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Theory 3: Details Accepted Prepared Rev Date Rev NR

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Theory 3

Rev nr Rev date Prepared Accepted Details

00 14-03-2003 WM JV
01 27-04-2003 WM JV
02 29-04-2003 WM JV
03 27-10-2003 WM JV Page numbering added
Letters black
Theory basic and advanced divided into Theory 1, 2 and 3
Time Resolution graph added

Filename: presents\cursus\Cursus_TOFD_Engels\Cursus TOFD EN nov2003\05 Theorie3_UKrev3.ppt


0
Time of Flight Diffraction
Technique (TOFD)

Theory 3

1
Theory 3
Use of Compression waves, because of:
• unambiguous analysis (L-waves fastest)
• only one point where no diffraction occurs (38º)
• phase reversal between top and bottom of
defects (with shear waves dependant upon
subtended angle)
• use of Lateral wave for timing reference (for
shear waves only Rayleigh wave, but slower,
covering large area at the near surface)
• longer wavelength (better penetration in material,
better S/N ratio, although far surface detection
2 limit larger)
Theory 3
Use of Shear waves:
• For complex geometries
• For verification (high-low vs root defects etc)
• For detection of eccentric defects

3
Theory 3
Shear wave elimination

• Fastest shear wave component must arrive after


compression back wall echo I.e.:

2S 2 S 2 + W 2 or: S>
W
>
cs cl 3

4
Theory 3

5
Theory 3
Requirement TOFD examination:
• Short pulse length, concerning time resolution
– High frequency (damping, beam spread !!)
– High damping
– High band width
Effects of probe size and beam spread on pulse
length
• Preference: large beam spread
– Low frequency
– Small crystal diameter
Near the edge of the beam lower frequencies
components
6
Theory 3
300

250

200

150

100

50

0
-2.E-08 -2.E-08 -1.E-08 -5.E-09 0.E+00 5.E-09 1.E-08 2.E-08 2.E-08

-50

x1(t) x2(t) x3(t) x4(t) x5(t) x6(t) x7(t) x(t)

7
Theory 3
300

250

200

150

100

50

0
-2.E-08 -2.E-08 -1.E-08 -5.E-09 0.E+00 5.E-09 1.E-08 2.E-08 2.E-08

-50

-100

-150

x1(t) x2(t) x3(t) x4(t) x5(t) x6(t) x7(t) x(t)

8
Theory 3
300

250

200

150

100

50

0
-2.E-08 -2.E-08 -1.E-08 -5.E-09 0.E+00 5.E-09 1.E-08 2.E-08 2.E-08

-50

-100

-150

x1(t) x2(t) x3(t) x4(t) x5(t) x6(t) x7(t) x(t)

9
Theory 3
• From geometric limitations the minimum (or
maximum) PCS follows
– S (PCS) influences time resolution (smaller PCS,
better Resolution

2
c 
R =  L  * (t d + t p ) 2 − S 2 − d
2

10
Theory 3
Time resolution (R) as function of depth (d) and PCS/2 (S)

25,00

20,00

15,00

10,00

5,00

0,00
0,0
200
170 180
60,0 150 160
130 140
120,0 110 120
d 90 100
70 80 S
180,0 50 60
11 30 40
10 20
0
Theory 3
Blind Zones
• Outer surface (inspection surface)
– dependent on length of lateral wave
– dependent on probe centre separation

Dds = S*cL *tp +(21 cL *tp)2


• Inner surface
– detection approx. 1-2% of wall thickness with central position
– dependent on a-centric position
– dependent on probe centre separation
2
c 
Ddw =  L  * (tW + t p )2 − S2 − W
2
12
Theory 3

13
Theory 3

14
Theory 3
• Concave surface
– No blind zone, but resolution poor at top surface
– Lateral wave arrival equivalent to a finite depth
– Back-wall appears more distant than expected

• Convex surface
– Blind zone
– Back-wall echo closer than estimated from specimen
thickness

15
Theory 3
• Absolute measurements
• Differential measurements
• Dependent on parameters:
– Frequency
– PCS
– Depth
– Timing errors/sampling rate
– Geometry
– Surface/coupling conditions

16
Theory 3
Timing error
cδ t (d 2 + S 2 )
δd =
2d
Velocity error
δ c (d 2 + S 2 ) − S (d 2 + S 2 )
δd =
2 cd
Smaller PCS (S) smaller error
Shorter pulse, higher frequency and higher
digitisation rate reduce timing error dt, therefore
depth error dd
17
Theory 3
Depth error due to PCS (S) change
S S dS

δd =
δS { (d 2
+ S2) − S }
d
18
Theory 3
Offset scanning or offset defect position
S S

d
 δy 2
cL * td − 4S *  2 2 
2 2 2

δd =  cL td 
y
δy 2
0.25 − 2 2
19
cL td
Theory 3
Couplant thickness variation
S S

Couplant layer H

δ Hdc
δd = c

4cL d 2
+S 2

20
Theory 3
Inspection surface variations
S S

δH  d2 
δd = *  1 + 2

2  2S 
21

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