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LIS3L02AS

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LIS3L02AS

INERTIAL SENSOR:
3Axis - 2g/6g LINEAR ACCELEROMETER
PRODUCT PREVIEW

■ 3V TO 5.25V SINGLE SUPPLY OPERATION


■ THE SENSITIVITY IS ADJUSTED WITH A
TOTAL ACCURACY OF ±10%
■ THE OUTPUT VOLTAGE, OFFSET,
SENSITIVITY AND TEST VOLTAGE ARE
RATIOMETRIC TO THE SUPPLY VOLTAGE SO-24
■ DEVICE SENSITIVITY IS ON-CHIP FACTORY ORDERING NUMBER: LIS3L02AS
TRIMMED
■ EMBEDDED SELF TEST
■ HIGH SHOCK SURVIVABILITY 2g, 6g and it is capable of measuring accelerations
over a maximum bandwidth of 4.0 KHz for the X
and Y axis and 2.5KHz for the Z axis. The device
DESCRIPTION bandwidth may be reduced by using external ca-
The LIS3L02AS is a tri-axis linear accelerometer pacitances. A self-test capability allows the user to
that includes a sensing element and an IC inter- check the functioning of the system.
face able to take the information from the sensing The LIS3L02AS is available in plastic SMD pack-
element and to provide an analog signal to the ex- age and it is specified over a temperature range
ternal world. extending from -40°C to +85°C.
The sensing element, capable to detect the accel- The LIS3L02AS belongs to a family of products
eration, is manufactured using a dedicated pro- suitable for a variety of applications:
cess called THELMA (Thick Epi-Poly Layer for
– Antitheft systems
Microactuators and Accelerometers) developed
by ST to produce inertial sensors and actuators in – Inertial navigation
silicon. – Virtual reality input devices
The IC interface instead is manufactured using a – Vibration Monitoring, recording and compen-
CMOS process that allows high level of integration
sation
to design a dedicated circuit which is trimmed to
better match the sensing element characteristics. – Appliance control
The LIS3L02AS has a user selectable full scale of – Robotics

BLOCK DIAGRAM

S1X Routx Voutx


CHARGE S/H
S1Y
AMPLIFIER
S1Z

rot Routy Vouty


MUX DEMUX
S/H
S2Z
S2Y
S2X Routz Voutz
S/H

TRIMMING CIRCUIT CLOCK


VOLTAGE & CURRENT
& &
REFERENCE
TEST INTERFACE PHASE GENERATOR

February 2003 1/7


This is preliminary information on a new product now in development. Details are subject to change without notice.
LIS3L02AS

PIN DESCRIPTION
N° Pin Function

1 to 6 NC Internally not connected

7 Reserved Leave unconnected or connect to ground

8 Reserved Leave unconnected or connect to Vdd

9 Reserved Connect to Vdd or ground

10-11 Reserved Leave unconnected or connect to Vdd

12 FS Full Scale selection (Logic 0: 2g Full-scale; Logic 1: 6g Full-scale)

13 Voutz Output Voltage

14 PD Power Down (Logic 0: normal mode; Logic 1: Power-Down mode)

15 Voutx Output Voltage

16 ST Self Test (Logic 0: normal mode; Logic 1: Self-test)

17 Vouty Output Voltage

18 Vdd Power supply

19 GND 0V supply

20 to 24 NC Internally not connected

PIN CONNECTION (Top view)

NC NC
X
Z
NC NC
1 Y NC NC
NC NC
NC NC
13 NC GND
Reserved Vdd
DIRECTION OF THE
DETECTABLE Reserved Vouty
ACCELERATIONS
Reserved ST
Reserved Voutx
Reserved PD
FS Voutz

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LIS3L02AS

ELECTRICAL CHARACTERISTCS (Temperature range -40°C to +85°C)


Symbol Parameter Test Condition Min. Typ. Max. Unit

Vdd Supply voltage 3 5.25 V

Idd Supply current 1.0 mA

Voff Zero-g level T = 25°C Vdd/2-10% Vdd/2 Vdd/2+10% V


ratiometric to Vdd

Ar Acceleration range 0V on FS pin ±1.8 ±2.0 ±2.2 g

Vdd on FS pin ±±6.0 g

So Sensitivity ratiometric to Vdd T = 25°C Vdd/5–10% Vdd/5 Vdd/5+10% V/g


Full-scale = 2g

T = 25°C Vdd/15–10% Vdd/15 Vdd/15+10% V/g


Full-scale = 6g

NL Non Linearity Best fit straight line ±0.3 %


X, Y axis
Full-scale = 2g

Best fit straight line ±0.6 %


Z axis
Full-scale = 2g

fuc Sensing Element Resonant X, Y axis 4.0 KHz


Frequency
Z axis 2.5 KHz

an Acceleration noise density Vdd=5V 100 µg/ Hz


Full-scale = 2g

Vt Self test output voltage T = 25°C TBD V


Ratiometric to Vdd @ 5V

Vst Self test input Logic 0 level 0 0.8 V

Logic 1 level 2.8 Vdd V

Rout Output impedance 100 kΩ


Cload Capacitive load drive 320 pF

1 FUNCTIONALITY

1.1 Sensing element


The THELMA process is utilized to create a surface micro-machined accelerometer. The technology al-
lows to carry out suspended silicon structures which are attached to the substrate in a few points called
anchors and free to move on a plane parallel to the substrate itself. To be compatible with the traditional
packaging techniques a cap is placed on top of the sensing element to avoid blocking the moving parts
during the molding phase.
The equivalent circuit for the sensing element is shown in the below figure; when a linear acceleration is
applied, the proof mass displaces from its nominal position, causing an imbalance in the capacitive half-
bridge. This imbalance is measured using charge integration in response to a voltage pulse applied to the
sense capacitor.
The nominal value of the capacitors, at steady state, is few pF and when an acceleration is applied the
maximum variation of the capacitive load is few tenth of pF.

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LIS3L02AS

Figure 1. Equivalent electrical circuit

Cps1 Rs1
S1x

Cs1x
Cpr Rr

Cs2x

S2x

Cps2 Rs2

Cps1 Rs1
S1y

Cs1y
Cpr Rr
rot

Cs2y

S2y

Cps2 Rs2

Cps1 Rs1
S1z

Cs1z
Cpr Rr

Cs2z

S2z

Cps2 Rs2

1.2 IC Interface
The complete signal processing uses a fully differential structure, while the final stage converts the differ-
ential signal into a single-ended one to be compatible with the external world.
The first stage is a low-noise capacitive amplifier that implements a Correlated Double Sampling (CDS) at
its output to cancel the offset and the 1/f noise. The produced signal is then sent to three different S&Hs,
one for each channel, and made available to the outside.
The low noise input amplifier operates at 200 kHz while the three S&Hs operate at a sampling frequency
of 66 kHz. This allows a large oversampling ratio, which leads to in-band noise reduction and to an accu-
rate output waveform.
All the analog parameters (output offset voltage and sensitivity) are ratiometric to the voltage supply. In-

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LIS3L02AS

creasing or decreasing the voltage supply, the sensitivity and the offset will increase or decrease linearly.
The feature provides the cancellation of the error related to the voltage supply along an analog to digital
conversion chain.

1.3 Factory calibration


The IC interface is factory calibrated to provide to the final user a device ready to operate. The parameters
which are trimmed are: gain, offset, common mode and internal clock frequency.
The trimming values are stored inside the device by a poly-fuse structure. Any time the device is turned
on, the memorized bits are downloaded into the registers to be employed during the normal operation. The
poly-fuse approach allows the final user to utilize the device without any need for further calibration

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LIS3L02AS

mm inch
DIM. OUTLINE AND
MIN. TYP. MAX. MIN. TYP. MAX. MECHANICAL DATA

A 2.35 2.65 0.093 0.104

A1 0.10 0.30 0.004 0.012

A2 2.55 0.100

B 0.33 0.51 0.013 0.0200

C 0.23 0.32 0.009 0.013

D 15.20 15.60 0.598 0.614

E 7.40 7.60 0.291 0.299

e 1.27 0,050

H 10.0 10.65 0.394 0.419

h 0.25 0.75 0.010 0.030

k 0˚ (min.), 8˚ (max.)
SO24
L 0.40 1.27 0.016 0.050

h x 45˚
A2

B e A1 K
0.10mm A1 C
L
.004 H
Seating Plane

24 13
E

1 12

SO24

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LIS3L02AS

Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.

The ST logo is a registered trademark of STMicroelectronics


 2003 STMicroelectronics - All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
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