research-article

Error patterns in MLC NAND flash memory: measurement, characterization, and analysis

Authors:

Erich F. Haratsch,

Ken MaiAuthors Info & Claims

DATE '12: Proceedings of the Conference on Design, Automation and Test in Europe

Pages 521 - 526

Published: 12 March 2012 Publication History

Abstract

As NAND flash memory manufacturers scale down to smaller process technology nodes and store more bits per cell, reliability and endurance of flash memory reduce. Wear-leveling and error correction coding can improve both reliability and endurance, but finding effective algorithms requires a strong understanding of flash memory error patterns. To enable such understanding, we have designed and implemented a framework for fast and accurate characterization of flash memory throughout its lifetime. This paper examines the complex flash errors that occur at 30-40nm flash technologies. We demonstrate distinct error patterns, such as cycle-dependency, location-dependency and value-dependency, for various types of flash operations. We analyze the discovered error patterns and explain why they exist from a circuit and device standpoint. Our hope is that the understanding developed from this characterization serves as a building block for new error tolerance algorithms for flash memory.

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Cited By

Chen JLi PXie P(2023)Flash-Based Solid-State Storage Reduces LDPC Read Retry SchemeProceedings of the 7th International Conference on Computer Science and Application Engineering10.1145/3627915.3628024(1-6)Online publication date: 17-Oct-2023
https://dl.acm.org/doi/10.1145/3627915.3628024
Chen JHuang QZhai JShen ZHong JLanperne MPark JCerny TShahriar H(2023)CCFlash: A Correlation-Aware Compression Approach in Flash MemoryProceedings of the 38th ACM/SIGAPP Symposium on Applied Computing10.1145/3555776.3577673(80-87)Online publication date: 27-Mar-2023
https://dl.acm.org/doi/10.1145/3555776.3577673
Hong DHa KKo MChun MKim YLee SKim J(2021)Reparo: A Fast RAID Recovery Scheme for Ultra-large SSDsACM Transactions on Storage10.1145/345097717:3(1-24)Online publication date: 16-Aug-2021
https://dl.acm.org/doi/10.1145/3450977
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Index Terms

Error patterns in MLC NAND flash memory: measurement, characterization, and analysis
1. Hardware

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Information

Published In

cover image ACM Conferences

DATE '12: Proceedings of the Conference on Design, Automation and Test in Europe

March 2012

1690 pages

ISBN:9783981080186

General Chairs:
Wolfgang Rosenstiel
University of Tuebingen and edacentrum, DE
,
Enrico Macii
Politecnico di Torino, IT

Sponsors

EDAA: European Design Automation Association
ECSI
EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE CEDA
The Russian Academy of Sciences: The Russian Academy of Sciences

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EDA Consortium

San Jose, CA, United States

Publication History

Published: 12 March 2012

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DATE '12

Sponsor:

EDAA
EDAC
SIGDA
The Russian Academy of Sciences

DATE '12: Design, Automation and Test in Europe

March 12 - 16, 2012

Dresden, Germany

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

Chen JLi PXie P(2023)Flash-Based Solid-State Storage Reduces LDPC Read Retry SchemeProceedings of the 7th International Conference on Computer Science and Application Engineering10.1145/3627915.3628024(1-6)Online publication date: 17-Oct-2023
https://dl.acm.org/doi/10.1145/3627915.3628024
Chen JHuang QZhai JShen ZHong JLanperne MPark JCerny TShahriar H(2023)CCFlash: A Correlation-Aware Compression Approach in Flash MemoryProceedings of the 38th ACM/SIGAPP Symposium on Applied Computing10.1145/3555776.3577673(80-87)Online publication date: 27-Mar-2023
https://dl.acm.org/doi/10.1145/3555776.3577673
Hong DHa KKo MChun MKim YLee SKim J(2021)Reparo: A Fast RAID Recovery Scheme for Ultra-large SSDsACM Transactions on Storage10.1145/345097717:3(1-24)Online publication date: 16-Aug-2021
https://dl.acm.org/doi/10.1145/3450977
Lu SLuo BPatel TYao YTiwari DShi WNoh SWelch B(2020)Making disk failure predictions SMARTer!Proceedings of the 18th USENIX Conference on File and Storage Technologies10.5555/3386691.3386706(151-168)Online publication date: 24-Feb-2020
https://dl.acm.org/doi/10.5555/3386691.3386706
Maneas SMahdaviani KEmami TSchroeder BNoh SWelch B(2020)A study of SSD reliability in large scale enterprise storage deploymentsProceedings of the 18th USENIX Conference on File and Storage Technologies10.5555/3386691.3386705(137-150)Online publication date: 24-Feb-2020
https://dl.acm.org/doi/10.5555/3386691.3386705
Jaffer SManeas SHwang ASchroeder B(2020)The Reliability of Modern File Systems in the face of SSD ErrorsACM Transactions on Storage10.1145/337555316:1(1-28)Online publication date: 15-Mar-2020
https://dl.acm.org/doi/10.1145/3375553
Tai AKryczka AKanaujia SJamieson KFreedman MCidon ADan TDahlia M(2019)Who's afraid of uncorrectable bit errors? online recovery of flash errors with distributed redundancyProceedings of the 2019 USENIX Conference on Usenix Annual Technical Conference10.5555/3358807.3358891(977-991)Online publication date: 10-Jul-2019
https://dl.acm.org/doi/10.5555/3358807.3358891
Xu EZheng MQin FXu YWu JDan TDahlia M(2019)Lessons and actionsProceedings of the 2019 USENIX Conference on Usenix Annual Technical Conference10.5555/3358807.3358890(961-975)Online publication date: 10-Jul-2019
https://dl.acm.org/doi/10.5555/3358807.3358890
Jaffer SManeas SHwang ASchroeder BDan TDahlia M(2019)Evaluating file system reliability on solid state drivesProceedings of the 2019 USENIX Conference on Usenix Annual Technical Conference10.5555/3358807.3358874(783-797)Online publication date: 10-Jul-2019
https://dl.acm.org/doi/10.5555/3358807.3358874
Kim BChoi JMin SMerchant AWeatherspoon H(2019)Design tradeoffs for SSD reliabilityProceedings of the 17th USENIX Conference on File and Storage Technologies10.5555/3323298.3323325(281-294)Online publication date: 25-Feb-2019
https://dl.acm.org/doi/10.5555/3323298.3323325
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