 80 90
1.00 0.90 0.80 0.70 0.60 0.50 0.40 0.30 0.20 0.10 0.0 -40 -30 -20 -10 0 10 20 30 40 50 DNL INL fS = 15MHz
60
70
80
90
TEMPERATURE (oC)
(Continued)
Pin Descriptions
PIN NUMBER DIP 1 2 3 4 5 6 7 8 SOIC 1 2 3, 4 5 6 7 8 9 NAME B6 OF VSS VZ CE2 CE1 CLK Phase Bit 6, Output (MSB). Overflow, Output. Digital Ground. Zener Reference Output. Three-State Output Enable Input, Active Low. See Table 1. Three-State Output Enable Input, Active High. See Table 1. Clock Input. Sample clock phase control input. When PHASE is low, Sample Unknown occurs when the clock is low and Auto Balance occurs when the clock is high (see text). Reference Voltage Positive Input. Reference Voltage Negative Input. Analog Signal Input. Power Supply, +5V. Bit 1, Output (LSB). Bit 2, Output. Bit 3, Output. Reference Ladder Midpoint. Bit 4, Output. Bit 5, Output. DESCRIPTION
9 10 11 12 13 14 15 16 17 18
10 11 12 13, 14 15 16 17 18 19 20
TABLE 2. OUTPUT CODE TABLE (NOTE 1) INPUT VOLTAGE VREF 6.40 (V) 0.00 0.10 0.20 VREF 5.12 (V) 0.00 0.08 0.16 3.10 3.20 3.30 2.48 2.56 2.64 6.20 6.30 6.40 4.96 5.04 5.12 4.65 4.725 4.80 3.10 3.15 3.20 0 0 1 1 1 1 1 1 1 2.325 2.40 2.475 1.55 1.60 1.65 0 0 0 0 1 1 1 0 0 VREF 4.80 (V) 0.00 0.075 0.15 VREF 3.20 (V) 0.00 0.05 0.10 BINARY OUTPUT CODE (LSB) DECIMAL COUNT 0 1 2 1 0 0 1 0 0 1 0 1 31 32 33 1 1 1 1 1 1 0 1 1 62 63 127
OF 0 0 0
B6 0 0 0
B5 0 0 0
B4 0 0 0 1 0 0 1 1 1
B3 0 0 0
B2 0 0 1
B1 0 1 0
1. The voltages listed above are the ideal centers of each output code shown as a function of its associated reference voltage.
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Continuous Clock Operation One complete conversion cycle can be traced through the CA3306 via the following steps. (Refer to timing diagram, Figure 1.) With the phase control in a High state, the rising edge of the clock input will start a sample phase. During this entire High state of the clock, the 64 comparators will track the input voltage and the 64 latches will track the comparator outputs. At the falling edge of the clock, after the specified aperture delay, all 64 comparator outputs are captured by the 64 latches. This ends the sample phase and starts the auto balance phase for the comparators. During this Low state of the clock the output of the latches propagates through the decode array and a 7-bit code appears at the D inputs of the output registers. On the next rising edge of the clock, this 7bit code is shifted into the output registers and appears with time delay to as valid data at the output of the three-state drivers. This also marks the start of a new sample phase, thereby repeating the conversion process for this next cycle. Pulse Mode Operation For sampling high speed nonrecurrent or transient data, the converter may be operated in a pulse mode in one of three ways. The fastest method is to keep the converter in the Sample Unknown phase, 2, during the standby state. The device can now be pulsed through the Auto Balance phase with a single pulse. The analog value is captured on the leading edge of 1 and is transferred into the output registers on the trailing edge of 1. We are now back in the standby state, 2, and another conversion can be started, but not later than 5s due to the eventual droop of the commutating capacitors. Another advantage of this method is that it has the potential of having the lowest power drain. The larger the time ratio between 2 and 1, the lower the power consumption. (See Timing Waveform, Figure 3.) The second method uses the Auto Balance phase, 1, as the standby state. In this state the converter can stay indefinitely waiting to start a conversion. A conversion is performed by strobing the clock input with two 2 pulses. The first pulse starts a Sample Unknown phase and captures the analog value in the comparator latches on the trailing edge. A second 2 pulse is needed to transfer the data into the output registers. This occurs on the leading edge of the second pulse. The conversion now takes slightly longer, but the repetition rate may be as slow as desired. The disadvantage to this method is the higher device dissipation due to the low ratio of 2 to 1. (See Timing Waveform, Figure 3B.) For applications requiring both indefinite standby and lowest power, standby can be in the 2 (Sample Unknown) state with two 1 pulses to generate valid data (see Figure 3C). Valid data now appears two full clock cycles after starting the conversion process. Analog Input Considerations The CA3306 input terminal is characterized by a small capacitance (see Specifications) and a small voltagedependent current (See Typical Performance Curves). The signal-source impedance should be kept low, however, when operating the CA3306 at high clock rates.
The other side of the capacitor is connected to a singlestage inverting amplifier whose output is shorted to its input by a switch. This biases the amplifier at its intrinsic trip point, which is approximately, (VDD - VSS)/2. The capacitors now charge to their associated tap voltages, priming the circuit for the next phase. In the Sample Unknown phase, all ladder tap switches are opened, the comparator amplifiers are no longer shorted, and VlN is switched to all 64 capacitors. Since the other end of the capacitor is now looking into an effectively open circuit, any voltage that differs from the previous tap voltage will appear as a voltage shift at the comparator amplifiers. All comparators whose tap voltages were lower than VlN will drive the comparator outputs to a low state. All comparators whose tap voltages were higher than VlN will drive the comparator outputs to a high state. A second, capacitorcoupled, auto-zeroed amplifier further amplifies the outputs. The status of all these comparator amplifiers are stored at the end of this phase (2), by a secondary latching amplifier stage. Once latched, the status of the 64 comparators is decoded by a 64-bit 7-bit decode array and the results are clocked into a storage register at the rising edge of the next 2. A three-state buffer is used at the output of the 7 storage registers which are controlled by two chip-enable signals. CE1 will independently disable 81 through 86 when it is in a high state. CE2 will independently disable B1 through B6 and the OF buffers when it is in the low state (Table 1). To facilitate usage of this device a phase-control input is provided which can effectively complement the clock as it enters the chip. Also, an on-board zener is provided for use as a reference voltage.
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Applications
7-Bit Resolution To obtain 7-bit resolution, two CA3306s can be wired together. Necessary ingredients include an open-ended ladder network, an overtlow indicator, three-state outputs, and chip-enabler controls - all of which are available on the CA3306. The first step for connecting a 7-bit circuit is to totem-pole the ladder networks, as illustrated in Figure 17. Since the absolute resistance value of each ladder may vary, external trim of the mid-reference voltage may be required. The overflow output of the lower device now becomes the seventh bit. When it goes high, all counts must come from the upper device. When it goes low, all counts must come from the lower device. This is done simply by connecting the lower overflow signal to the CE1 control of the lower A/D converter and the CE2 control of the upper A/D converter. The three-state outputs of the two devices (bits 1 through 6) are now connected in parallel to complete the circuitry.
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Total Harmonic Distortion (THD) THD is the ratio of the RMS sum of the first 5 harmonic components to the RMS value of the measured input signal.
Definitions
Dynamic Performance Definitions Fast Fourier Transform (FFT) techniques are used to evaluate the dynamic performance of the converter. A low distortion sine wave is applied to the input, it is sampled, and the output is stored in RAM. The data is then transformed into the frequency domain with a 4096 point FFT and analyzed to evaluate the dynamic performance of the A/D. The sine wave input to the part is -0.5dB down from full scale for all these tests.
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OF B7 (MSB) B6
B5 B4 RC 0.1F
B5 B4 DATA OUTPUT
B3 B2 B1
0.1F
VREF + VREF -
0.1F
10F NOTE: VDD MUST BE VZ FOR CIRCUIT TO WORK WITH VZ CONNECTED TO VREF+ SIGNAL INPUT
14
(MSB) B6
B6 V+ OF
B5 B4 RC
B5 B4 DATA OUTPUT
VSS CA3306 VZ CLOCK INPUT CE2 CE1 CLK VSS PH VIN VREF + VREF B3 B2
0.1F
B6 OF
B5 B4
CA3306 VSS V+ VZ B3 CE2 B2 CE1 CLK B1 VDD 0.2F V+ PH VIN VREF VREF + 0.1F 10F NOTE: VDD MUST BE VZ FOR CIRCUIT TO WORK WITH VZ CONNECTED TO VREF+ SIGNAL INPUT RC 0.1F
FIGURE 18. TYPICAL CA3306 6-BIT RESOLUTION CONFIGURATION WITH DOUBLE SAMPLING RATE CAPABILITY
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Application Circuits
(Continued)
BINARY ADDER B6 B12 B6 + 0 B5 + 0 B4 + 0 B3 + 0 B2 + 0 B1 + B7 B6
S/H, VIN
B1
CONTROL LOGIC
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Application Circuits
(Continued)
5V
VDD 1K
CA3306
VDD
74LS04
CA3306
VDD
5V CD74HC 4049 (INV.), OR CD74HC4050 (NON-INV.), OR ANY LOW POWER SCHOTTKY TTL WITH HIGH INPUT VOLTAGE RATING (MANY LS DEVICES ARE RATED TO ACCEPT VOLTAGES UP TO 15V).
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