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Run-time probabilistic detection of miscalibrated thermal sensors in many-core systems

Published: 18 March 2013 Publication History

Abstract

Many-core architectures use large numbers of small temperature sensors to detect thermal gradients and guide thermal management schemes. In this paper a technique to identify thermal sensors which are operating outside a required accuracy is described. Unlike previous on-chip temperature estimation approaches, our algorithms are optimized to run on-line while thermal management decisions are being made. The accuracy of a sensor is determined by comparing its readings to expected values from a probability distribution function determined from surrounding sensors. Experiments show that a sensor operating outside a desired accuracy can be identified with a detection rate of over 90% and an average false alarm rate of < 6%, with a confidence level of 90%. The run time of our method is shown to be around 3x lower than a recently-published temperature estimation method, enhancing its suitability for run-time implementation.

References

[1]
S. Sharifi and T. S. Rosing, "Accurate Direct and Indirect On-Chip Temperature Sensing for Efficient Dynamic Thermal Management," IEEE Trans. on CAD, vol. 29, no. 10, pp. 1586--1599, Oct. 2010.
[2]
W. Edwards, R. F. Miles, and D. von Winerfeldt, Eds., Advances in Decision Analysis: From Foundations to Application. Cambridge University Press, 2007.
[3]
F. Liu, "A General Framework for Spatial Correlation Modeling in VLSI Design," in Proc. Design Automation Conf., Jun. 2007, pp. 817--822.
[4]
R. Cochran and S. Reda, "Spectral Techniques for High-resolution Thermal Characterization with Limited Sensor Data," in Proc. Design Automation Conf., Jul. 2009, pp. 478--483.
[5]
Y. Zhang and A. Srivastava, "Accurate Temperature Estimation Using Noisy Thermal Sensors for Gaussian and Non-Gaussian Cases," IEEE Trans. on VLSI Systems, vol. 19, no. 9, pp. 1617--1626, Sep. 2011.
[6]
K.-J. Lee, K. Skadron, and W. Huang, "Analytical Model for Sensor Placement on Microprocessors," in Proc. IEEE Int'l Conf. on Computer Design, Oct. 2005, pp. 24--30.
[7]
A. Coskun, J. Ayala, D. Atienza, T. Rosing, and Y. Leblebici, "Dynamic thermal management in 3d multicore architectures," in Proc. IEEE/ACM Design, Automation and Test in Europe, Apr. 2009, pp. 1410--1415.

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  1. Run-time probabilistic detection of miscalibrated thermal sensors in many-core systems

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        cover image ACM Conferences
        DATE '13: Proceedings of the Conference on Design, Automation and Test in Europe
        March 2013
        1944 pages
        ISBN:9781450321532

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        EDA Consortium

        San Jose, CA, United States

        Publication History

        Published: 18 March 2013

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        DATE 13
        Sponsor:
        • EDAA
        • EDAC
        • SIGDA
        • The Russian Academy of Sciences
        DATE 13: Design, Automation and Test in Europe
        March 18 - 22, 2013
        Grenoble, France

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        Overall Acceptance Rate 518 of 1,794 submissions, 29%

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