NMTC Brochure

Make: Veeco (now Bruker); Model: Dimension V SPM
Specifications:
Resolution : 2 X 2 X 0.05 nm
Open-Loop Head : X/Y scan range- 100 µm; Z scan range- 5.5 µm
Closed Loop Scanner: X/Y scan range- ~ 90 µm; Z scan range- ~15 µm
Sample Size :150 X 12 mm,150 X 9 mm
Microscope Optics :150 µm to 675 µm viewing area
Applications:
AFM Nanoscale 3D surface topography and texture analysis, Analysis of
micron and nanoscale phase distribution and imaging, Mechanical and
physical property measurements, Defect imaging in MEMS and IC
failure analysis.
Optical Profiler
Make: Veeco (now Bruker); Model: NT9100

Specifications:
Max Sample Size : 150 X 150 X 80 mm
Field of view (X/Y) : 0.3 mm @ 50x & 0.17 mm @ 100x
XY Optical Resolution: 0.55 μm @ 50x 0.36 μm @ 100x
Z Resolution : 0.1 nm, Step Height Accuracy – 1%
Applications:
Topography, Surface Finish, Critical Dimensions, Radius of Curvature,
MEMS, Semiconductors & ICs, Dynamic MEMS Technology.
Raman spectroscopy
Make: SEKI Technotron Corp Model: STR-300

Specifications:
Laser Source : 514 nm (Ar+ laser), 785 nm (Diode laser)
Monochromator : Triple grating with 600, 1200 and 2400 blz
Spectral Resolution : 0.75 cm-1 with 2400 blz
Confocal microscope depth resolution: 2 μm
Applications:
Composition of material, crystal symmetry & orientation, quality of
crystal, stress/ strain, amount of material.
Make: J.A. Woollam; Model: M2000X

Specifications:
Measuring Volume : 150 X 150 X 40 mm
Spectral Range : 250 - 1000 nm
Spectral Resolution : 1.6 nm
Applications:
Layer thickness, Optical constants, Composition/ Crystallinity/ Doping, Surface and Interfacial Roughness,
Grading/ Uniformity Anisotropy, Any physical effect which induces changes in materials optical properties.
Spectroscopic Ellipsometry
Make: KLA Tencor; Model: G200
Specifications:
Load resolution : 1 nN
Displacement Resolution : 0.0002 nm
Maximum Load : 500 mN
Maximum depth : 500 μm
Insitu imaging : 100 x 100 μm
Lateral Force Measurement : > 250 mN
Nanoindenter Applications:
Hardness and Modulus measurement, Fracture Analysis, Paints and
coatings, Metals and Ceramics, Bio-materials, Metal-Matrix
Composites, Polymers, Thin Films.
Make: Microtrac; Model: Blue Wave

Specifications:
Lasers : Blue 405 nm and Red 780 nm
Measuring range : 0.02 to 2800 μm
Data handling : Volume, Number and Area Distributions
Analysis : Dry powder and liquid suspension.
Applications:
Particle size identification and its distribution in Cosmetics,
Pharmaceutical, Food, Metal industry, Paints, Pigments and Dyes,
Cements and Chemical Industry.
Particle size Analyzer
FTIR
Make: Agilent Technologies; Model: Cary 660

Specifications:
Spectral measurement range: 6500-400 cm-1(MIR), 500-20 cm-1 (FIR)
Spectral resolution : <0.06 cm-1
Wavenumber resolution : 0.005 cm-1 @ 2200 cm-1
Signal to noise ratio : 16000:1 peak to peak for 5 sec @ 4cm-1
Measurement mode : Transmission, Absorption and ATR
(Diamond and Ge crystal)
Applications:
Surface Area Analyzer Analyze composition of material, Analyze functional group, Analyze
bonding signature in the material.
Make: Quantachrome; Model: Autosorb-iQ-MP-XR &

ChemBET PULSAR
Specifications:
Surface area range : From 0.01 m2/g
Pore size range : 3.5 to > 4000 Å
BET/Mesopore Capable: (P/Po > 1 x 10-3)
Micropore capable : (P/Po < 10-4)
Features : Built-in Degasser Stations & Degas
Cold Trap
Applications:
Micropore & Mesopore measurements, Specific surface area of
phases, Types of active sites, Reactivity of active sites and Stability of active sites.
sites, Number of active
Make: Carl Ziess; Model:
Neon-40, FESEM and EDS
Specification:
FESEM + EDS Type : Field Emission
Accelerating Voltage: 1-30 kV
Resolution : 1.2 nm @ 30 kV
Magnification : 12 x to 900 kx
Stage : 5 Axes Eucentric
EDS(X) : 126 eV
Applications:
Nano Scale Secondary Electron Imaging, Surface Topography,
Surface Morphology, Backscattered Electron Imaging, EDX
Spectroscopy, Elemental Composition Mapping, Fractography,
Metals, Alloys, Thin Film, Plastics/ Polymers, Composites, Porosity,
inclusions, Particulates, Filters, Papers, Surface Contaminations.
Make: Bruker; Model: D8

Advance
Specifications:
Configuration : Vertical Theta / 2Theta
Max. usable angular range : 110° < 2 Theta ≤ 168°
Smallest addressable increment: 0.0001°
Anodes : Cu, Cr & Co
Detectors : Scintillation & Lynxeye
Application Softwares : EVA, LEPTOS & TOPAS
Applications:
Identification of crystalline materials, Sample purity measurement,
XRD Determination of Unit cell dimensions, Residual stress measurement
and Determination of Degree of Crystallinity.
Other Facilities:
Confocal Microscope (Olympus, LEXT 4000) Light Microscope (Carl Zeiss, Axio Imager M2m)
Stereo Microscope (Carl Zeiss Discovery V20) Rheometer (TA Instruments, Discovery HR-2)
Micro hardness Tester (CLEMEX, Dual MMT-X7B) Electron Microscopy Sample Preparation Laboratory
Electron Microscopy Sample Preparation Lab

Contact:
Mr. Prakash Vinod Advanced Material Characterization Lab
Centre Head – SMPM Centre for Smart Manufacturing Precision Machine
+91-80-22188243 Tools & Aggregates (SMPM)
+91-9449842680 CMTI, Tumkur Road
nmcs@cmti.res.in Bangalore-560022
www.cmti.res.in

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Make: Veeco (now Bruker); Model: Dimension V SPM

Make: Veeco (now Bruker); Model: NT9100

Make: SEKI Technotron Corp Model: STR-300

Make: J.A. Woollam; Model: M2000X

Make: Microtrac; Model: Blue Wave

Make: Agilent Technologies; Model: Cary 660

Make: Quantachrome; Model: Autosorb-iQ-MP-XR &

Make: Bruker; Model: D8

Electron Microscopy Sample Preparation Lab

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