Cited By
View all- Pomeranz I(2018)Autonomous Multicycle Tests With Low Storage and Test Application Time OverheadsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2017.277426937:9(1881-1892)Online publication date: 1-Sep-2018
- Perez Acle JCantoro RSanchez ESonza Reorda MSquillero G(2016)Observability solutions for in-field functional test of processor-based systemsMicroprocessors & Microsystems10.1016/j.micpro.2016.09.00247:PB(392-403)Online publication date: 1-Nov-2016
- Riefert ACantoro RSauer MReorda MBecker BNebel WAtienza D(2015)On the automatic generation of SBST test programs for in-field testProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757086(1186-1191)Online publication date: 9-Mar-2015
- Show More Cited By