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Example

This document summarizes the results of an OSA test between two telecommunication network equipment. The test was conducted on November 15, 2017 and passed all mask compliance tests for time error, average time error, dynamic time error, and maximum time error index. Key details include the test duration, equipment used, pass/fail results for metrics like 1PPS TE and 2-way time error.

Uploaded by

POC TELKOMSEL
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© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
76 views

Example

This document summarizes the results of an OSA test between two telecommunication network equipment. The test was conducted on November 15, 2017 and passed all mask compliance tests for time error, average time error, dynamic time error, and maximum time error index. Key details include the test duration, equipment used, pass/fail results for metrics like 1PPS TE and 2-way time error.

Uploaded by

POC TELKOMSEL
Copyright
© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 10

General Information

Report Title OSA 5421 - SN : LBADVA71165102328


Report Description POC New Time / Phase - Test 3.5 TC 12
Company PT. OMNI CAKRAWALA TELEKOMUNIKASI
User Name
Network Operator TELKOMSEL
Test Location TTC Buaran 6th Floor
Report Date 2017-12-01 01:34:21
Beginning of Test 2017-11-15 12:44:01
End of Test 2017-11-15 13:59:01
Test Duration 00:01:15:00
Instrument Type Paragon-X 22112
Instrument Serial Number 00022112
CAT Version 18.3.17205.451 [S]

Mask results:

All Mask Results Pass

Mask 1pps TE Absolute Avg Time Error Pass


(cTE) Result
Mask 1pps TE Absolute Time Error Result Pass
Mask 1pps TE Absolute Dynamic TE LF Pass
Result
Mask 1pps TE Absolute MTIE Result Pass
Mask 1pps TE Absolute Dynamic MTIE LF Pass
Result
Mask 2Way Time Error Result Pass
Mask 2Way Avg Time Error (cTE) Result Pass
Mask 2Way Dynamic TE LF Result Pass
Mask 2Way Dynamic MTIE LF Result Pass

Instrument Test Configuration

Encapsulation Unicast/Multicast Line Rate


1588

MSE Information:
M-S Test Config

Device Under Test


Frequency Reference
Source
Sync-E Source
E1 or T1 Source
1pps Source
1588 Information

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Results
1pps TE Absolute Measurement

Slot 1pps TE Absolute


Description
Measurement Start 2017-11-15 12:44:02
Measurement Stop 2017-11-15 13:59:00
Mask Avg Time Error (cTE) 0.55 µs
Mask Result Pass
Mask Time Error 1.1 µs
Mask Result Pass
Mask Dynamic TE LF 1.1 µs
Mask Result Pass
Mask MTIE G.8261.1
Mask MTIE Result Pass
Mask Dynamic MTIE LF G.8261.1
Mask Dynamic MTIE LF Result Pass

Avg Time Error (cTE) Analysis

Averaging Period 1000 s

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Time Error Analysis

Offset Removal Applied Off


Zero Offset 56 ns

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Dynamic TE LF Analysis

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MTIE Analysis

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MTIE LF Analysis

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2Way Measurement

Slot 2Way
Description
Physical Medium
Line Rate
Measurement Start 2017-11-15 12:44:01
Measurement Stop 2017-11-15 13:59:01
Mask Time Error 1.1 µs
Mask Result Pass
Mask Avg Time Error (cTE) 0.55 µs
Mask Result Pass
Mask Dynamic TE LF 1.1 µs
Mask Result Pass
Mask Dynamic MTIE LF G.8261.1
Mask Dynamic MTIE LF Result Pass

Time Error Analysis

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Avg Time Error (cTE) Analysis

Averaging Period 1000 s

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Dynamic TE LF Analysis

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MTIE LF Analysis

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