Datasheet
Datasheet
Datasheet
OM
RDS(ON) = 22mΩ (typ.) @ VGS = 10V
RDS(ON) = 26mΩ (typ.) @ VGS = 4.5V
• Channel 2
30V/10A, Top View of SOP − 8
.C
RDS(ON) = 12mΩ (typ.) @ VGS =10V
RDS(ON) = 16mΩ (typ.) @ VGS =4.5V D1 S1/D2
(1) (2) (5) (6) (7)
• Super High Dense Cell Design
• Reliable and Rugged
• Lead Free Available (RoHS Compliant)
Applications
IC G1 (8)
G2
(3)
T-
• Power Management in Notebook Computer,
S2 (4)
Portable Equipment and Battery Powered
Systems N-Channel MOSFET
SE
Package Code
APM4910
K : SOP-8
IP
APM4910 K : APM4910
XXXXX XXXXX - Date Code
Note: ANPEC lead-free products contain molding compounds/die attach materials and 100% matte tin plate
termination finish; which are fully compliant with RoHS and compatible with both SnPb and lead-free soldiering
operations. ANPEC lead-free products meet or exceed the lead-free requirements of IPC/JEDEC J STD-020C
for MSL classification at lead-free peak reflow temperature.
ANPEC reserves the right to make changes to improve reliability or manufacturability without notice, and
advise customers to obtain the latest version of relevant information to verify before placing orders.
OM
ID* Continuous Drain Current 7 10
A
IDM* Pulsed Drain Current 25 35
IS* Diode Continuous Forward Current 2.5 3 A
TJ Maximum Junction Temperature 150
.C
°C
TSTG Storage Temperature Range -55 to 150
TA=25°C 2
PD* Power Dissipation W
TA=100°C 0.8
RθJA* Thermal Resistance-Junction to Ambient 62.5 °C/W
Note:
IC
*Surface Mounted on 1in pad area, t ≤ 10sec.
2
T-
SE
IP
CH
Channel 1
Channel 1
Symbol Parameter Test Condition Unit
Min. Typ. Max.
OM
Static Characteristics
BVDSS Drain-Source Breakdown Voltage VGS=0V, IDS=250µA 30 V
VDS=24V, VGS=0V 1
IDSS Zero Gate Voltage Drain Current µA
TJ=85°C 30
.C
VGS(th) Gate Threshold Voltage VDS=VGS, IDS=250µA 1 1.5 2 V
IGSS Gate Leakage Current VGS=±16V, VDS=0V ±100 nA
a VGS=10V, IDS=7A 22 28
RDS(ON) Drain-Source On-state Resistance mΩ
VGS=4.5V, IDS=5A 26 34
VSD
Qg
Qgs
a
Diode Forward Voltage
Gate Charge Characteristics
Total Gate Charge
Gate-Source Charge
b
IC ISD=2.5A, VGS=0V
VDS=15V, VGS=4.5V,
IDS=7A
0.8
10
1.5
1.1
14
V
nC
T-
Qgd Gate-Drain Charge 5
b
Dynamic Characteristics
RG Gate Resistance VGS=0V,VDS=0V,F=1MHz 1.5 Ω
Ciss Input Capacitance VGS=0V, 880
SE
Channel 2
Channel 2
Symbol Parameter Test Condition Unit
Min. Typ. Max.
OM
Static Characteristics
BVDSS Drain-Source Breakdown Voltage VGS=0V, IDS=250µA 30 V
VDS=24V, VGS=0V 50 µA
IDSS Zero Gate Voltage Drain Current
TJ=85°C 5 mA
.C
VGS(th) Gate Threshold Voltage VDS=VGS, IDS=250µA 1.3 1.8 2.5 V
IGSS Gate Leakage Current VGS=±20V, VDS=0V ±100 nA
a VGS=10V, IDS=10A 12 15
RDS(ON) Drain-Source On-state Resistance mΩ
VGS=4.5V, IDS=7A 16 21
VSD
Qg
Qgs
a
Diode Forward Voltage
Gate Charge Characteristics
Total Gate Charge
Gate-Source Charge
b
IC ISD=1A, VGS=0V
VDS=15V, VGS=4.5V,
IDS=10A
16
3.7
0.52
22
V
nC
T-
Qgd Gate-Drain Charge 8.5
b
Dynamic Characteristics
RG Gate Resistance VGS=0V,VDS=0V,F=1MHz 1.7 Ω
Ciss Input Capacitance VGS=0V, 1610
SE
IDS=1A, VGEN=10V, ns
td(OFF) Turn-off Delay Time RG=6Ω 39 71
tf Turn-off Fall Time 12 23
Notes:
a : Pulse test ; pulse width≤300µs, duty cycle≤2%.
CH
Typical Characteristics
Channel 1
Power Dissipation Drain Current
2.5 8
OM
2.0
6
1.5
.C
4
1.0
2
0.5
0.0
0
TA=25 C
20
o
40 60
IC
80 100 120 140 160
100 2
Normalized Transient Thermal Resistance
1 Duty = 0.5
0.2
ID - Drain Current (A)
10
it
Lim
IP
0.1
n)
300us
s(o
Rd
1 0.02
10ms
0.01
CH
100ms
0.01
Single Pulse
0.1 1s
DC
2
Mounted on 1in pad
O o
TA=25 C RθJA : 62.5 C/W
0.01 1E-3
0.01 0.1 1 10 100 1E-4 1E-3 0.01 0.1 1 10 30
VDS - Drain - Source Voltage (V) Square Wave Pulse Duration (sec)
OM
35
30
VGS= 4.5V
15
.C
3V 25
VGS= 10V
10
20
0
0.0 0.5 1.0 1.5
2.5V
2.0 2.5
IC
3.0
15
10
0 5 10 15 20 25
60 1.6
ID=7A IDS =250µA
55
1.4
Normalized Threshold Voltage
50
RDS(ON) - On - Resistance (mΩ)
1.2
45
IP
1.0
40
35 0.8
30
0.6
CH
25
0.4
20
0.2
15
10 0.0
1 2 3 4 5 6 7 8 9 10 -50 -25 0 25 50 75 100 125 150
OM
1.75 IDS = 7A
10
Normalized On Resistance
1.50
o
Tj=150 C
.C
1.00 o
Tj=25 C
1
0.75
0.50
0.25
0.00
-50 -25 0 25 50
o
RON@Tj=25 C: 22mΩ
1400 10
Frequency=1MHz VDS= 15V
9
1200 IDS= 7A
VGS - Gate - source Voltage (V)
1000 7
IP
C - Capacitance (pF)
Ciss
6
800
5
600
4
CH
400 3
2
200
Coss
1
Crss
0 0
0 5 10 15 20 25 30 0 4 8 12 16 20
OM
10
2.0
1.5
.C
6
1.0
4
0.5
0.0
0
TA=25 C
20
o
0
0 20
o
TA=25 C,VG=10V
100 2
Normalized Transient Thermal Resistance
1
Duty = 0.5
it
Lim
0.2
ID - Drain Current (A)
10
n)
s(o
300us
IP
Rd
0.1
1ms 0.1 0.05
10ms 0.02
1
100ms
0.01
CH
1s 0.01
0.1
DC Single Pulse
2
Mounted on 1in pad
O
TA=25 C o
RθJA : 62.5 C/W
0.01 1E-3
0.01 0.1 1 10 100 1E-4 1E-3 0.01 0.1 1 10 30
VDS - Drain - Source Voltage (V) Square Wave Pulse Duration (sec)
OM
30 20
VGS= 4.5V
16
20
.C
3.5V
14
15 VGS= 10V
12
10
10
0
0.0 0.5 1.0 1.5
3V
2.0 2.5
IC
3.0
8
6
0 5 10 15 20 25 30 35
40 1.8
ID= 10A IDS =250µA
35 1.6
Normalized Threshold Voltage
RDS(ON) - On - Resistance (mΩ)
1.4
30
IP
1.2
25
1.0
20
0.8
15
CH
0.6
10
0.4
5 0.2
0 0.0
1 2 3 4 5 6 7 8 9 10 -50 -25 0 25 50 75 100 125 150
OM
1.8 IDS = 10A
Normalized On Resistance
1.6 10 o
Tj=150 C
1.2
.C
o
Tj=25 C
1.0
1
0.8
0.6
0.4
0.2
-50 -25 0 25 50
o
RON@Tj=25 C: 12mΩ
2400 10
Frequency=1MHz VDS= 15V
2200 9
IDS= 10A
2000
VGS - Gate - source Voltage (V)
8
1800
7
IP
C - Capacitance (pF)
1600 Ciss
1400 6
1200 5
1000 4
CH
800
3
600
2
400 Coss
200 1
Crss
0 0
0 5 10 15 20 25 30 0 4 8 12 16 20 24 28 32
Packaging Information
OM 0.015X45
.C
E H
e1
D
IC
e2
T-
A1
A 1
SE
L
0.004max.
IP
Millimeters Inches
Dim
Min. Max. Min. Max.
A 1.35 1.75 0.053 0.069
CH
Po P D
E
OM
P1
F Bo
W
.C
Ao D1 Ko
IC J
T2
T-
C
A B
SE
T1
Application A B C J T1 T2 W P E
IP
330±1 62 ± 1.5 12.75 + 2 + 0.5 12.4 +0.2 2± 0.2 12 + 0.3 8± 0.1 1.75± 0.1
0.1 5 - 0.1
SOP-8 F D D1 Po P1 Ao Bo Ko t
5.5 ± 0.1 1.55±0.1 1.55+ 0.25 4.0 ± 0.1 2.0 ± 0.1 6.4 ± 0.1 5.2± 0.1 2.1± 0.1 0.3±0.013
CH
(mm)
Physical Specifications
Terminal Material Solder-Plated Copper (Solder Material : 90/10 or 63/37 SnPb), 100%Sn
Lead Solderability Meets EIA Specification RSI86-91, ANSI/J-STD-002 Category 3.
OM
TP tp
Critical Zone
T L to T P
.C
Ramp-up
TL
tL
Temperature
Tsmax
Tsmin
IC Ramp-down
T-
ts
Preheat
t 25 °C to Peak
SE
25
Tim e
OM
Table 2. Pb-free Process – Package Classification Reflow Temperatures
3 3 3
Package Thickness Volum e m m Volume mm Volume mm
<350 350-2000 >2000
<1.6 m m 260 +0°C* 260 +0°C* 260 +0°C*
.C
1.6 m m – 2.5 m m 260 +0°C* 250 +0°C* 245 +0°C*
≥2.5 m m 250 +0°C* 245 +0°C* 245 +0°C*
*Tolerance: The device manufacturer/supplier shall assure process compatibility up to and
including the stated classification temperature (this means Peak reflow temperature +0°C.
For example 260°C+0°C) at the rated MSL level.
Test item
SOLDERABILITY
IC Method
MIL-STD-883D-2003 245°C,5 SEC
Description
T-
HOLT MIL-STD 883D-1005.7 1000 Hrs Bias @ 125°C
PCT JESD-22-B, A102 168 Hrs, 100% RH, 121°C
TST MIL-STD 883D-1011.9 -65°C ~ 150°C, 200 Cycles
SE
Customer Service
Taipei Branch :
7F, No. 137, Lane 235, Pac Chiao Rd.,
Hsin Tien City, Taipei Hsien, Taiwan, R. O. C.
Tel : 886-2-89191368
Fax : 886-2-89191369