research-article

Cross-layer resilience challenges: metrics and optimization

Authors:

Subhasish Mitra,

Kevin Brelsford,

Pia N. SandaAuthors Info & Claims

DATE '10: Proceedings of the Conference on Design, Automation and Test in Europe

Pages 1029 - 1034

Published: 08 March 2010 Publication History

Abstract

With increasing sources of disturbances in the underlying hardware, a key challenge in design of robust systems is to meet user expectations at required cost. Cross-layer resilience techniques, implemented across multiple layers of the system stack and designed to work together, can help system designers build effective robust systems at the desired cost point. This paper brings to the forefront two major cross-layer resilience challenges:

1. Quantification and validation of the effectiveness of a cross-layer resilience approach to robust system design in overcoming hardware reliability challenges.

2. Global optimization of a robust system design using cross-layer resilience techniques.

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Cited By

Guo XStan M(2017)Implications of accelerated self-healing as a key design knob for cross-layer resilienceIntegration, the VLSI Journal10.1016/j.vlsi.2016.10.00856:C(167-180)Online publication date: 1-Jan-2017
https://dl.acm.org/doi/10.1016/j.vlsi.2016.10.008
Dutt NJantsch ASarma S(2016)Toward Smart Embedded SystemsACM Transactions on Embedded Computing Systems10.1145/287293615:2(1-27)Online publication date: 17-Feb-2016
https://dl.acm.org/doi/10.1145/2872936
Cho HCher CShepherd TMitra S(2015)Understanding soft errors in uncore componentsProceedings of the 52nd Annual Design Automation Conference10.1145/2744769.2744923(1-6)Online publication date: 7-Jun-2015
https://dl.acm.org/doi/10.1145/2744769.2744923
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Information

Published In

cover image ACM Conferences

DATE '10: Proceedings of the Conference on Design, Automation and Test in Europe

March 2010

1868 pages

ISBN:9783981080162

General Chairs:
Giovanni De Micheli
EPF Lausanne, CH
,
Bashir Al-Hashimi
University of Southampton, UK
,
Program Chairs:
Wolfgang Mueller
University of Paderborn, SE
,
Enrico Macii
Politecnico di Torino, IT

Sponsors

EDAA: European Design Automation Association
ECSI
EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
The IEEE Computer Society TTTC
The IEEE Computer Society DATC
The Russian Academy of Sciences: The Russian Academy of Sciences

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European Design and Automation Association

Leuven, Belgium

Publication History

Published: 08 March 2010

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DATE '10

Sponsor:

EDAA
EDAC
SIGDA
The Russian Academy of Sciences

DATE '10: Design, Automation and Test in Europe

March 8 - 12, 2010

Germany, Dresden

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

Guo XStan M(2017)Implications of accelerated self-healing as a key design knob for cross-layer resilienceIntegration, the VLSI Journal10.1016/j.vlsi.2016.10.00856:C(167-180)Online publication date: 1-Jan-2017
https://dl.acm.org/doi/10.1016/j.vlsi.2016.10.008
Dutt NJantsch ASarma S(2016)Toward Smart Embedded SystemsACM Transactions on Embedded Computing Systems10.1145/287293615:2(1-27)Online publication date: 17-Feb-2016
https://dl.acm.org/doi/10.1145/2872936
Cho HCher CShepherd TMitra S(2015)Understanding soft errors in uncore componentsProceedings of the 52nd Annual Design Automation Conference10.1145/2744769.2744923(1-6)Online publication date: 7-Jun-2015
https://dl.acm.org/doi/10.1145/2744769.2744923
Schlichtmann UKleeberger VAbraham JEvans AGimmler-Dumont CGlaß MHerkersdorf ANassif SWehn NFettweis GNebel W(2014)Connecting different worldsProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616982(1-8)Online publication date: 24-Mar-2014
https://dl.acm.org/doi/10.5555/2616606.2616982
Schmoll FHeinig AMarwedel PEngel M(2013)Improving the fault resilience of an H.264 decoder using static analysis methodsACM Transactions on Embedded Computing Systems10.1145/2536747.253675313:1s(1-27)Online publication date: 6-Dec-2013
https://dl.acm.org/doi/10.1145/2536747.2536753
Cho HMirkhani SCher CAbraham JMitra S(2013)Quantitative evaluation of soft error injection techniques for robust system designProceedings of the 50th Annual Design Automation Conference10.1145/2463209.2488859(1-10)Online publication date: 29-May-2013
https://dl.acm.org/doi/10.1145/2463209.2488859
Henkel JBauer LBecker JBringmann OBrinkschulte UChakraborty SEngel MErnst RHärtig HHedrich LHerkersdorf AKapitza RLohmann DMarwedel PPlatzner MRosenstiel WSchlichtmann USpinczyk OTahoori MTeich JWehn NWunderlich HDick RMadsen J(2011)Design and architectures for dependable embedded systemsProceedings of the seventh IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis10.1145/2039370.2039384(69-78)Online publication date: 9-Oct-2011
https://dl.acm.org/doi/10.1145/2039370.2039384
Leem LCho HLee HKim YLi YMitra SScheffer LPhillips JHu A(2010)Cross-layer error resilience for robust systemsProceedings of the International Conference on Computer-Aided Design10.5555/2133429.2133465(177-180)Online publication date: 7-Nov-2010
https://dl.acm.org/doi/10.5555/2133429.2133465

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