AP621 Lect02 Diffraction
AP621 Lect02 Diffraction
AP621 Lect02 Diffraction
Ref: J. Yuan, R. Yu, Electron microscopy analysis, lecture notes, Tsinghua, 2005-2009
J. Cowley, Diffraction Physics, Springer, 2005
The scattering of electrons
Single atoms Incident electron wave
e ikr
a(θ ) = f (θ )
r
d 2σ (θ , ϕ )
= f (θ )
2
Atom
dΩ(θ , ϕ )
θ
Transmission
Kinematical expression of diffraction from a
unit cell of atoms
unit cell:
Smallest repeating unit in crystals
scattering amplitude of unit cell
e iqri e iqr iqr
A(θ ) = ∑ f i (θ ) f i (θ )e = F (θ )
e
i r
≈
r
∑
i
iq ( ri − r )
Structure factor:
Dynamical effect in electron diffraction
kinematical Dynamical
I3
G
O1
O
O2 I2
-G
O3
I1
OP BFP IP
DP Intensity
Qualitative analysis
Quantitative analysis
Holography
θ Lattice planes
d
2d sin θ = nλ
Geometry of diffraction by crystals
θ
Geometrical relationship
between diffraction pattern
and crystal lattice
Bragg’s law:
2d sinθ=λ d
d = lattice plane distance
λ =wavelength of electrons
θ = Bragg diffraction angle θ
θ
Projection distance: L
r = L tan 2θ
when θ is small
tan2θ≈2θ
sinθ≈θ G’
rd=Lλ=constant
O r G’’
Edward Sphere of Reflection
Energy conservation
kin=kout
Momentum conservation d
kin=kout+q n
q: diffraction vector
Conditions for diffraction kout
q2=2k•q
Equals to Bragg condition kin
q=g G
2dsinθ=λ
[q=g=(2π/d)n=reciprocal vector]
So the condition is diffraction vector=reciprocal vector
O
Reciprocal Lattice (review)
For each different real periodicity (1/d) in the
crystalline lattice, we can define a reciprocal
vector g such that
g=(2π/d)n
The end points of the reciprocal vectors define
a reciprocal lattice
Mathematically, we can write any reciprocal
lattice vector in terms of the unit vectors (a*,
b* and c*) in the reciprocal lattice
g=ha*+kb*+lc*
Reciprocal Lattice (review)
Definition of the unit vectors
(a*, b* and c*) in the
reciprocal lattice b×c
a* =
a ⋅ (b × c )
Property of unit vectors (a*, b*
and c*): c×a
b* =
Normal to real space planes a ⋅ (b × c )
a*.b=a*.c=b*.a=b*.c=c*
.a=c*.b=0 a×b
c* =
Dimension of the real space and
reciprocal space are inversely
a ⋅ (b × c )
proportional
a*.a=1; b*.b=1; c*.c=1
Physical significance of the reciprocal lattice
Reciprocal vector:
g=(2π/d)n
Matter density wave in crystals with
frequency =(1/d), wave vector =g
Reciprocal lattice:
Matter density lattice in 3D crystals
Laue’s diffraction condition):
q=g
Norally two intercepts generated between Ewald sphere
and reciprocal lattice
Diffractions
No diffraction condition Systematic row diffraction
Cubic MgO
Diffraction by crystals
Small area
phase
identification
Sample: Steel
Selected area
diffraction
Selected Area Diffraction
Specimen
Method:
Selected area Virtual SA apeature
aperture to select
area in image plane
Smallest apeature BFP
size~10nm
Applications:
Sample、small
crystals,
precipitants
Real SA apeature
Selected area diffraction: effect of spherical
aberration
Cs=2mm
α=0.02mrad
(low index diffraction beam)
Error ≥ 16 nm
MCsα
SA Aperture
Effective error in area selection
Selected area diffraction: effect of defocus
Defocus error
SA error:
typically: ∆fα
∆f=1um Specimen
α=0.02mrad ∆f
(low index diffraction beam) Focus plane
error=20 nm
g 0
Kossel diffraction:
Nanodiffraction (NBD or NBED)
C2
Method:
Illumination
control C3
SA size as small
as few nm
Specimen
Applications:
Nano phase Virtual SA aperture
analysis
Nano crystal
direction analysis Diffraction plane
NBD
example
multishell
CuAu nanoparticle
27
(Convergent Beam Electron Diffraction, CBED)
CBED:
Mostly incoherent
diffraction
Applications: α
Nano-phase determination
Specimen
Space group
determination
Structure factor Virtual SA aperture
measurement
Diffraction plane
CBED characteristics
Diffraction spots-
>diffraction disks,
Bright circles at
HOLZs
Incoherent
diffraction(Rocking
Curve determines)
Disk overlapping
(α>2θb)may induce
interference
(holography
diffractions)
CBED examples
30
CBED examples
31
The energy filtering of electron diffraction pattern
No energy filtering
Energy filtering
eliminate the
diffraction
contributions from
inelastic scattered
electrons, more fine
structures revealed.
Energy filtered
CBED
Pros and Cons (CBED)
33
Shape effect in nanocrystal diffraction
Basic theory
Application in nanotube
characterization
Deviation vector:Sg
Sg=q-g
For high energy
electrons,Sg
parallel with z
(incident beam
direction)
Sg=-g2λ/2
Sg
-G O g G
Theory of shape effect
Kinetic theory of diffraction from crystalline
materials
A= f ∑ e iq⋅rn
nx ,n y ,nz
rn = nx a + nx b + nx c
Aslab = f ∑e iq⋅rn
nx ,n y ,nz =0
= f
(
1− e ) ( ) (
iN x q⋅a
1− e 1− e ) iN y q⋅b iN z q⋅c
Aslab
(1 − e ) (1 − e ) (1 − e )
iq⋅a iq⋅b iq⋅c
Shape effect on diffraction
N xq ⋅ a sin 2 N y q ⋅ b 2 N z q ⋅ c 2 N xs ⋅ a 2 N ys ⋅ b
2 N zs ⋅ c
sin 2
sin sin sin sin
Aslab = f
2 2 2 2 2 = f 2 2 2 2
2 q ⋅a 2 q ⋅b 2 q ⋅c 2 s ⋅a 2 s ⋅b 2 s ⋅c
sin sin sin sin sin sin
2 2
2 2 2 2
I(s,t)=FT(shape of specimen)
Finite size=>reciprocal
extend to relrod
Extinguishing distance
=> relrod
Shape effect
Determination of
nanotube diameter (?)
Determination of
nanotube chiral angle (?)
Helix and Sine structural models
X-ray data
f(θ)
SOLZ
FOLZ
ZOLZ
Kikuchi Lines
Formation mechanism:
Incoherent scattered electrons
(background)
θΒ θΒ
Bragg diffraction of these
electrons:bright-dark stripe
pairs
Characterisitc: 2θΒ
Angle between bright/dark θΒ θΒ
pairs=2θ
Direction of paired stripes=
certain crystal plane direction
Bright Dark
Kikuchi line in CBED
Incident beam with
original angle
distributions θΒ θΒ
2θΒ
θΒ θΒ
Bright Dark
Application of Kikuchi Pattern
Crystal direction
measurement
Accuracy:
Diffraction: 3-10°
Kikuchi line:0.1°
Determination of g
Determination of sg
Kikuchi Map
Application:
Tilt speciments
Simulation by Ideal Microscope
Can simulate
ZOLZ
HOLZ
Kikuchi lines
Summary (1)
Electron Diffraction
A convenient tool for study periodicity in the atomic
structure of a solids (both long and short range)
Kinematics of Electron Diffraction
Equivalence of Bragg’s law and Laue condition
Diffraction in Crystals and Reciprocal Lattice
Diffraction Pattern and Kikuchi Pattern Formation
Application and Techniques of Electron
Diffraction
Selected Area Diffraction: small phase identification
Finite size effect: shape and size determination
The theory of electron dynamics in perfect crystal
From Fresnel Diffraction Theory
kinematical Dynamical
−m
F (θ , ϕ ) = ∑ f i (θ )e iqr '
= 2 ∫
d 3
r '
V (r ' )e −iq⋅r '
2π
unitcell
i
r = ri − r = xi a + yi b + zi c
i
'
q = ha + kb * +lc *
*
Diffraction intensity
Electron density @ R
60
Structure factor
61
Finite crystal’s Patterson
62
Structural factors of a bcc structure
001 011
The unit cell consists
two identical basis
101 111
atoms at
1/21/21/2
(0,0,0) 000 010
(1 / 2,1 / 2,1 / 2)
100 110
Structure factors
002
(
F = f 1 + e iπ ( h + k + l ) ) 202
112
222
022
011 121
F = 2 f if h + k + l is even 101
000 020
F = 0 if h + k + l is odd 200 110
220
Structural factors of a fcc structure
The simple cubic unit cell 001 011
½,1/2,1
consists four identical 101 111
basis atoms at 1/2,1,1/2
½,0,1/2 0,1/2,1/2
(0,0,0); (1 / 2,0,1 / 2)
000 010
(1 / 2,1 / 2,0); (0,1 / 2,0) 100 1/21/20
110
Can show that the
002 022
structure factors are
202 222
F =4f if h, k , l are all odd or all even
111
000 020
F =0 if h, k , l are mixed even and odd
200 220
Chemical sensitive reflections
Diamond structure
Fcc lattice with a basis of two identical atoms at (0,0,0) and
(1/4,1/4,1/4) sites
GaAs structure
Fcc lattice with a basis of Ga atoms at (0,0,0) and As
(1/4,1/4,1/4) sites π
i (h + k +l )
Structural factors F = f Ga + f As e 2 F fcc
Selection rules
F =0 h,k,l mixed as fcc
F = 4( f Ga − f As )
If h,k,l are all even and e.g. [200]
h+k+l=2N where N is order
F = 4( f Ga + f As )
If h,k,l are all even and e.g. [400]
h+k+l=2N where N is even
Order sensitive reflections
L10 ordered structure (NiAl, FePt)
bcc lattice with a different atoms occupying the
body centering site
Alternatively simple cubic with a basis of two
atoms
A disordered phase
Bcc lattice with atoms occupying sites
randomly
Exercises
To show that [001] reflection is order sensitive
Double diffraction
Each of the strongly diffracting beams
also act as primary beam
Dynamical scattering effect
Two overlapping crystals
Consequence
Kinematically forbidden diffraction
maybe allowed
Extra diffraction beams in the resulting
diffraction pattern
Example 1 of Double diffraction
Example 2 of double diffraction
Extra spots
Diffraction theory in crystals(1): Multislice method
ψ = ∑ φG e
T iχ G ⋅r
G
Multislice method
72
Multislice method
73
Multislice method
74
Quantum mechanics description of
multislice method
75
Quantum mechanics description of
multislice method
76
Quantum mechanics description of
multislice method
77
Diffraction theory in crystals(2):Bloch wave in crystals
79
Dual beam diffraction assumption:
In experiments, the crystal direction is
deviated from zone axis
Kossel-Mollenstedt Fringe
q
S>0
g
S<0
q=g+s
The theory of electron dynamics in perfect crystal
dφ 0 ( z ) i π iπ
= φ 0 (z ) + φ g exp(iq • r )
dz ξ0 ξg
dφ g iπ iπ
= φg + φ0 exp(− iq • r )
dz ξ0 ξg
πz
φg (z ) =
i
sin x x= 1 + ω 2 ; ω = sξ g
1+ ω 2 ξg
sin (πzseff )
2
2
1
Intensity: I g = φ g ( z ) = = s +
2 2
(s ξg )
seff
2 ξ
eff g
O
t=0.3kai
G
kout
0.7
0.6
Rocking Curve
0.5
0.4
0.3
0.2
0.1
-0.1
-15 -10 -5 0 5 10 15
ω=sξg
Rocking Curve t=2
ξg
ω=sξg
1
0.8
Transmitted beam
0.6
ki kout
n 0.4
Diffracted beam
0.2
S>0
S=0 0
S<0 -3 -2 -1 0 1 2 3
O
G ω
S<0 S>0
Thickness effect 4
t
ξg
Characteristics: 3.5
2.1
Intensity of
3
diffracted beam 1.8
periodically varies
with thickness 2.5
1.5
2
1.2
1.5
0.9
1
0.6
0.5
0.3
0
-4 -2 0 2 4
w
Experimental Data
Series of 197eV experimental
CBED patterns, showing the (004)
diffracted and (000) transmitted
discs for different silicon crystal
thickness of t=45nm, 95nm,
125nm, 150nm, 280nm from
bottom to the top.
Transmitted(blue)and
diffracted(red)beam intensity
(neglect adsorption)
Thickness variation
1
00 2 4
w6 8 10
Transmitted(diffracted)beam
to form bright(dark)field Dark field image in dual beam
image condition
The coupled oscillation
At s=0, the beam
intensities simplify:
2 πt
2
φg = sin
ξ
g
πt
φ0
2
= sin
2
ξ
Ig=0 at t=0,
g
ξg,2ξg,3ξg,…. (extinction distance)
Considering adsorption effect
In elastic diffractions
1 / ξ g ∝ Fg ∝ Vg
Adsorption effect: V=V+iV’
By experiments: 1 1 i
ξ 'g ' ≈ 0.1ξ g +
ξg ξg ξg '
New solutions:
− πz iω
φ0 = exp cos x − sin x
ξ 0 ' 1+ ω
2
− πz i πz iπz 1
φg = exp sin x x = 1 + ω 2
+
ξ
0
' 1 + ω 2
ξ d ξ d ' 1 + ω 2
Periodic condition: V (r ) = V (r + R n )
Rn=lattice vector
Bloch wave b(r ) = ∑ Cg ei (k + g )⋅r
g
2 2κ 2
If: Vg =
2m
Ug E + V0 =
2m
(κ 2
)
− k + g Cg + U g C0 = 0
2
Bethe theory : Matrix form(2)
Multi-beam:
κ 2 − k 2 U g1 ... U gN C0
U −g1 κ 2 − (k + g1 )2 ... ... Cg1
... =0
... ... ... ...
... κ − (k + g N ) Cg N
2
U −g ... 2
N
κ 2 − k 2 Ug C0
Dual beam:
U κ 2
− ( + )
= 0
2
C
− g k g g
2
Normalization: C0 + Cg = 1
2
Dispersion relationship
(κ 2
)( )
− k 2 κ 2 − (k + g ) = U gU −g
2
Multibeam:
(
Ψ (r ) = ∑ψ j b k , r =∑ψ j e ( j)
) ik ( j ) ⋅r
∑ ge
C ( j ) ig⋅r
j j g
Ψ (r ) = ψ 1C0 e
(1) ik (1 ) ⋅r
+ ψ 2 C0 e (2 ) ik ( 2 ) ⋅r
+ ψ 1Cg e ((1 ) ) + ψ C (2 )ei (k ( ) + g )⋅r
i k (1 ) + g ⋅r 2
2 g
Dual beam solution analysis
By wavelength:(Bloch wave)
Ψ (r ) = ψ 1e ik (1 ) ⋅r
(C (1)
0 + Cg e (1) ig⋅r
)+ψ e2
ik ( 2 ) ⋅r
(C ( ) + C ( )e )
0
2
g
2 ig⋅r
By wave vector:(Incident、diffracted)
(
Ψ (r ) = ψ 1C0 e
(1 ) ik (1 ) ⋅r
+ ψ 2 C0 e (2 ) ik ( 2 ) ⋅r
)+ e (ψ C
ig⋅r
1 g
(1 )
e ik (1 ) ⋅r
+ ψ 2 Cg e (2 ) ik ( 2 ) ⋅r
)
Bloch wave boundary conditions
Dual beam condition, on sample surface
ψ 1C0(1) + ψ 2C0(2 ) = 1
ψ 1Cg(1) + ψ 2Cg(2 ) = 0
Dispersive surface
Iso-energy surface for electron wave
Lattice potential V~0
BZB
kI kG
2θB
g
O G
kI
kG
θB θB
O G
Boundary condition on
entrance surface
HREM simulation
CBED simulations
Multibeam CBED simulations
Space group、point group
determination
GaN Polarity determination
Thickness measurement
Strain measurement (accuracy 10-4)
Incident electron energy
Structure factor determination
Bonding charge density)
CBED
Rocking Curve
2D information
HOLZ lines
Third Dimension
Point group/space group
HOLZ line
Friedel theory
I hk = I h k
GaN Polarity
determination
Strain measurement (accuracy 10-4)
晶格常数的确定
Determination of Bond Charge Density
Extinction thickness
measurement
Structural factor
Charge density
Summary (2)
Dynamical diffraction causes diffraction
beam intensity to oscillate
Kinematical calculation fails
Two ways to account for dynamical
diffraction effects
Plane waves (natural solutions in free space)
Bloch waves (natural solutions in crystals)