Lecture1 Intro
Lecture1 Intro
Lecture1 Intro
VLSI Testing
Testing
Lecture
Lecture 1:
1: Introduction
Introduction
Determine requirements
Write specifications
Test development
Fabrication
Manufacturing test
Chips to customer
Copyright 2001, Agrawal & Bushnell Lecture 1 Introduction 6
Definitions
Definitions
Design synthesis: Given an I/O function, develop a
procedure to manufacture a device using known
materials and processes.
Verification: Predictive analysis to ensure that the
synthesized design, when manufactured, will perform
the given I/O function.
Test: A manufacturing step that ensures that the
physical device, manufactured from the synthesized
design, has no manufacturing defect.
RF testing
1. J. Kelly and M. Engelhardt, Advanced Production Testing of RF, SoC, and SiP Devices,
Boston: Artech House, 2007.
2. B. Razavi, RF Microelectronics, Upper Saddle River, New Jersey: Prentice Hall PTR, 1998.
3. K. B. Schaub and J. Kelly, Production Testing of RF and System-on-a-chip Devices for
Wireless Communications, Boston: Artech House, 2004.
The testing cost for a 500 MHz, 1,024 pin tester was obtained as 4.56 cents in
Slide 15. Thus,
Cost of testing a chip = 6.5 × 4.56 = 29.64 cents
The cost of testing bad chips should also be recovered from the price of good
chips. Since the yield of good chips is 70%, we obtain
Test cost per each good chip = 29.64/0.7 ≈ 42 cents
42 cents should be included as the cost of testing while figuring out the
price of chips.