Electronic MFG Overall - Shrunk
Electronic MFG Overall - Shrunk
Electronic MFG Overall - Shrunk
Manufacturing Processes
•fullnet.com/u/tomg/gooteepc.htm
•ee.washington.edu/circuit_archive/text/design.html
•precisioncircuits.com.au/cid/hm_cid.html
•amscourseware.com/guidelines.htm
•filtranmicro.com/design.html
•goldengategraphics.com/pcgloss.htm
•elchempub.com/files/electroc2.htm
•pcbprotech.com/Dh3/DH3right.htm
•pcbprototyping.com/html/html_edu.htm
Design for Mass Production
Plated VIAs
Design for Mass Production
Basic Photo-Etch
PCB Mfg Process
• Bromide: Brominated compounds are added to laminates as a flame retardant. Some laminates are employing alternate,
non-bromine, flame retardants. These are usually called specified as containing non-halogen flame retardants. The surface
bromide concentration is a function of the laminate heat history. Bromide has also been identified as a component in some
marking ink formulations and some solder masks.
• Chloride - Chloride ions are the single most damaging material that can be on the board. High levels are usually due
to insufficient washing prior to applying the solder mask. Chloride can also be transferred to the board by handling.
• Nitrate and Ammonium - Both of these can be introduced in various plating processes.
• Sulfate - Sulfate is rarely a problem. High levels are usually caused by poor housekeeping: dirty equipment, unpainted
walls or unsealed floors.
• Sodium & Potassium - Sodium can be induced by handling but is also a component of tap water and may be indicative of
poor water treatment. In this case, chloride, calcium and magnesium should also be present.
• Calcium and Magnesium - Calcium and magnesium come from rinse water and are indicative of poor water quality.
• Citrate - Citrate salts and acids are components of some gold plating solutions. They also are in many environmentally
friendly cleaners.
IPC-6012 mandates the total ionic cleanliness prior to solder mask be <10ug/in2 in NaCl equivelants (IPC-TM-650)
Most Low Signal Or High Bias, High Reliability Designs Require Much Lower Levels on Individual Ions
Design for Mass Production
DIP
Small Outline Package
Shrink SO Package
Thin Shrink SOP
3 mm
Fab, Comp
Prep
Bake, Clean
Simplified Comparison
of Thru Hole and SMT
Thru Hole Mechanical
Hand
SMT PCB Assembly Process
Operations
Auto Screen
Component Solder Paste
Insertion
Vision
System
Inspection
Wave Solder Auto
Component
Placement
Vision
System
Inspection
Lead Reflow
Trim Solder
(Oven)
Quality!
Design for Mass Production
IPC Electronic Assembly Classifications
3. High Reliability Electronic Products: Aerospace, Military
• Continued performance, performance on demand, and extended life is 10 Yr Stresses
critical and equipment downtime cannot be tolerated. Equipment must
PROCESS CONTROL – PROCESS QUALITY
100 % 100 %
75 % 75 %
50 % 50 % IPC-7095 Class 1 Class 2 Class 3
BGA Std
25 % 25 %
Max Void Size 60% Dia 45% Dia 30% Dia
0% 0%
36% Area 20.3% Area 9% Area
Min PTH Vertical Fill: Class 2 = 75% Class 3 = 100%
Ref: IPC-A-610, IPC-JSTD-001 Max Void 50% Dia 35% Dia 20% Dia
Size at 25% Area 12.3% Area 4% Area
Interfaces
Design for Mass Production
BGA Void Size and Locations, Uniform Void Position Distributions
Sampling_Grid
Position
Model
Solder_Joint_Radius
Void_Distance
Void_Radius S
Void_Solder
Interface Distance
S = Shell
CLASS 2
Solder Joint_Radius: 0.225 mm
Void_Radius: 0.1013 mm P(D<10) = 52.21 %
Void_Area: 20% of Joint Area
Failure criteria: D/10
CLASS 3
Solder Joint_Radius: 0.225 mm
Void_Radius: 0.0675 mm
Void_Area: 9% of Joint Area P(D<10) = 27.00 %
Failure criteria: D/10
Design for Mass Production
Class vs Shell Size Relative Probabilities
~ 2x more likely to exceed D/10 threshold with Class 2 vs Class 3
S = Shell
Depth
Design for Mass Production
Physics of Failure: Accumulated Fatigue Damage (AFD) is related to the number of stress
cycles N, and mechanical stress, S, using Miner’s rule
Exponent B comes from the S-N diagram. It is typically ~3 for 63/37 SnPb Solders
Example: Solder Joint
Shear voids Effective cross-sectional
Force Effective cross-
sectional Area: D/2
Area: D
F
Applied stress: Applied stress:
Let = 10, then
• Solder Joints: A solder joint is formed when two metal surfaces are soldered together.
The solder fills the void between the surfaces and is the area most important. It provides
the majority of “strength of attachment.” A solder fillet is formed after the solder joint is
filled, and, is the visible solder verifying the presence of the solder joint.
– Blow Hole Defects: Blowholes are solder voids visible from the surface going into the solder joint
alongside a through-hole lead. A blowhole is a nonconforming process indicator provided the
solder connection meets the minimum circumference and depth requirements.
– Dewetting Defects: Solder joints are visually inspected for wetting characteristics. Dewetting
occurs because the flux has been burned off and moisture attacks the surfaces. A good indicator of
dewetting is solder pooling and pulling back off leads or lands.
– Oxidation Defects: When moisture in the air attacks a solder joint, it forms a protective rust-like
layer. This is referred to as oxidation, which attacks metal surfaces. Oxidation dramatically reduces
the transfer efficiency of thermal energy.
– Dimensional Defects: For any of the above in addition to poor placement, screening, reflow and
other processes, solder joint geometric defect limits are clearly specified in these Stds (see above)
Design for Mass Production
Discrete Component Geometries
NOTES
1. The maximum fillet may overhang the land or extend onto the top of the chip cap metallization; however the
solder shall not extend further onto the component body.
2. Properly wetted fillet evident.
Design for Mass Production
J-Lead Component Geometries
NOTES
1. The maximum solder fillet shall not touch package body. 2. Properly wetted fillet evident.
Design for Mass Production
Gull Wing Component Geometries
NOTES
1. Solder fillet may extend through the top bend. Solder must not touch the package body or end seal, except for low profile
SMD devices, e.g., SOICs, SOTs. Solder should not extend under the body of low profile surface mount components whose
leads are made of Alloy 42 or similar metals.
2. Must not violate minimum design conductor spacing.
3. Properly wetted fillet evident.
Design for Mass Production
Thru-Hole Component Geometries
NOTES
1. Wetted solder refers to solder applied by the solder process.
2. The 25% unfilled volume includes both source and destination side depressions.
Design for Mass Production
Advanced Packaging
Design for Mass Production
Through Hole Surface Mount CSP / WLP
(CSP = Chip Scale Package,
WLP = Wafer Level Package)
TSOP CSP/WLP
25 mil pitch Area array 0.8 mm to 0.5 mm
Limited by perimeter leads Limited by substrate wiring
IC Packaging Progression:
Design for Mass Production
Fujitsu SuperCSP
Redistribution
Trace (Cu) SiN Al Pad
Polyimide Layer
Die
Encapsulant
Barrier Metal
Solder Ball Metal Post (Cu)
VOLUME
µProcessor
1000
ASICs
Passives
10 Analog ICs
Power ICs
Discretes
1
1 10 100 1000
Die Area (mm2)
Design for Mass Production
Process Flow:
* From Motorola