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Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors

Authors:

Antonis Paschalis,

Dimitris GizopoulosAuthors Info & Claims

DATE '04: Proceedings of the conference on Design, automation and test in Europe - Volume 1

Page 10578

Published: 16 February 2004 Publication History

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Abstract

Software-based self-test (SBST) strategies are particularly useful for periodic testing of deeply embedded processors in low-cost embedded systems that do not require immediate detection of errors and cannot afford the well-known hardware, software, or time redundancy mechanisms.In this paper, first, we identify the stringent characteristics of an SBST test program to be suitable for on-line periodic testing. Then, we introduce a new SBST methodology with a newclassification scheme for processor components. After that, we analyze the self-test routine code styles for the three more effective test pattern generation (TPG) strategies in order to select the most effective self-test routine for on-line periodic testing of a component under test. Finally, we demonstrate the effectiveness of the proposed SBST methodology for on-line periodic testing by presenting experimental results for a RISC pipeline processor.

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Cited By

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Perez Acle JCantoro RSanchez ESonza Reorda MSquillero G(2016)Observability solutions for in-field functional test of processor-based systemsMicroprocessors & Microsystems10.1016/j.micpro.2016.09.00247:PB(392-403)Online publication date: 1-Nov-2016
https://dl.acm.org/doi/10.1016/j.micpro.2016.09.002
Eberl MGlaß MTeich JAbelein UGroeneveld PSciuto DHassoun S(2012)Considering diagnosis functionality during automatic system-level design of automotive networksProceedings of the 49th Annual Design Automation Conference10.1145/2228360.2228400(205-213)Online publication date: 3-Jun-2012
https://dl.acm.org/doi/10.1145/2228360.2228400
Singh VInoue MSaluja KFujiwara H(2006)Instruction-based self-testing of delay faults in pipelined processorsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2006.88641214:11(1203-1215)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/TVLSI.2006.886412

Index Terms

Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors
1. Computer systems organization
  1. Architectures
    1. Parallel architectures
      1. Very long instruction word
    2. Serial architectures
      1. Complex instruction set computing
      2. Reduced instruction set computing
2. Hardware
  1. Hardware test
  2. Robustness

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DATE '04: Proceedings of the conference on Design, automation and test in Europe - Volume 1

February 2004

688 pages

ISBN:0769520855

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IEEE Computer Society

United States

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Published: 16 February 2004

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DATE04: Design, Automation and Test in Europe 2004

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Perez Acle JCantoro RSanchez ESonza Reorda MSquillero G(2016)Observability solutions for in-field functional test of processor-based systemsMicroprocessors & Microsystems10.1016/j.micpro.2016.09.00247:PB(392-403)Online publication date: 1-Nov-2016
https://dl.acm.org/doi/10.1016/j.micpro.2016.09.002
Eberl MGlaß MTeich JAbelein UGroeneveld PSciuto DHassoun S(2012)Considering diagnosis functionality during automatic system-level design of automotive networksProceedings of the 49th Annual Design Automation Conference10.1145/2228360.2228400(205-213)Online publication date: 3-Jun-2012
https://dl.acm.org/doi/10.1145/2228360.2228400
Singh VInoue MSaluja KFujiwara H(2006)Instruction-based self-testing of delay faults in pipelined processorsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2006.88641214:11(1203-1215)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/TVLSI.2006.886412

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