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What Is The Difference Between Process Sigma and Process Capability

The difference between the Six Sigma metric of Process Sigma and Process Capability relates to the definitions of these performance metrics. In both cases the Customer Specifications are compared to process performance.

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Bruno Saturn
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64 views

What Is The Difference Between Process Sigma and Process Capability

The difference between the Six Sigma metric of Process Sigma and Process Capability relates to the definitions of these performance metrics. In both cases the Customer Specifications are compared to process performance.

Uploaded by

Bruno Saturn
Copyright
© © All Rights Reserved
Available Formats
Download as DOC, PDF, TXT or read online on Scribd
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What is the difference between

Process Sigma and Process


Capability?
In both cases of Process Sigma and Process Capability we are talking
about performance relative to the Customer’s requirements. Is there
a difference? Is one measure better than the other? These are good
questions which you will be able to answer by reading on.

The difference between the Six Sigma metric of Process Sigma and
Process Capability relates to the definitions of these performance
metrics. In both cases the Customer Specifications are compared to
process performance. For metrics that can be measured on a
continuous scale the process mean and standard deviation must be
calculated. If the metrics from the process are discrete, or attributes,
then the percent defective is calculated. In either case the process
performance as measured on a control chart should exhibit only
natural random patterns of variation, or what is often called
common cause variation over time.

Process Sigma
Process Sigma is defined by numeric levels that are related to a
process’s output of defects per million opportunities. Defects are
defined as any failure to meet the customer’s specifications. Process
yield is used to look up the Process Sigma level from a table. Yield is
based on Defects (D), Units Processed (N), and the number of
Opportunities (O) for a defect to occur. Once the yield is calculated
the Process Sigma can be found in the table below.
Find the Process Sigma level in the table above.

If the process output can be measured on a continuous scale the


process average and standard deviation are used in a formula that
compares the average to the closest specification, whether it is the
Upper Specification or the Lower Specification we choose the one
closest to the process average. Basically we are making this a one
sided specification. The standard normal distribution is used to
estimate the defect rate which can then be converted to yield and
use the above table to look up the Process Sigma level.

The other method is to calculate the Z statistic which estimates the


number of standard deviation units the average is away from the
closest specification which is based on the standard normal
distribution. We then add a 1.5 sigma shift to the calculated Z
statistic which gives us the Process Sigma level directly. The 1.5
sigma shift has been a matter of contention, but it is part of the
definition of Process Sigma. The following is the formula.

The definition of Process Sigma is that at a level of 6 on the scale


there will be only 3.4 defects per million opportunities. The process
is assumed to remain stable over time and if it drifts in one direction
at a time of 1.5 sigma there will be no more than 3.4 defects per
million under the tail of the distribution outside of the Customer’s
Specification. When we calculate the Z statistic we add the 1.5
sigma shift to give us the Process Sigma level directly.

Process Capability
Process Capability assessment begins with control charts to evaluate
the stability over time for the process. For the Process Capability
study to be meaningful the process must exhibit only common
cause variation, which are natural patterns of random variation.

In the case of Attribute, or discrete variables, data the Process


Capability becomes the centerline of the Control Chart, or the
average p, c, or u depending upon the chart being used. In the
example below the average p, or fraction non-conforming, is 0.076,
or 7.6% defective. The chart is in statistical control so the capability
is the overall process average of percent defective.

In the case of continuous variables data the mean and standard


deviation from the stable, or in statistical control, process comes
into play. We will describe 2 of the many Process Capability Indices.
The first is the Cp which compares total process variation to the
total width of the specification. The second is Cpk which takes into
consideration centering of the process within the specification so we
look at ½ of the process variation compared to the closest
specification limit.

The Cp formula below divides the specification width by the


measured process spread of 6 standard deviations. A fully capable
process has a Cp = 1.33 or greater.

The Cpk formula below divides the absolute value of the difference
between the process average and the closest specification by ½ of
the measured process spread of 3 standard deviations. A fully
capable process has a Cpk = 1.33 or greater.
The Cp value indicates how capable a process can become if it is
perfectly centered. The Cpk value indicates how much work is
needed to get centered. In the following table notice that for a Cpk
= 1.33 the Process Sigma = 5.5. A process that operates at a
Process Sigma = 6 has a Cpk = 1.50. The Z Value is the number of
standard deviation units away from the specification when the data
is converted to a standard normal distribution.

Table of conversions from Z to Cpk and Process Sigma.

Both measures of performance use that same statistics to be


computed. Whether you prefer Process Capability or Process Sigma
the key is to apply the metrics consistently. To be valid your process
must be in a state of statistical control and exhibit only common
cause variation.

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