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Designation: D 3170 – 01

Standard Test Method for

Chipping Resistance of Coatings1
This standard is issued under the fixed designation D 3170; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.

This standard has been approved for use by agencies of the Department of Defense.

1. Scope Test for Chip Resistance of Surface Coatings (J-400)4

1.1 This test method covers the determination of the resis- Chipping Rating Standards4
tance of coatings to chipping damage by stones or other flying
3. Summary of Test Method
objects.
3.1 Standardized road gravel is projected by means of a
NOTE 1—This test method is similar to SAE J-400. controlled air blast at the coated specimens. All testing is
1.2 The values stated in metric units are to be regarded as conducted under controlled temperature conditions, generally
the standard. The English units given in parentheses are for either at ambient (room) temperature or at -29°C 6 3°C (-20°
information only. All dimensions are nominal unless otherwise 6 5°F). After the gravel impact, tape is applied to remove any
specified. loose coating chips and the degree of chipping is determined.
1.3 This standard does not purport to address all of the
safety concerns, if any, associated with its use. It is the 4. Significance and Use
responsibility of the user of this standard to establish appro- 4.1 Owners consider chipping of coatings, particularly on
priate safety and health practices and determine the applica- the leading faces and edges of automobile surfaces, unaccept-
bility of regulatory limitations prior to use. able. In formulating a coating or coating system to meet service
requirements, the resistance to chipping damage by flying
2. Referenced Documents objects such as gravel is one of the properties of importance
2.1 ASTM Standards: since it can vary considerably as other properties are adjusted.
D 609 Practice for Preparation of Cold-Rolled Steel Panels Since resistance to chipping decreases at lower temperatures
for Testing Paint, Varnish, Conversion Coatings, and partly as the result of decreased flexibility, the test may be
Related Coating Products2 more directly related to service conditions by performing it at
D 823 Practices for Producing Films of Uniform Thickness a low temperature. This test method is designed to produce a
of Paint, Varnish, and Related Products on Test Panels2 controlled amount of impact by the media on the coated panel
D 1005 Test Methods for Measurement of Dry-Film Thick- in order to enhance reproducibility.
ness of Organic Coatings Using Micrometers2
D 1186 Test Methods for Nondestructive Measurement of 5. Apparatus
Dry Film Thickness of Nonmagnetic Coatings Applied to 5.1 Gravel-Projecting Machine (Gravelometer), con-
a Ferrous Base2 structed according to the design specifications shown in Fig.
D 1400 Test Method for Nondestructive Measurement of 1.5 There are two types of Gravelometers: the old cabinet style
Dry Film Thickness of Nonconductive Coatings Applied to and the newer, modular style with an electronic feed mecha-
a Nonferrous Metal Base2 nism.
D 1733 Method of Preparation of Aluminum-Alloy Panels NOTE 2—It is recommended that the operation/maintenance checklist
for Testing Paint, Varnish, Lacquer, and Related Products3 shown in Appendix X1 should be completed at least once per month for
D 2201 Practice for Preparation of Zinc-Coated and Zinc- gravelometers that are operated on a weekly basis, and once every 6
Alloy-Coated Steel Panels for Testing Paint and Related months for gravelometers that are operated less frequently. Note that
Products2 values in the checklist are specific to the standard gravel testing protocol.
2.2 Other Documents: Different specifications may be necessary for other media types.

4
Available from the Society of Automotive Engineers, 400 Commonwealth Dr.,
1
This test method is under the jurisdiction of ASTM Committee D01 on Paint Warrendale, PA 15096.
5
and Related Coatings, Materials, and Applications and is the direct responsibility of The sole source of a suitable apparatus meeting these specifications known to
Subcommittee D 01.55 on Factory-Applied Coatings on Preformed Products. the committee at this time is Q-Panel Co., 26200 First St., Westlake, OH 44135. If
Current edition approved May 10, 2001. Published July 2001. Originally you are aware of alternative suppliers, please provide this information to ASTM
published as D 3170 – 73. Last previous edition D 3170 – 74 (1996)e1. Headquarters. Your comments will receive careful consideration at a meeting of the
2
Annual Book of ASTM Standards, Vol 06.01. responsible technical committee,1 which you may attend.
3
Discontinued, see 1980 Annual Book of ASTM Standards, Part 27.

Copyright © ASTM, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, United States.

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 NOTICE: This standard has either been superceded and replaced by a new version or discontinued.
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D 3170

FIG. 1 Gravel Projecting Machine

5.2 Gravel—Water-eroded alluvial road gravel6 passing 5.4 Temperature-Conditioning Equipment (alternatives):
through a 16-mm (5⁄8-in.) space screen but retained on a 5.4.1 A cold room or freezer of sufficient size in which the
9.5-mm (3⁄8-in.) space screen. Note that mesh screen is not a gravel-projecting machine and test specimens can be main-
substitute for a space screen. It is important to remove the tained at the specified temperature of testing.
small pieces of gravel before reusing the gravel. Other media
5.4.2 A freezer or cooler in which the test panels can be
may be used as agreed by contractual parties.
cooled 5°C (10°F) below the specified test temperature.
5.3 Tape, 100 mm (4 in.) wide.7 Other tape may be used as
agreed upon by the contractual parties. 5.4.3 Ambient—Room maintained at a temperature between
20°C (68°F) and 30°C (86°F).
5.5 Transparent Grid—A chip counting aid constructed of
6
The sole source of supply of gravel meeting these specifications known to the transparent plastic approximately 3.176 mm thick by 12.7 cm
committee at this time is Q-Panel Co. If you are aware of alternative suppliers, square (1⁄8 by 5 by 5 in.), on which a 10.16 cm by 10.16 cm (4
please provide this information to ASTM Headquarters. Your comments will receive by 4 in.) grid of 2.54 cm (1 in.) squares has been etched or
careful consideration at a meeting of the responsible technical committee,1 which
you may attend.
scribed.
7
The sole source of supply of No. 898 filament strapping tape known to the 5.6 Chipping Rating Standards—A photographic transpar-
committee at this time is the 3M Co., St. Paul MN 55101. If you are aware of ency4 depicting size and number of chips in each category. See
alternative suppliers, please provide this information to ASTM Headquarters. Your
comments will receive careful consideration at a meeting of the responsible Fig. 2, Fig. 3, Fig. 4, and Fig. 5 for a representation of this
technical committee,1 which you may attend. transparency.

2
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D 3170

NOTE 1—Reprinted with permission from SAE EA-400 (c) 1985, Society of Automotive Engineers, Inc.
FIG. 2 Representation of Chipping Ratings

6. Test Specimens NOTE 3—It is recommended that three replicates of each test specimen
be exposed in the gravelometer. More replicates will improve the
6.1 The composition, surface preparation, and size of speci-
accuracy.
mens shall be agreed upon between the purchaser and the
seller. Test panels of 102 by 305 mm (4 by 12 in.) are 6.2 The number, type, method of application, and aging of
commonly used.

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D 3170

FIG. 3 Representation of Chipping Ratings, Continued

coatings shall be agreed upon between the purchaser and the 7. Procedure
seller.
7.1 Condition the specimens for a minimum of 1 h at the
NOTE 4—Application, metal preparation, and film thickness measure- specified test temperature in the equipment specified in 5.4.
ment methods are given in the following ASTM Practices: D 609, D 823 Make certain the test specimens are separated and have free
and D 2201, and Test Methods D 1005, D 1186, D 1400, and D 1733.

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D 3170

FIG. 4 Representation of Chipping Ratings, Continued

access to the conditioning environment so that optimum heat pressures can be used as agreed upon by the contractual parties.
transfer occurs. 7.3 Cabinet Style Gravelometer:
7.2 Adjust the air pressure on the gravel apparatus to 480 6 7.3.1 After adjusting the air pressure, shut off the air valve,
20 kPa (70 6 3 psi) with the air valve open. open the lid to the gravel chamber and collect 550 mL (1 pt) of
NOTE 5—For cabinet type gravelometers, keep the lid to the gravel graded gravel (approx 250 to 3000 stones) in a suitable
chamber closed during this operation as a safety precaution. Other air container. Collect the gravel by scraping across the screen to

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D 3170

FIG. 5 Representation of Chipping Ratings, Continued

allow fines to fall through. hopper. Do not allow gravel to fall into the nozzle entrance.
7.3.2 Place one test specimen at the desired test temperature 7.3.4 Open the air valve to allow the air to project the gravel
in the panel holder with the coated side facing the front of the at the specimen.
apparatus and close the lid to the panel chamber.
7.3.3 Open the gravel feed door and pour gravel from the NOTE 6—The gravel hopper must empty in 7 to 10 s. If gravel remains
one pint container obtained from 7.3.1 into the top of the gravel in the hopper after 10 s, stop the test and investigate the cause. The

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D 3170
operator should not touch the gravel during the test or otherwise NOTE 11—Other tapes or loose paint removal methods may be used as
physically help the gravel into the funnel. agreed upon by contractual parties.
NOTE 7—It is important to know that the vibrator may become frozen
when the chamber is installed in a cold room or freezer. If the vibrator is 8. Chip Rating Systems
frozen, discontinue the test until the vibrator has thawed and is operating
correctly. 8.1 There are two generally accepted methods for determin-
ing the degree of chipping on the test panel. In the first method,
7.3.5 Shut the air valve, open the lid to the specimen
the exact number of chips in each size range is tabulated for the
chamber and remove the specimen.
test area. The second method utilizes a visual comparison of
7.4 Modular Style Gravelometer:
the test panel to the Chipping Rating Standards represented in
7.4.1 After adjusting the air pressure, shut off the air valve,
Fig. 2, Fig. 3, Fig. 4, and Fig. 5. These standards depict various
open the lid to the gravel hopper and pour 550 ml (1 pt) of
degrees of chipping severity and are arranged sequentially
graded gravel (approx. 250 to 3000 stones) into the top of the
from best to worst according to chipping frequency.
gravel hopper.
7.4.2 Pull back on the specimen mounting clamp to open the NOTE 12—The first method, while the most time consuming, is the
specimen holder on the holder assembly. Place one test most precise and should be used where definitive accuracy is required or
specimen at the desired test temperature in the panel holder as the referee method in case differences arise between laboratories. The
second method, while more of an approximation than the first method, can
with the coated side facing the front of the apparatus. Clamp to
be used for many routine laboratory evaluations where the accuracy of the
close the specimen holder. first method is not required. The second method also lends itself to field
7.4.3 Set the test timer. survey work where the chipped areas can be rated by direct comparison
NOTE 8—There are two ways to operate a test on the Modular style with the Chipping Rating Standards.
gravelometer. A timed test is a test that shuts off the machine after a preset NOTE 13—Other rating methods may be employed as agreed upon by
amount of time has passed. A manual test requires the operator to shut off contractual parties. The evaluation may also be carried out using digital
the machine after the desired amount of time has passed. optical imaging which offers further possibilities of evaluation and
reproducibility. A guide for use of digital optical imaging is being
7.4.3.1 Timed Test: prepared by ASTM Subcommittee D01.25.
7.4.3.1.1 Make sure that the control switch is set to stop.
7.4.3.1.2 Set the test timer to the desired test time. A typical 8.2 The chipped area to be evaluated on the test specimen
test time is 10 s. should be the 10.2 by 10.2 cm (4 by 4 in) square that is the
7.4.3.1.3 Turn the main power switch on. center of the chipped area.
7.4.3.1.4 Turn the control switch to Timed Start. 8.3 The chip rating system consists of one or more number-
7.4.3.2 Manual Test: letter combinations in which the numbers indicate the number
7.4.3.2.1 Make sure that the control switch is set to stop. of chips and the letters designate the size of the corresponding
7.4.3.2.2 Turn the main power switch on. chips. A point of failure notation may also be included in the
7.4.3.2.3 Turn the control switch to Manual. rating if a more descriptive statement is desired.
7.4.3.2.4 After the desired amount of time has passed the 8.3.1 Number of Chips—A number, as shown in Table 1,
control switch to Off. from 10–0 that is used to indicate the number size in the 10.2
by 10.2 cm (4 by 4 in) test area.
NOTE 9—Manual mode requires the operator to manually stop the test.
Once started, the test will not stop by itself. 8.3.2 Size of Chips—A letter, as shown in Table 2, from
A–D that is used to indicate the size of the chip. Due to the
7.4.4 When the test has been completed, remove the test
irregular nature of chipping, the size cannot always be mea-
panel from the specimen holder by pulling back on the
sured exactly so it has to be approximated.
Specimen Mounting Clamp and removing the test specimen.
7.4.5 Remove the gravel from the return receptacle and 8.3.3 Point of Failure Notation—The coating layer, as
screen before reuse. shown in Table 3, at which the most predominate chipping
7.5 Allow the test specimens to return to room temperature failure occurs is designated as the point of failure.
and dry with a soft cloth to remove any condensation. NOTE 14—Cohesional failures are failures within a coating. Adhesional
7.6 Use the tape referenced in 5.3 to remove all loose or failures are failures between coatings.
damaged paint.
7.6.1 Cover the test area of the specimen with a strip(s) of
tape. Apply uniform pressure to ensure that the tape is firmly TABLE 1 Number Categories for Chip Ratings
adhered to the specimen. There should not be any air bubbles Rating Number Number of Chips
trapped beneath the tape. 10 0
9 1
NOTE 10—Uniform pressure can be applied by using a pencil eraser or
8 2–4
tongue depressor. 7 5–9
7.6.2 Remove the tape by pulling straight up. 6 10–24
5 25–49
7.6.3 Apply new strips of tape as specified in 7.6.1. 4 50–74
7.6.4 Remove the tape by pulling straight up in the opposite 3 75–99
direction to 7.6.2. 2 100–149
1 150–250
7.6.5 Continue this procedure using new strips of tape until 0 >250
all loose or damaged paint is removed.

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D 3170
TABLE 2 Size Categories for Chip Ratings shows 75 chips, and so forth.
Rating Letter Size of Chips 10.2 Visually compare the area to be rated with the stan-
A <1 mm (approximately 0.03 in.) dards.
B 1–3 mm (approximately 0.03–0.12 in.) 10.2.1 Since each standard represents only one chip and
C 3–6 mm (approximately 0.12–0.25 in.)
D >6 mm (approximately 0.25 in.)
actual chipping seldom occurs in only one size, one or more
standards should be superimposed until that combination of
standards that most resembles the specimen is obtained.
TABLE 3 Point of Failure Notation 10.2.2 Record the standards that were used to achieve the
Notation Level of Failure Failure Type match with the panel under examination.
(S/P) Substrate to Primer Adhesional
10.3 As with the physical count procedure, the most numer-
(S/T) Substrate to Topcoat Adhesional ous size first, followed by the next most numerous, etc. This
(P) Primer Cohesional may be followed by the point of failure notation.
(P/T) Primer to Topcoat Adhesional
(T) Topcoat Cohesional NOTE 16—An example of how this procedure is used is shown in
Appendix X2.

9. Physical Count Procedure 11. Report

9.1 Place the transparent grid, as described in 5.5, over the 11.1 Report the substrate composition, type and age of
area to be measured. coating, test temperature, and the number-letter rating.
9.2 The operator examines the area within a 2.54 by 2.54 cm
(1 by 1 in.) square and determines the size of each chip as 12. Precision and Bias
encountered and records it. Repeat for all 16 squares and 12.1 Precision—Since the rating scale consists of a combi-
record the results. nation letter and number, no standard deviation number is
9.3 Convert the number of chips encountered for each size obtainable. It is the judgement of those familiar with this test
into the number-letter combinations using Tables 1 and 2. The method that the following precision statements are representa-
number-letter combinations are arranged with the most numer- tive:
ous size first, followed by the next most numerous, and so 12.1.1 Repeatability—Results of tests within a laboratory
forth. This may be followed by the point of failure notation. differing by more than one number or letter unit should be
considered suspect.
NOTE 15—An example of how this procedure is used is shown in
Appendix X2. 12.1.2 Reproducibility—Results of tests between laborato-
ries differing by more than two number or letter units should be
10. Visual Comparison Procedure considered suspect.
10.1 Utilize the Chipping Rating Standards represented in 12.2 Bias—Since there is no acceptable reference procedure
Fig. 2, Fig. 3, Fig. 4, and Fig. 5. The standards have been for determining bias using this test method, no statement is
prepared so that chips of only one size are shown in each being made.
illustration. The number of chips illustrated in each standard is
the fewest number of chips in each rating number category, for 13. Keywords
example, the No. 5 standards show 25 chips, the No. 3 standard 13.1 chipping resistance; gravelometer

APPENDIXES

(Nonmandatory Information)

X1. GRAVELOMETER OPERATION/MAINTENANCE CHECKLIST

X1.1 The operation/maintenance checklist that follows testing protocol. Different specifications may be necessary for other media
should be completed at least once a month for gravelometers types.
that are operated on a weekly basis and once every 6 months
for gravelometers that are operated less frequently. X1.2 If the answer to any of the following questions is NO,
discontinue testing until the problem has been corrected.
NOTE X1.1—The values in the chart are specific to the standard gravel

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D 3170

FIG. X1.1 Gravelometer Operation/Maintenance Checklist

FIG. X1.2 Below Ambient Temperature Testing Information (If Required)

X2. EXAMPLES OF RATINGS

X2.1 Physical Count Procedure: In this example, with a total of 63 chips, the rating would be
X2.1.1 The test panel has 20 chips less than l mm (A size), summarized as 4 BAC (P/T).
40 chips of 1 to 3 mm (B size) and 3 chips 3 to 6 mm (C size)
with primer-topcoat failure. X2.2 Visual Comparison Procedure:
X2.1.2 The rating would be 5B-6A-SC (P/T). X2.2.1 The test panel has 20 chips less than 1 mm (A size),
X2.1.3 The rating can be condensed by converting the total 40 chips of 1 to 3 mm (B size) and 3 chips of 3 to 6 mm (C
number of chips on the test panel to the corresponding number size) with primer-topcoat failure.
category, followed by the size designations in the same order. X2.2.2 The rating would be 5B-6A-SC (P/T).

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D 3170
X2.2.3 The rating can be condensed by converting the total In this example, with a total of 63 chips, the rating would be
number of chips on the test panel to the corresponding number summarized as 4 BAC (P/T).
category, followed by the size designations in the same order.

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if not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standards
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