Tin Pest in Lead-Free Solders: Technical Brief
Tin Pest in Lead-Free Solders: Technical Brief
Tin Pest in Lead-Free Solders: Technical Brief
Yoshiharu Kariya
Materials Engineering Department, The Open University, Milton Keynes, UK
Colin Gagg
Materials Engineering Department, The Open University, Milton Keynes, UK
William J. Plumbridge
Materials Engineering Department, The Open University, Milton Keynes, UK
Results
The alloys were held at 20K above their melting point and
cast into an aluminium mould in air. The mould and ingot
were immediately water quenched and then aged at 255K
(±188C ) for up to two years. The specimens were
intermittently observed under an optical and scanning
electron microscope.
Figure 1 shows the transformation of -tin (white tin)
into ¬-tin (grey tin) occurring in Sn-0.5Cu, aged at 255K
Soldering & Surface Mount
Technology
13/1 [2000] 39±40
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Yoshiharu Kariya, Colin Gagg and it cracks in order to accommodate changes in the volume. much longer than that of Sn-0.5Cu. In contrast, that for
William J. Plumbridge This result indicates that tin pest could lead to total Sn-9Zn is much shorter. Further details of these
Tin pest in lead-free solders disintegration of real joints. No change was observed in the transformations are underway and will be reported in the
Soldering & Surface Mount Sn-37Pb specimen. near future.
Technology It is evident that the transformation into grey tin initiates The absence of a transformation in the Sn-37Pb alloy
13/1 [2001] 39±40 at the surface, and then expands on it. Nucleation is not may be attributable to soluble impurities (such as lead,
uniform since the surface of the grip section (the end of the bismuth and antimony) suppressing the transformation into
specimen) was completely transformed, whereas only 30 grey tin (Hedges, 1960).
per cent of the gauge section was transformed. The grip The results indicate that tin pest has the potential to
sections had been machined whereas the gauge of the become a major hazard in applications which involve
specimen was as-cast. This suggests that residual stress or prolonged exposure to low temperatures and the use of
strain might accelerate the transformation. Macroscopic certain tin-based lead-free solders.
bowing of the heavily transformed specimens was apparent.
Figure 2 shows a cross-section, at the grip, of a sample
after exposure for 1.5 years at 255K. It can be seen that
transformation had begun to expand into the material bulk
from the surface. There was no visible evidence of
nucleation within the bulk. EDX analysis confirmed that
References
Hedges, H.E. (1960), Tin and its Alloys, Edward Arnold, London,
there was no segregation in the specimen. pp. 51-3.
Preliminary findings indicate that tin pest may also be Napp, D. (1996), ``Lead free interconnect materials for the
formed on Sn-3.5Ag and Sn-9Zn alloys within areas that electronics industry’’, SAMPE Journal, Vol. 32 No. 59,
are work hardened. The incubation period in Sn-3.5Ag is pp. 59-65.
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