Cited By
View all- Kleeberger VMaier PSchlichtmann U(2014)Workload- and Instruction-Aware Timing AnalysisProceedings of the 51st Annual Design Automation Conference10.1145/2593069.2596694(1-6)Online publication date: 1-Jun-2014
Connecting different worlds: technology abstraction for reliability-aware design and test
Authors: 
Ulf Schlichtmann, 
Veit B. Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, 
Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert WehnAuthors Info & Claims
Ulf Schlichtmann, Veit B. Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert WehnAuthors Info & ClaimsArticle No.: 252, Pages 1 - 8
Abstract
The rapid shrinking of device geometries in the nanometer regime requires new technology-aware design methodologies. These must be able to evaluate the resilience of the circuit throughout all System on Chip (SoC) abstraction levels. To successfully guide design decisions at the system level, reliability models, which abstract technology information, are required to identify those parts of the system where additional protection in the form of hardware or software countermeasures is most effective. Interfaces such as the presented Resilience Articulation Point (RAP) or the Reliability Interchange Information Format (RIIF) are required to enable EDA-assisted analysis and propagation of reliability information. The models are discussed from different perspectives, such as design and test.
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Index Terms
- Connecting different worlds: technology abstraction for reliability-aware design and test
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- IEEE Council on Electronic Design Automation (CEDA)
- The Russian Academy of Sciences: The Russian Academy of Sciences
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European Design and Automation Association
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Published: 24 March 2014
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View all- Kleeberger VMaier PSchlichtmann U(2014)Workload- and Instruction-Aware Timing AnalysisProceedings of the 51st Annual Design Automation Conference10.1145/2593069.2596694(1-6)Online publication date: 1-Jun-2014
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