GSAS Parameters & Controls What To Refine When? (Refinement Recipes)
GSAS Parameters & Controls What To Refine When? (Refinement Recipes)
GSAS Parameters & Controls What To Refine When? (Refinement Recipes)
Parameters/Controls/Constraints
Parameters:
To model a “crystal structure” with Rietveld, we must fit a large
number of “experimental” parameters in addition to the
“crystallographic” parameters.
Controls:
Controls dictate how the programs operate. Profile parameters
Constraints:
We do not always have enough data to fit all the parameters robustly.
If so, we must approach the minimum with care and sometimes
introduce constraints to reduce degrees of freedom.
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Profile Models Approaches to Profile Models
Rietveld refinement requires that the shape of diffraction peaks (profile) as Three different approaches to reproducing peak shapes have been used:
well as their intensity be reproduced. Empirical functions
Functions are chosen simply because they are computationally simple
Intensities: determined by structural parameters and fit peaks well. The parameters cannot be interpreted because
they have no relationship to the underlying physics of diffraction.
Profile: determined by instrument & by sample Physically-based parameters
– Instrument response function Functions are based on the physical phenomena. Parameters are
– Residual stress usually found empirically, but often have a physical meaning.
– Crystallite (Scherer) broadening “Fundamental Parameters”
Functions and where possible parameter values are determined from
diffraction physics. The only adjustable parameters are those related
to sample properties.
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The physics that determine peak profiles Lorentz (Cauchy) and Gaussian Broadening Functions
Common factors Less common factors Most instrument & sample broadening contributions are Lorentzian or Gaussian
Instrumental Resolution Stacking faults*
Normalized Gaussian
Axial Divergence (Low Angle Modulated Structures*
Asymmetry) Coherence differing by atom type* & ) 4 ln 2((T ) 2 #
4 ln 2
Sample placement/transparency Compositional inhomogeneity! G ((T , 'G ) = 2
exp $ !
Crystallite Broadening* * 'G %$ 'G 2 "!
* Hard to model
Strain Broadening* ! Sometimes impossible to model
* Note that these effects can vary for
Normalized Lorentzian
different classes of reflections
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L( 'T , ( L ) = 2
(anisotropic peak broadening) )( L & 2'T #
1 + $$ !!
% (L "
Gaussian & Lorentzian functions compared. Both
Note that peak widths vary so curves have same FWHM & area, but note the
Results of these factors are convoluted to produce the observed peak shape. ΓG and γL are both functions of Q much longer tails for the Lorentzian.
Lorentzian.
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Voigt vs. Pseudo-Voigt CW: Variation of FWHM with Q
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Microstrain Broadening Microstrain Broadening
!d
= cons tan t GSAS fits strain broadening with two
When a material has residual stresses d
profile terms:
present, some crystallites are "d "d *
compressed. This must be balanced = = "! cot ! • LY -> Lorentzian (most common)
by other crystallites that are stretched d d* • GU -> Gaussian
(because ∑F=ma=0) 2 "d (note that GU also has an instrumental
" 2! = tan !
d contribution)
This leads to a range of lattice b*
constants. See GSAS Manual, pp 158-167.
a*
The spread between diffraction Relation between strain (as percentage) and GSAS terms:
locations for the maximum and
minimum lattice constant increases " "
linearly with Q (∆Q/Q or ∆d/d = S = 100% LY S = 100% GU # GU I
constant) 18000 18000
where GUI accounts for the instrumental contribution
! !
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Anisotropic strain broadening terms
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Work of Finger, Cox & Jephcoat, based on derivations by van Laar & Yelon
FCJ: Convolute
profile with this
Beam curve
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F-C-J: Example
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Least Squares Controls Intensity Extraction Controls
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Damping Controls
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Phase (structural) Parameters
Histogram Parameters
(one set for each histogram)
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Scale Factor
Redundant parameters: Don’t refine scale and all phase fractions together
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CW Profile functions summarized
CW Profile terms
GU, Gaussian widths as polynomial in tan ; referred to as
GV, Cagliotti terms (U,V,W)
#1: Gaussian only (rare except for BT-1 @ NIST) GW
#2: Pseudo-Voigt “standard” GP Gaussian crystallite size (Scherrer) broadening, if GP
is refined, fix GU, GV, GW to instrumental values. I
#3: same as #2, but with Finger-Cox-Jephcoat asymmetry. Much slower recommend leaving GP=0, but refine GU, GV & GW
than #2, but needed with low angle data LX Lorenzian crystallite size (Scherrer) broadening
#4: same as #3, but also has Stephens anisotropic strain broadening LY Lorenzian strain broadening
parameters •Use care when initially refining terms, correlation is usually high
•GSAS constrains GU,GW,GP,LX & LY > 0 & GV < 0; Bad things
happen, if terms will refine out of bounds.
Start with “reasonable” GU,GV,GW, then refine them together. I
then fix them & try LX & LY one at a time & retain if >> 0.
See FitWidths in CMPR for a way to find starting UVW values
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GSAS offers two ways to treat low-angle asymmetry Peak cutoff -- where to stop computing peak tails (smaller ⇒ GENLES
slower)
poor: asym (profile functions #1 & #2)
– set to match experimental signal-to-noise
– works only if small or no low-angle data
excellent: Finger-Cox-Jephcoat (profile #3 & #4)
For use in Flat-plate Bragg-Brentano only:
– two terms: S/L & H/L shft -- sample displacement
• refine with care, if at all (I never do) trns -- sample transparency
• never refine both together – prone to correlation. N.B fix histogram zero=0 if these are used.
– S = sample height
– H = detector height,
– L = diffractometer diameter
(N.B. FCJ use radius & half-heights, equivalent, but messy)
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Other CW Profile terms (cont.) Profile: Asymmetric Broadening
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concept:
– define one (or more) hkl vectors that are over- or under-represented
relative to random distribution
– abundance ratio for that direction
– if 2+ directions, relative amounts for each
Preferred Orientation Corrections – orientation flag (not implemented in EXPGUI)
Note: there is a M-D parameter set for each phase and each histogram
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Preferred Orientation: ODF
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“Soft” Constraints Rigid Body Refinement
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Getting GSAS to give good fits In practice parameters must be relaxed slowly, with the order dictated by
which parameters are farthest from the correct values
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Basic strategy Refinement Recipe (part 1)
Need reasonable values for unit cell, scale factor, background and profile No single strategy works in all cases
before refining structural parameters, locating missing atoms…
– Le Bail fit provides cell, background and profile
Fit unit cell with small # of background terms
Think: Are reflections in ~ the correct places?
Having reasonable profile terms for instrumental resolution can save you
from heartache
Fit 2theta zero (neutron/synchrotron)
– With this, you only need to fit sample broadening
Think: Are all peaks indexed?
– This is a good justification for refining standards
– If not: check cell & rethink space group
– impurity phases?
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Is peak shape in the right ball park? Refine displacement parameters (Uiso)
– If possible, postpone profile refinement to later stages – for complex structures, group Uiso terms
– If profile is way off due to sample broadening, (you do have Think: Is the structure reasonable in terms of distances & angles?
reasonable instrumental terms!) refine only sample terms – missing atoms? Examine Fourier map
– Refine occupancies? (x-rays: beware!)
Fit atom coordinates
– release “big” atoms first When fit is pretty good, refine profile terms (damping is often needed).
• big = high multiplicity*b or *f(Q) – To begin, vary sample-dependent terms like GP, LX and/or LY one at
a time.
– Many terms are “clamped” >0. Turn off terms that try to refine “out of
bounds”
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Refinement Recipe (part 4) Refinement Recipe (part 5): Finish up
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Wrap up
Refinement Recipe (part 6)
Common problem: At high Q, peaks run together so that background cannot be Rietveld fits are almost never perfect since materials and instruments are
determined. not perfect. There is almost always something more to try.
– Choice of Background determines average Uiso. Refining Background and
Uiso together results in good fits but unreasonable average Uiso(<0.001 or Complex problems may stretch the limits of what can be learned from the
>0.025 Å2) values. data. Getting better data is always best, but more frequently one must
reduce the complexity of the model (restraints and constraints)
Solution: Need to fix the average Uiso.
– set all Uiso = to something reasonable (say 0.01 to 0.03) GSAS offers many options to address the above -- the GSAS manual is a
– refine background great place to start learning more about the options.
– fix background, & refine Uiso’s
– Document in your paper that background and displacement parameters
had too much correlation for independent refinement & say what was
done.
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