Min Huang
- 1.M. A. Styblinski, "Formulation of drift reliability optimization problem," Microelectronics and Reliability, vol. 31, no. I, pp. 159-171, Jan. 1991.Google Scholar
Cross Ref
- 2.M. A. Styblinski and M. Huang, "Drift reliability optimization in VLSI circuit design: A generalized formulation and practical examples.," to appear in IEEE Trans. on Computer-Aided Design (accepted), 1992.Google Scholar
- 3.M. Huang and M. A. Styblinski, "An approach to VLSI circuit reliability optimization considering the hot electron effects," Proc. 1992 IEEE Int 'l Syrup. on Circuits and Syslems, pp. 11101-1104, May 1992.Google Scholar
- 4.M. Huang and M. A. Styblinski, "An efficient cubic spline approximation approach to lifetime estimation," Proc. 1992 IEEE Int'l Syrup. on Circuits and Systems, pp. 2989-2992, May 1992.Google Scholar
- 5.Y. Leblebici and S. M. Kang, "An integrated hotcarrier degradation simulator for VLSI reliability analysis," Proc. IEEE Int'l Conf. on Computer- Aided Design, pp. 400-403, Nov. 1990.Google Scholar
- 6.Y. Leblebici and S. M. Kang, "Simulation of MOS circuit performance degradation with emphasis in VLSI Design-for-Reliability," Proc. IEEE Int'l Conf. on Computer-Aided Design, pp. 492-495, Oct. 1989.Google Scholar
- 7.L. j. Opalski and M. A. Styblinski, "60SSIP- user's guide," Technical Report 30-91, Laboratory for Intelligent Design Systems, Dept. of Electr. Eng., Texas A&M Univ., College Station, Texas, Sept. 1991.Google Scholar
- 8.M. Huang, "Drift reliability package- user's guide," Technical Report 32-91, Laboratory for Intelligent Design Systems, Dept. of Electr. Eng., Texas A&M Univ., College Station, Texas, Sept. 1991.Google Scholar
Index Terms
- A generic software system for drift reliability optimization of VLSI circuits
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